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Class Information
Number: 324/71.5
Name: Electricity: measuring and testing > Determining nonelectric properties by measuring electric properties > Semiconductors for nonelectrical property
Description: Subject matter including semiconductive means for sensing variations in the nonelectrical property being measured.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7208759 |
Semiconductor integrated circuit device and method of testing the same |
Apr. 24, 2007 |
| 7200498 |
System for remediating cross contamination in semiconductor manufacturing processes |
Apr. 3, 2007 |
| 7186576 |
Stacked die module and techniques for forming a stacked die module |
Mar. 6, 2007 |
| 7170275 |
Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor |
Jan. 30, 2007 |
| 7139671 |
Semiconductor device fabrication method |
Nov. 21, 2006 |
| 7084641 |
Measuring cell and measuring field comprising measuring cells of this type, use of a measuring and use of a measuring field |
Aug. 1, 2006 |
| 7078919 |
In situ determination of resistivity, mobility and dopant concentration profiles |
Jul. 18, 2006 |
| 6963193 |
a-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
Nov. 8, 2005 |
| 6948388 |
Wireless remote sensor |
Sep. 27, 2005 |
| 6902942 |
Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices |
Jun. 7, 2005 |
| 6890772 |
Method and apparatus for determining two dimensional doping profiles with SIMS |
May. 10, 2005 |
| 6870357 |
Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor |
Mar. 22, 2005 |
| 6867059 |
A-C:H ISFET device manufacturing method, and testing methods and apparatus thereof |
Mar. 15, 2005 |
| 6864107 |
Determination of nonphotolithographic wafer process-splits in integrated circuit technology development |
Mar. 8, 2005 |
| 6847067 |
A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
Jan. 25, 2005 |
| 6838866 |
Process for measuring depth of source and drain |
Jan. 4, 2005 |
| 6831451 |
Method for adjusting a Weibull slope for variations in temperature and bias voltage |
Dec. 14, 2004 |
| 6822430 |
Method of assessing lateral dopant and/or charge carrier profiles |
Nov. 23, 2004 |
| 6808590 |
Method and apparatus of arrayed sensors for metrological control |
Oct. 26, 2004 |
| 6806696 |
Method for determining a Weibull slope having a bias voltage variation adjustment |
Oct. 19, 2004 |
| 6797927 |
Optical parameter measuring with temperature assignment |
Sep. 28, 2004 |
| 6798184 |
Integrated sensor device and measuring system using the same |
Sep. 28, 2004 |
| 6788050 |
System, method and apparatus for thin-film substrate signal separation using eddy current |
Sep. 7, 2004 |
| 6774613 |
Semiconductor gas sensor, gas sensor system and method of gas analysis |
Aug. 10, 2004 |
| 6731130 |
Method of determining gate oxide thickness of an operational MOSFET |
May. 4, 2004 |
| 6677766 |
Shallow trench isolation step height detection method |
Jan. 13, 2004 |
| 6661299 |
Odor sensor with organic transistor circuitry |
Dec. 9, 2003 |
| 6639392 |
Charged particle measuring device and measuring method thereof |
Oct. 28, 2003 |
| 6580280 |
Multilayered gas sensor and a related gas concentration detecting system |
Jun. 17, 2003 |
| 6556025 |
DC/low frequency sub-atto signal level measurement circuit |
Apr. 29, 2003 |
| 6531859 |
Electronic arrangement for an electric component and as a support for sensors |
Mar. 11, 2003 |
| 6525554 |
Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous silicon as a sensing film |
Feb. 25, 2003 |
| 6498470 |
Insulative contact sensor |
Dec. 24, 2002 |
| 6484559 |
Odor sensing with organic transistors |
Nov. 26, 2002 |
| 6484563 |
Method at detection of presence of hydrogen gas and measurement of content of hydrogen gas |
Nov. 26, 2002 |
| 6483283 |
Semiconductor dynamic quantity-sensor and method of manufacturing the same |
Nov. 19, 2002 |
| 6475728 |
Method for identifying and/or analyzing biological substances, present in a conductive liquid, device and affinity sensor used for implementing said method |
Nov. 5, 2002 |
| 6429675 |
Structure and method for probing wiring bond pads |
Aug. 6, 2002 |
| 6418784 |
Combined combustible gas sensor and temperature detector |
Jul. 16, 2002 |
| 6369404 |
Electron devices for single electron and nuclear spin measurement |
Apr. 9, 2002 |
| 6309831 |
Method of manufacturing biological chips |
Oct. 30, 2001 |
| 6278267 |
Method of determining impurity content and apparatus for the same |
Aug. 21, 2001 |
| 6222206 |
Wafer having top and bottom emitting vertical-cavity lasers |
Apr. 24, 2001 |
| 5965802 |
NO.sub.x sensor for exhaust gas, and process for producing the same |
Oct. 12, 1999 |
| 5955139 |
Automatic film deposition control |
Sep. 21, 1999 |
| 5908600 |
Monitor for detecting hydrocarbons and other gases in an open area |
Jun. 1, 1999 |
| 5770948 |
Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool |
Jun. 23, 1998 |
| 5734091 |
Method of manufacturing nitrogen oxide sensor, and nitrogen oxide sensor manufactured by the method and material therefor |
Mar. 31, 1998 |
| 5731697 |
In-situ monitoring of the change in thickness of films |
Mar. 24, 1998 |
| 5668301 |
Method and apparatus for the detection of hydrogen using a metal alloy |
Sep. 16, 1997 |
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