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Class Information
Number: 324/715
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With voltage or current signal evaluation > Including a particular probing technique (e.g., four point probe)
Description: Subject matter wherein electrical contact is made at a specified point, in particular fashion in order to effect a measurement or test.










Sub-classes under this class:

Class Number Class Name Patents
324/718 To detect a flaw or defect 178
324/716 To determine dimension (e.g., distance or thickness) 150
324/717 To determine material composition 101


Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8664963 Test device for measuring permeability of a barrier material Mar. 4, 2014
8633720 Method and apparatus for measuring magnetic parameters of magnetic thin film structures Jan. 21, 2014
8564308 Signal acquisition system having reduced probe loading of a device under test Oct. 22, 2013
8548429 Cellular device security apparatus and method Oct. 1, 2013
8446145 Method for measuring I-V characteristics of solar cell, and solar cell May. 21, 2013
8436624 Signal acquisition system having reduced probe loading of a device under test May. 7, 2013
8305096 Apparatus and method for measuring and monitoring layer properties in web-based processes Nov. 6, 2012
8305094 Resistance measuring device, display panel, and measuring method of bonding resistance Nov. 6, 2012
8237459 Method of testing ground resistance by making use of existing telephone lines Aug. 7, 2012
8232814 Four-wire ohmmeter connector and ohmmeter using same Jul. 31, 2012
8174276 Coaxial four-point probe for low resistance measurements May. 8, 2012
8111079 Conductivity measuring apparatus and conductivity measuring method Feb. 7, 2012
7973541 Method and apparatus for estimating resistance and capacitance of metal interconnects Jul. 5, 2011
7948250 Probe with a changing device May. 24, 2011
7944222 Eliminating inline positional errors for four-point resistance measurement May. 17, 2011
7940038 Grid sensor for the two-dimensional measurement of different components in the cross section of a multiphase flow May. 10, 2011
7863911 Test device and method for measurement of tunneling magnetoresistance properties of a manufacturable wafer by the current-in-plane-tunneling technique Jan. 4, 2011
7852093 Eliminating inline positional errors for four-point resistance measurement Dec. 14, 2010
7786739 Identification of board connections for differential receivers Aug. 31, 2010
7764071 Testing and display of electrical system impedance Jul. 27, 2010
7746061 Method of performing signal-measured calibration Jun. 29, 2010
7714596 System and methods of measuring semiconductor sheet resistivity and junction leakage current May. 11, 2010
7710130 Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus May. 4, 2010
7683651 Test structure for electromigration analysis and related method Mar. 23, 2010
7675299 Method and apparatus for making a determination relating to resistance of probes Mar. 9, 2010
7671604 Nanoscale fault isolation and measurement system Mar. 2, 2010
7659732 Four-wire ohmmeter connector and ohmmeter using same Feb. 9, 2010
7564252 Semiconductor inspection apparatus Jul. 21, 2009
7521952 Test structure for electromigration analysis and related method Apr. 21, 2009
7519487 System and method for depth determination of cracks in conducting structures Apr. 14, 2009
7511510 Nanoscale fault isolation and measurement system Mar. 31, 2009
7498824 Method and apparatus for making a determination relating to resistance of probes Mar. 3, 2009
7459920 Method of and apparatus for non-destructively measuring moisture content of dried objects Dec. 2, 2008
7444856 Sensors for electrochemical, electrical or topographical analysis Nov. 4, 2008
7443177 Characterization of conductor by alternating current potential-drop method with a four-point probe Oct. 28, 2008
7423438 Method and apparatus for measuring body fat by using bioelectrical impedance Sep. 9, 2008
7385382 Quick reference test light probe with digital voltage meter Jun. 10, 2008
7317320 Method and apparatus for measuring body fat by using bioelectrical impedance Jan. 8, 2008
7309991 Scanning probe inspection apparatus Dec. 18, 2007
7271574 Evanescent microwave probe with enhanced resolution and sensitivity Sep. 18, 2007
7271606 Spring-based probe pin that allows kelvin testing Sep. 18, 2007
7235978 Device for measuring impedance of electronic component Jun. 26, 2007
7218125 Apparatus and method for performing a four-point voltage measurement for an integrated circuit May. 15, 2007
7215130 Testing and display of electrical system impedance May. 8, 2007
7205773 Method for calibrating a pulsed measurement system Apr. 17, 2007
7154276 Method and apparatus for measuring a parameter of a vehicle electrical system Dec. 26, 2006
7106076 Device for the simultaneous application of electrical signals and measurement of the electrical potential in a sample Sep. 12, 2006
7106077 Device and method for testing a membrane electrode assembly Sep. 12, 2006
7088120 Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure Aug. 8, 2006
7064564 Bundled probe apparatus for multiple terminal contacting Jun. 20, 2006

1 2 3 4 5










 
 
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