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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/71.5
Name: Electricity: measuring and testing > Determining nonelectric properties by measuring electric properties > Semiconductors for nonelectrical property
Description: Subject matter including semiconductive means for sensing variations in the nonelectrical property being measured.










Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8691608 Semiconductor devices having nanochannels confined by nanometer-spaced electrodes Apr. 8, 2014
8618827 Measurement of electrical and mechanical characteristics of low-K dielectric in a semiconductor device Dec. 31, 2013
8558326 Semiconductor devices having nanochannels confined by nanometer-spaced electrodes Oct. 15, 2013
8558288 Methods and apparatus for measuring analytes using large scale FET arrays Oct. 15, 2013
8479558 Method and apparatus for determining a vapor signature based upon frequency Jul. 9, 2013
8438902 Method and apparatus for determining a vapor signature based upon frequency May. 14, 2013
8436622 Method for measurement of content of water or organic acid in polar organic solvent, and apparatus for the method May. 7, 2013
8432149 Array column integrator Apr. 30, 2013
8432150 Methods for operating an array column integrator Apr. 30, 2013
8421487 Method for extending the diagnostic capability of current regulators Apr. 16, 2013
8421437 Array column integrator Apr. 16, 2013
8405406 Detecting apparatus and imaging apparatus Mar. 26, 2013
8354671 Integrated circuit with adaptive VGG setting Jan. 15, 2013
8299775 Current-aligned auto-generated non-equiaxial hole shape for wiring Oct. 30, 2012
8294476 Method of sensor cell timing Oct. 23, 2012
8129978 Material detector Mar. 6, 2012
7901553 Method and system for sensing gas incorporating an integrated reference element Mar. 8, 2011
7852466 Apparatus and method for obtaining information related to terahertz waves Dec. 14, 2010
7838912 Semiconductor sensing field effect transistor, semiconductor sensing device, semiconductor sensor chip and semiconductor sensing device Nov. 23, 2010
7816152 In situ, ex situ and inline process monitoring, optimization and fabrication Oct. 19, 2010
7795593 Surface contamination analyzer for semiconductor wafers Sep. 14, 2010
7646190 Stress measurement device and stress measurement method Jan. 12, 2010
7635602 Simulator of ion implantation and method for manufacturing semiconductor device Dec. 22, 2009
7598722 Method and apparatus for sensing temperature Oct. 6, 2009
7551269 Apparatus and method for obtaining information related to terahertz waves Jun. 23, 2009
7538538 Method of using a four terminal hybrid silicon/organic field effect sensor device May. 26, 2009
7468549 Method for producing a package for an electronic circuit and a substrate for a package Dec. 23, 2008
7208759 Semiconductor integrated circuit device and method of testing the same Apr. 24, 2007
7200498 System for remediating cross contamination in semiconductor manufacturing processes Apr. 3, 2007
7186576 Stacked die module and techniques for forming a stacked die module Mar. 6, 2007
7170275 Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor Jan. 30, 2007
7139671 Semiconductor device fabrication method Nov. 21, 2006
7084641 Measuring cell and measuring field comprising measuring cells of this type, use of a measuring and use of a measuring field Aug. 1, 2006
7078919 In situ determination of resistivity, mobility and dopant concentration profiles Jul. 18, 2006
6963193 a-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof Nov. 8, 2005
6948388 Wireless remote sensor Sep. 27, 2005
6902942 Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices Jun. 7, 2005
6890772 Method and apparatus for determining two dimensional doping profiles with SIMS May. 10, 2005
6870357 Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor Mar. 22, 2005
6867059 A-C:H ISFET device manufacturing method, and testing methods and apparatus thereof Mar. 15, 2005
6864107 Determination of nonphotolithographic wafer process-splits in integrated circuit technology development Mar. 8, 2005
6847067 A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof Jan. 25, 2005
6838866 Process for measuring depth of source and drain Jan. 4, 2005
6831451 Method for adjusting a Weibull slope for variations in temperature and bias voltage Dec. 14, 2004
6822430 Method of assessing lateral dopant and/or charge carrier profiles Nov. 23, 2004
6808590 Method and apparatus of arrayed sensors for metrological control Oct. 26, 2004
6806696 Method for determining a Weibull slope having a bias voltage variation adjustment Oct. 19, 2004
6798184 Integrated sensor device and measuring system using the same Sep. 28, 2004
6797927 Optical parameter measuring with temperature assignment Sep. 28, 2004
6788050 System, method and apparatus for thin-film substrate signal separation using eddy current Sep. 7, 2004

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