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Class Information
Number: 324/716
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With voltage or current signal evaluation > Including a particular probing technique (e.g., four point probe) > To determine dimension (e.g., distance or thickness)
Description: Subject matter including means to evaluate alterations in the physical shape of an object.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7605595 |
System for clearance measurement and method of operating the same |
Oct. 20, 2009 |
| 7557591 |
System and method for determining the state of a film in a plasma reactor using an electrical property |
Jul. 7, 2009 |
| 7525063 |
Method for the optical marking of a touch contact switch and touch contact switch |
Apr. 28, 2009 |
| 7514940 |
System and method for determining effective channel dimensions of metal oxide semiconductor devices |
Apr. 7, 2009 |
| 7511514 |
Passenger screening system and method |
Mar. 31, 2009 |
| 7487064 |
Method for detecting and monitoring defects |
Feb. 3, 2009 |
| 7420163 |
Determining layer thickness using photoelectron spectroscopy |
Sep. 2, 2008 |
| 7394280 |
Method of electro migration testing |
Jul. 1, 2008 |
| 7358748 |
Methods and systems for determining a property of an insulating film |
Apr. 15, 2008 |
| 7352194 |
Method for determining the thickness of a coating on a composite material |
Apr. 1, 2008 |
| 7285965 |
Paper-width detecting device |
Oct. 23, 2007 |
| 7242206 |
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
Jul. 10, 2007 |
| 7185545 |
Instrumentation and method for monitoring change in electric potential to detect crack growth |
Mar. 6, 2007 |
| 7180310 |
Amplitude varying driver circuit and test apparatus |
Feb. 20, 2007 |
| 7104147 |
System and method for measuring electric current in a pipeline |
Sep. 12, 2006 |
| 7098676 |
Multi-functional structure for enhanced chip manufacturibility and reliability for low k dielectrics semiconductors and a crackstop integrity screen and monitor |
Aug. 29, 2006 |
| 7038472 |
Methods and systems for measuring internal dimensions of microscale structures |
May. 2, 2006 |
| 7038473 |
Method and apparatus for measuring a fluid level and a motor vehicle provided with such apparatus |
May. 2, 2006 |
| 7012438 |
Methods and systems for determining a property of an insulating film |
Mar. 14, 2006 |
| 7005851 |
Methods and apparatus for inspection utilizing pulsed eddy current |
Feb. 28, 2006 |
| 7002361 |
Film thickness measuring apparatus and a method for measuring a thickness of a film |
Feb. 21, 2006 |
| 6987388 |
Digital measuring head |
Jan. 17, 2006 |
| 6972576 |
Electrical critical dimension measurement and defect detection for reticle fabrication |
Dec. 6, 2005 |
| 6933735 |
Ramp arrangement and method for measuring the position of an actuator in a rotating media data storage device |
Aug. 23, 2005 |
| 6919731 |
Method for measuring a position of a conductive target material |
Jul. 19, 2005 |
| 6903560 |
Orientation sensor especially suitable for use in an underground boring device |
Jun. 7, 2005 |
| 6850079 |
Film thickness measuring apparatus and a method for measuring a thickness of a film |
Feb. 1, 2005 |
| 6847217 |
Method for measuring a gap between a proximity probe and a conductive target material |
Jan. 25, 2005 |
| 6819122 |
Method for measuring a gap between a proximity probe and a conductive target material |
Nov. 16, 2004 |
| 6794886 |
Tank probe for measuring surface conductance |
Sep. 21, 2004 |
| 6765395 |
Method for measuring a gap between a proximity probe and a conductive target material |
Jul. 20, 2004 |
| 6761352 |
Method and system for double feed detection |
Jul. 13, 2004 |
| 6731130 |
Method of determining gate oxide thickness of an operational MOSFET |
May. 4, 2004 |
| 6724201 |
Resistance type liquid level measuring apparatus |
Apr. 20, 2004 |
| 6707308 |
Measurements using tunnelling current between elongate conductors |
Mar. 16, 2004 |
| 6677767 |
Displacement sensor |
Jan. 13, 2004 |
| 6677768 |
Orientation sensor especially suitable for use in an underground boring device |
Jan. 13, 2004 |
| 6624642 |
Metal bridging monitor for etch and CMP endpoint detection |
Sep. 23, 2003 |
| 6590403 |
Material regression sensor |
Jul. 8, 2003 |
| 6586951 |
Displacement detecting device |
Jul. 1, 2003 |
| 6577144 |
Electrical voltages and resistances measured to inspect metallic cased wells and pipelines |
Jun. 10, 2003 |
| 6559475 |
Test pattern for evaluating a process of silicide film formation |
May. 6, 2003 |
| 6537708 |
Electrical critical dimension measurements on photomasks |
Mar. 25, 2003 |
| 6515493 |
Method and apparatus for in-situ endpoint detection using electrical sensors |
Feb. 4, 2003 |
| 6476623 |
Percent backsputtering as a control parameter for metallization |
Nov. 5, 2002 |
| 6476624 |
Crack monitoring method and apparatus |
Nov. 5, 2002 |
| 6462565 |
Measuring pattern for measuring width of wire in semiconductor device |
Oct. 8, 2002 |
| 6429668 |
Switching element produced in the form of a film |
Aug. 6, 2002 |
| 6429667 |
Electrically testable process window monitor for lithographic processing |
Aug. 6, 2002 |
| 6407546 |
Non-contact technique for using an eddy current probe for measuring the thickness of metal layers disposed on semi-conductor wafer products |
Jun. 18, 2002 |
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