 |
|
 |
| |
 |
|
Class Information
Number: 324/719
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With semiconductor or ic materials quality determination using conductivity effects
Description: Subject matter including means to evaluate the properties of semiconductor or integrated circuit material.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619409 |
Methods and apparatus for electrically characterizing magnetic tunnel junctions having three metal layers separated by two dielectric layers |
Nov. 17, 2009 |
| 7606958 |
Interrupt control method, interrupt control apparatus and interrupt control medium |
Oct. 20, 2009 |
| 7595649 |
Method to accurately estimate the source and drain resistance of a MOSFET |
Sep. 29, 2009 |
| 7587298 |
Diagnostic method for root-cause analysis of FET performance variation |
Sep. 8, 2009 |
| 7538559 |
System and method for reducing current in a device during testing |
May. 26, 2009 |
| 7525323 |
Method for measuring permeability of a ferromagnetic material in an integrated circuit |
Apr. 28, 2009 |
| 7514940 |
System and method for determining effective channel dimensions of metal oxide semiconductor devices |
Apr. 7, 2009 |
| 7514941 |
Method and apparatus for predicting the reliability of electronic systems |
Apr. 7, 2009 |
| 7512506 |
IC chip stress testing |
Mar. 31, 2009 |
| 7511507 |
Integrated circuit and circuit board |
Mar. 31, 2009 |
| 7508216 |
Method for measuring work function |
Mar. 24, 2009 |
| 7480598 |
Characteristic evaluation apparatus for insulated gate type transistors |
Jan. 20, 2009 |
| 7479237 |
Method of fabricating vertical probe head |
Jan. 20, 2009 |
| 7459913 |
Methods for the determination of film continuity and growth modes in thin dielectric films |
Dec. 2, 2008 |
| 7453272 |
Electrical open/short contact alignment structure for active region vs. gate region |
Nov. 18, 2008 |
| 7429867 |
Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit |
Sep. 30, 2008 |
| 7424393 |
Wafer inspection device |
Sep. 9, 2008 |
| 7417442 |
Method and apparatus for testing tunnel magnetoresistive effect element, manufacturing method of tunnel magnetoresistive effect element and tunnel magnetoresistive effect element |
Aug. 26, 2008 |
| 7408367 |
Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures |
Aug. 5, 2008 |
| 7397255 |
Micro Kelvin probes and micro Kelvin probe methodology |
Jul. 8, 2008 |
| 7394280 |
Method of electro migration testing |
Jul. 1, 2008 |
| 7391226 |
Contact resistance test structure and methods of using same |
Jun. 24, 2008 |
| 7372282 |
Method and apparatus for testing tunnel magnetoresistive effect element, manufacturing method of tunnel magnetoresistive effect element and tunnel magnetoresistive effect element |
May. 13, 2008 |
| 7336086 |
Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure |
Feb. 26, 2008 |
| 7332917 |
Method for calculating frequency-dependent impedance in an integrated circuit |
Feb. 19, 2008 |
| 7304485 |
Analysis of the quality of contacts and vias in multi-metal fabrication processes of semiconductor devices, method and test chip architecture |
Dec. 4, 2007 |
| 7292043 |
Electronically resettable current protection for die testing |
Nov. 6, 2007 |
| 7262608 |
Via etch monitoring |
Aug. 28, 2007 |
| 7253901 |
Laser-based cleaning device for film analysis tool |
Aug. 7, 2007 |
| 7217579 |
Voltage contrast test structure |
May. 15, 2007 |
| 7218119 |
System and method for reducing current in a device during testing |
May. 15, 2007 |
| 7218125 |
Apparatus and method for performing a four-point voltage measurement for an integrated circuit |
May. 15, 2007 |
| 7219022 |
Methods and apparatus for detecting failure of an isolation device |
May. 15, 2007 |
| 7212016 |
Apparatus and methods for measuring resistance of conductive layers |
May. 1, 2007 |
| 7202951 |
Laser-based cleaning device for film analysis tool |
Apr. 10, 2007 |
| 7186576 |
Stacked die module and techniques for forming a stacked die module |
Mar. 6, 2007 |
| 7183780 |
Electrical open/short contact alignment structure for active region vs. gate region |
Feb. 27, 2007 |
| 7173882 |
Methods and systems for performing horological functions using time cells |
Feb. 6, 2007 |
| 7161243 |
System and apparatus for socket and package power/ground bar to increase current carrying capacity for higher IC power delivery |
Jan. 9, 2007 |
| 7155360 |
Process variation detector and process variation detecting method |
Dec. 26, 2006 |
| 7138653 |
Structures for stabilizing semiconductor devices relative to test substrates and methods for fabricating the stabilizers |
Nov. 21, 2006 |
| 7095239 |
Method for detecting defects that exhibit repetitive patterns |
Aug. 22, 2006 |
| 7088121 |
Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits |
Aug. 8, 2006 |
| 7078920 |
Semiconductor substrate and test pattern for the same |
Jul. 18, 2006 |
| 7078919 |
In situ determination of resistivity, mobility and dopant concentration profiles |
Jul. 18, 2006 |
| 7078896 |
Spatially resolved electromagnetic property measurement |
Jul. 18, 2006 |
| 7061256 |
Method and apparatus for contact resistance measurement |
Jun. 13, 2006 |
| 7053647 |
Method of detecting potential bridging effects between conducting lines in an integrated circuit |
May. 30, 2006 |
| 7053634 |
Test pattern for testing contact resistance of a subject via hole |
May. 30, 2006 |
| 6967499 |
Dual ramp rate dielectric breakdown testing methodology |
Nov. 22, 2005 |
|
|
|
 |
|
 |
|
| |
Randomly Featured Patents |
|
