| |
 |
|
Class Information
Number: 324/671
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Lumped type parameters > Using capacitive type measurement > Where a material or object forms part of the dielectric being measured > To determine dimension (e.g., dielectric thickness)
Description: Subject matter wherein the physical characteristics of a dielectric object under test pertaining to its size or distance from a reference point are measured.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7586419 |
Ice detection apparatus and method |
Sep. 8, 2009 |
| 7567088 |
Foreign object detection apparatus |
Jul. 28, 2009 |
| 7486087 |
Method for measuring thickness of print products passing spaced apart at specific distances in a conveying flow through a measuring device |
Feb. 3, 2009 |
| 7466146 |
Frozen material detection using electric field sensor |
Dec. 16, 2008 |
| 7459919 |
Device for checking light-metal parts |
Dec. 2, 2008 |
| 7375537 |
Method and apparatus for measuring relative dielectric constant |
May. 20, 2008 |
| 7368922 |
Method and device for determining parameters of fluctuating flow |
May. 6, 2008 |
| 7358748 |
Methods and systems for determining a property of an insulating film |
Apr. 15, 2008 |
| 7330035 |
Object shape determination method and system therefor |
Feb. 12, 2008 |
| 7330032 |
Techniques for building-scale electrostatic tomography |
Feb. 12, 2008 |
| 7315174 |
Method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device |
Jan. 1, 2008 |
| 7295019 |
Security scanners with capacitance and magnetic sensor arrays |
Nov. 13, 2007 |
| 7276918 |
Sensor and apparatus for measuring the flow electric potential |
Oct. 2, 2007 |
| 7256588 |
Capacitive sensor and method for non-contacting gap and dielectric medium measurement |
Aug. 14, 2007 |
| 7256589 |
Capacitive sensor system with improved capacitance measuring sensitivity |
Aug. 14, 2007 |
| 7250774 |
Fingerprint sensor |
Jul. 31, 2007 |
| 7233154 |
Proximity sensor |
Jun. 19, 2007 |
| 7112972 |
Gauge calibration |
Sep. 26, 2006 |
| 7098050 |
Corona based charge voltage measurement |
Aug. 29, 2006 |
| 7081765 |
Electrostatic capacitance detection device |
Jul. 25, 2006 |
| 7064559 |
Non intrusive and dynamic method for measuring a distance or the variation thereof through dielectrics |
Jun. 20, 2006 |
| 6998856 |
Apparatus for sensing the position of a pointing object |
Feb. 14, 2006 |
| 6980009 |
Structure for measurement of capacitance of ultra-thin dielectrics |
Dec. 27, 2005 |
| 6900652 |
Flexible membrane probe and method of use thereof |
May. 31, 2005 |
| 6879168 |
Ice detection system |
Apr. 12, 2005 |
| 6872298 |
Determination of sample volume adequacy in biosensor devices |
Mar. 29, 2005 |
| 6844713 |
Compact stud finder |
Jan. 18, 2005 |
| 6777956 |
Capacitance measuring systems |
Aug. 17, 2004 |
| 6771913 |
Apparatus and method for acquiring the nature of a toner particle layer and the moisture content of a carrier material in a printer or copier |
Aug. 3, 2004 |
| 6761352 |
Method and system for double feed detection |
Jul. 13, 2004 |
| 6756791 |
Method for measuring film thickness using capacitance technique |
Jun. 29, 2004 |
| 6724199 |
Pin and cup devices for measuring film thickness |
Apr. 20, 2004 |
| 6717419 |
Liquid dielectric capacitor for film thickness mapping |
Apr. 6, 2004 |
| 6703846 |
Superabsorbent polymer targeting registration of dry formed composite cores |
Mar. 9, 2004 |
| 6646453 |
Method for measuring the thickness of multi-layer films |
Nov. 11, 2003 |
| 6624642 |
Metal bridging monitor for etch and CMP endpoint detection |
Sep. 23, 2003 |
| 6605950 |
Method and apparatus for measuring film thicknesses |
Aug. 12, 2003 |
| 6593754 |
Compact subsurface object locator |
Jul. 15, 2003 |
| 6572441 |
Method of and apparatus for chemical-mechanical polishing |
Jun. 3, 2003 |
| 6559475 |
Test pattern for evaluating a process of silicide film formation |
May. 6, 2003 |
| 6541986 |
Sensor for the capacitive measurement of film with thicknesses |
Apr. 1, 2003 |
| 6538459 |
Automatic calibration system for apparatus for measuring variations in thickness of elongated samples of thin plastic film |
Mar. 25, 2003 |
| 6529014 |
Coating thickness gauge with automated zero adjustment and/or calibration |
Mar. 4, 2003 |
| 6515490 |
Conductive fluid-based position sensor and method |
Feb. 4, 2003 |
| 6504386 |
Liquid dielectric capacitor for film thickness mapping, measurement methods using same |
Jan. 7, 2003 |
| 6496021 |
Method for making a capacitive distance sensor |
Dec. 17, 2002 |
| 6492821 |
Method and apparatus for detection signal processing |
Dec. 10, 2002 |
| 6486682 |
Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack |
Nov. 26, 2002 |
| 6486681 |
Measuring circuit for a capacitive sensor for distance measurement and/or space monitoring |
Nov. 26, 2002 |
| 6472887 |
Capacitive sensor for sensing the amount of material in a container |
Oct. 29, 2002 |
|
|
|
