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Class Information
Number: 324/699
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using resistance or conductance measurement > With object or substance characteristic determination using conductivity effects > To determine dimension (e.g., distance or thickness)
Description: Subject matter including means to evaluate alterations in the physical shape of an object.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7164276 |
Method for determining the wall thickness of a metal tube |
Jan. 16, 2007 |
| 7018165 |
Method of minimizing the gap between a rotating turbine blade and a casing of a turbine, a turbine, and a method of determining the wear behavior of a wheel of a rotor |
Mar. 28, 2006 |
| 7019538 |
Electrostatic capacitance sensor type measurement apparatus |
Mar. 28, 2006 |
| 7002360 |
System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
Feb. 21, 2006 |
| 6972576 |
Electrical critical dimension measurement and defect detection for reticle fabrication |
Dec. 6, 2005 |
| 6954062 |
Apparatus for determining gaps between a proximity probe and a conductive target material |
Oct. 11, 2005 |
| 6922070 |
Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing |
Jul. 26, 2005 |
| 6919731 |
Method for measuring a position of a conductive target material |
Jul. 19, 2005 |
| 6861852 |
Method for measuring a gap between a proximity probe and a conductive target material |
Mar. 1, 2005 |
| 6850078 |
Method for measuring a gap between a proximity probe and a conductive target material |
Feb. 1, 2005 |
| 6825676 |
Apparatus for determining dynamic gaps between a proximity probe and a conductive target material |
Nov. 30, 2004 |
| 6822460 |
Method and apparatus for detecting a dry/wet state of a thermistor bead using temperature compensation |
Nov. 23, 2004 |
| 6819122 |
Method for measuring a gap between a proximity probe and a conductive target material |
Nov. 16, 2004 |
| 6798194 |
Method for measuring a gap between a proximity probe and a conductive target material |
Sep. 28, 2004 |
| 6768323 |
System and method for determining location of extrusion in interconnect |
Jul. 27, 2004 |
| 6768321 |
Component position indicating apparatus |
Jul. 27, 2004 |
| 6765395 |
Method for measuring a gap between a proximity probe and a conductive target material |
Jul. 20, 2004 |
| 6756794 |
Apparatus for determining a gap between a proximity probe component and a conductive target material |
Jun. 29, 2004 |
| 6731110 |
Magneto-resistive device with built-in test structure and method for determining resistance and track width |
May. 4, 2004 |
| 6724201 |
Resistance type liquid level measuring apparatus |
Apr. 20, 2004 |
| 6714026 |
System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
Mar. 30, 2004 |
| 6677766 |
Shallow trench isolation step height detection method |
Jan. 13, 2004 |
| 6608491 |
Container level monitoring system |
Aug. 19, 2003 |
| 6597186 |
Through tank level gauging |
Jul. 22, 2003 |
| 6593729 |
Position measuring device for detecting displacements with at least three degrees of freedom |
Jul. 15, 2003 |
| 6529014 |
Coating thickness gauge with automated zero adjustment and/or calibration |
Mar. 4, 2003 |
| 6525548 |
Check pattern for a semiconductor device |
Feb. 25, 2003 |
| 6504386 |
Liquid dielectric capacitor for film thickness mapping, measurement methods using same |
Jan. 7, 2003 |
| 6498500 |
Conductive fluid-based position sensor and method |
Dec. 24, 2002 |
| 6429668 |
Switching element produced in the form of a film |
Aug. 6, 2002 |
| 6429667 |
Electrically testable process window monitor for lithographic processing |
Aug. 6, 2002 |
| 6414584 |
Carbon fiber wiper |
Jul. 2, 2002 |
| 6384611 |
Ice thickness detector |
May. 7, 2002 |
| 6329812 |
Position measuring device for detecting displacements with at least three degrees of freedom |
Dec. 11, 2001 |
| 6277438 |
Protective fullerene (C60) packaging system for microelectromechanical systems applications |
Aug. 21, 2001 |
| 6218847 |
Test pattern for use in measuring thickness of insulating layer and method for using the same |
Apr. 17, 2001 |
| 6116101 |
Method and apparatus for determining the intermateability of connector assemblies |
Sep. 12, 2000 |
| 6067025 |
Apparatus and method for detecting the height above a silicon surface |
May. 23, 2000 |
| 6034531 |
Monitoring of the wear of sliding electrical contacts and its application to the state-dependent and/or predictive maintenance of a device having sliding electrical contacts |
Mar. 7, 2000 |
| 5864241 |
Magnetic transducer with wear indicator in a magnetic data storage system |
Jan. 26, 1999 |
| 5814999 |
Method and apparatus for measuring displacement and force |
Sep. 29, 1998 |
| 5751156 |
Mechanically controllable break transducer |
May. 12, 1998 |
| 5746905 |
Coating evaluation system |
May. 5, 1998 |
| 5708370 |
Depth sensor which detects grinding depth by means of change and resistance of resistor also ground during grinding |
Jan. 13, 1998 |
| 5699282 |
Methods and test structures for measuring overlay in multilayer devices |
Dec. 16, 1997 |
| 5657552 |
Device for measuring distances on globes or maps |
Aug. 19, 1997 |
| 5623200 |
Particle measuring apparatus and particle measuring method by the apparatus |
Apr. 22, 1997 |
| 5602486 |
Impedance sensing of flaws in non-homogenous materials |
Feb. 11, 1997 |
| 5602488 |
Method and apparatus for adjusting sectional area ratio of metal-covered electric wire |
Feb. 11, 1997 |
| 5559429 |
MR head lap monitor resistors |
Sep. 24, 1996 |
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