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Class Information
Number: 324/719
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With semiconductor or ic materials quality determination using conductivity effects
Description: Subject matter including means to evaluate the properties of semiconductor or integrated circuit material.

Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
8691600 Method for testing through-silicon-via (TSV) structures Apr. 8, 2014
8664963 Test device for measuring permeability of a barrier material Mar. 4, 2014
8571812 Method for mapping oxygen concentration Oct. 29, 2013
8547121 Quality control process for UMG-SI feedstock Oct. 1, 2013
8479070 Integrated circuit arrangement for test inputs Jul. 2, 2013
8285524 Simulation method for transistor unsuitable for existing model Oct. 9, 2012
8228081 Testing apparatus Jul. 24, 2012
8193491 Structure and method for determining a defect in integrated circuit manufacturing process Jun. 5, 2012
8183879 Measuring arrangement, semiconductor arrangement and method for operating a semiconductor component as a reference source May. 22, 2012
8180466 Process device with supervisory overlayer May. 15, 2012
8115503 Device for measuring metal/semiconductor contact resistivity Feb. 14, 2012
8111081 Method for evaluating silicon wafer Feb. 7, 2012
8102174 Techniques for electrically characterizing tunnel junction film stacks with little or no processing Jan. 24, 2012
8093916 Method of characterizing a semiconductor device and semiconductor device Jan. 10, 2012
8027185 Techniques for electrically characterizing tunnel junction film stacks with little or no processing Sep. 27, 2011
8000935 Diagnostic method for root-cause analysis of FET performance variation Aug. 16, 2011
7986146 Method and system for detecting existence of an undesirable particle during semiconductor fabrication Jul. 26, 2011
7948249 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same May. 24, 2011
7924022 Evaluation board and failure location detection method Apr. 12, 2011
7835890 Hot carrier circuit reliability simulation Nov. 16, 2010
7772590 Metal comb structures, methods for their fabrication and failure analysis Aug. 10, 2010
7749778 Addressable hierarchical metal wire test methodology Jul. 6, 2010
7737703 System and apparatus for electrically testing lead-to-lead shorting during magnetoresistive sensor fabrication Jun. 15, 2010
7724003 Substrate conditioning for corona charge control May. 25, 2010
7710130 Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus May. 4, 2010
7705617 Bridge-enhanced nanoscale impedance microscopy Apr. 27, 2010
7705603 Sensor device for conductivity measurement and method for its operation Apr. 27, 2010
7683627 Semiconductor device having a function of detection breakages on a periphery thereof Mar. 23, 2010
7683644 Extrusion failure monitor structures Mar. 23, 2010
7663383 Method for detection and analysis of impurity content in refined metallurgical silicon Feb. 16, 2010
7659733 Electrical open/short contact alignment structure for active region vs. gate region Feb. 9, 2010
7659734 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination Feb. 9, 2010
7646207 Method for measuring a property of interconnections and structure for the same Jan. 12, 2010
7635602 Simulator of ion implantation and method for manufacturing semiconductor device Dec. 22, 2009
7626402 Semiconductor device and method of measuring sheet resistance of lower layer conductive pattern thereof Dec. 1, 2009
7619409 Methods and apparatus for electrically characterizing magnetic tunnel junctions having three metal layers separated by two dielectric layers Nov. 17, 2009
7606958 Interrupt control method, interrupt control apparatus and interrupt control medium Oct. 20, 2009
7595649 Method to accurately estimate the source and drain resistance of a MOSFET Sep. 29, 2009
7587298 Diagnostic method for root-cause analysis of FET performance variation Sep. 8, 2009
7538559 System and method for reducing current in a device during testing May. 26, 2009
7525323 Method for measuring permeability of a ferromagnetic material in an integrated circuit Apr. 28, 2009
7514940 System and method for determining effective channel dimensions of metal oxide semiconductor devices Apr. 7, 2009
7514941 Method and apparatus for predicting the reliability of electronic systems Apr. 7, 2009
7511507 Integrated circuit and circuit board Mar. 31, 2009
7512506 IC chip stress testing Mar. 31, 2009
7508216 Method for measuring work function Mar. 24, 2009
7480598 Characteristic evaluation apparatus for insulated gate type transistors Jan. 20, 2009
7479237 Method of fabricating vertical probe head Jan. 20, 2009
7459913 Methods for the determination of film continuity and growth modes in thin dielectric films Dec. 2, 2008
7453272 Electrical open/short contact alignment structure for active region vs. gate region Nov. 18, 2008

1 2 3 4 5 6 7

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