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Class Information
Number: 324/715
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With voltage or current signal evaluation > Including a particular probing technique (e.g., four point probe)
Description: Subject matter wherein electrical contact is made at a specified point, in particular fashion in order to effect a measurement or test.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7564252 |
Semiconductor inspection apparatus |
Jul. 21, 2009 |
| 7521952 |
Test structure for electromigration analysis and related method |
Apr. 21, 2009 |
| 7519487 |
System and method for depth determination of cracks in conducting structures |
Apr. 14, 2009 |
| 7511510 |
Nanoscale fault isolation and measurement system |
Mar. 31, 2009 |
| 7498824 |
Method and apparatus for making a determination relating to resistance of probes |
Mar. 3, 2009 |
| 7459920 |
Method of and apparatus for non-destructively measuring moisture content of dried objects |
Dec. 2, 2008 |
| 7444856 |
Sensors for electrochemical, electrical or topographical analysis |
Nov. 4, 2008 |
| 7443177 |
Characterization of conductor by alternating current potential-drop method with a four-point probe |
Oct. 28, 2008 |
| 7423438 |
Method and apparatus for measuring body fat by using bioelectrical impedance |
Sep. 9, 2008 |
| 7385382 |
Quick reference test light probe with digital voltage meter |
Jun. 10, 2008 |
| 7317320 |
Method and apparatus for measuring body fat by using bioelectrical impedance |
Jan. 8, 2008 |
| 7309991 |
Scanning probe inspection apparatus |
Dec. 18, 2007 |
| 7271574 |
Evanescent microwave probe with enhanced resolution and sensitivity |
Sep. 18, 2007 |
| 7271606 |
Spring-based probe pin that allows kelvin testing |
Sep. 18, 2007 |
| 7235978 |
Device for measuring impedance of electronic component |
Jun. 26, 2007 |
| 7218125 |
Apparatus and method for performing a four-point voltage measurement for an integrated circuit |
May. 15, 2007 |
| 7215130 |
Testing and display of electrical system impedance |
May. 8, 2007 |
| 7205773 |
Method for calibrating a pulsed measurement system |
Apr. 17, 2007 |
| 7154276 |
Method and apparatus for measuring a parameter of a vehicle electrical system |
Dec. 26, 2006 |
| 7106077 |
Device and method for testing a membrane electrode assembly |
Sep. 12, 2006 |
| 7106076 |
Device for the simultaneous application of electrical signals and measurement of the electrical potential in a sample |
Sep. 12, 2006 |
| 7088120 |
Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure |
Aug. 8, 2006 |
| 7063991 |
Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same |
Jun. 20, 2006 |
| 7064564 |
Bundled probe apparatus for multiple terminal contacting |
Jun. 20, 2006 |
| 7057402 |
Carbon nanotube sensor |
Jun. 6, 2006 |
| 7019544 |
Transmission line input structure test probe |
Mar. 28, 2006 |
| 7010849 |
Methods for manufacturing a resistor-pin assembly of a voltage probe |
Mar. 14, 2006 |
| 7005842 |
Probe cartridge assembly and multi-probe assembly |
Feb. 28, 2006 |
| 6944552 |
System and method for detecting power deficiencies in a computer component |
Sep. 13, 2005 |
| 6943571 |
Reduction of positional errors in a four point probe resistance measurement |
Sep. 13, 2005 |
| 6919730 |
Carbon nanotube sensor |
Jul. 19, 2005 |
| 6917208 |
Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit |
Jul. 12, 2005 |
| 6894513 |
Multipoint plane measurement probe and methods of characterization and manufacturing using same |
May. 17, 2005 |
| 6856126 |
Differential voltage probe |
Feb. 15, 2005 |
| 6822463 |
Active differential test probe with a transmission line input structure |
Nov. 23, 2004 |
| 6815229 |
In situ monitoring of sheet resistivity of silicides during rapid thermal annealing using electrical methods |
Nov. 9, 2004 |
| 6798222 |
Migration measuring method and measuring apparatus |
Sep. 28, 2004 |
| 6763263 |
Method and apparatus for producing an electrical property image using a charge correlation matrix |
Jul. 13, 2004 |
| 6747205 |
Device for assisting in the measurement of the earth resistance |
Jun. 8, 2004 |
| 6737875 |
Method and apparatus for in-circuit impedance measurement |
May. 18, 2004 |
| 6724200 |
Apparatus for measuring the bioelectrical impedance of a living body |
Apr. 20, 2004 |
| 6677767 |
Displacement sensor |
Jan. 13, 2004 |
| 6671631 |
Systems and methods for analyzing viscoelastic properties of combinatorial libraries of materials |
Dec. 30, 2003 |
| 6651014 |
Apparatus for automatically measuring the resistivity of semiconductor boules by using the method of four probes |
Nov. 18, 2003 |
| 6650128 |
Method and apparatus for circuit fault detection with boiler water level detection system |
Nov. 18, 2003 |
| 6636054 |
Low capacitance probe contact |
Oct. 21, 2003 |
| 6636050 |
Four-terminal measuring device that uses nanotube terminals |
Oct. 21, 2003 |
| 6578264 |
Method for constructing a membrane probe using a depression |
Jun. 17, 2003 |
| 6552553 |
Bioelectrical impedance measuring apparatus |
Apr. 22, 2003 |
| 6552529 |
Method and apparatus for interim assembly electrical testing of circuit boards |
Apr. 22, 2003 |
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