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Class Information
Number: 324/617
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Parameter related to the reproduction or fidelity of a signal affected by a circuit under test > Transfer function type characteristics > Response time or phase delay
Description: Subject matter wherein the transmission characteristic of the signal being evaluated relates to transit time or phase changes.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7394238 |
High frequency delay circuit and test apparatus |
Jul. 1, 2008 |
| 7385403 |
KVM switch configured to estimate a length of a conductor |
Jun. 10, 2008 |
| 7378854 |
Dual sine-wave time stamp method and apparatus |
May. 27, 2008 |
| 7292176 |
Delay line, analog-to-digital converting device and load-sensing circuit using the same |
Nov. 6, 2007 |
| 7196526 |
Matched delay line voltage converter |
Mar. 27, 2007 |
| 7154274 |
High-sensitivity measuring instrument and method of using the instrument to measure a characteristic value at a point in time |
Dec. 26, 2006 |
| 7096443 |
Method for determining the critical path of an integrated circuit |
Aug. 22, 2006 |
| 7002357 |
Method and apparatus for phase calculation from attenuation values using a Hilbert transform for FDR measurements |
Feb. 21, 2006 |
| 6980915 |
Phase noise compensation for spectral measurements |
Dec. 27, 2005 |
| 6975951 |
Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals |
Dec. 13, 2005 |
| 6960926 |
Method and apparatus for characterizing a circuit with multiple inputs |
Nov. 1, 2005 |
| 6940293 |
Modeling miller effect in static timing analysis |
Sep. 6, 2005 |
| 6927580 |
Detection of a variation in the environment of an integrated circuit |
Aug. 9, 2005 |
| 6919727 |
Accurate time measurement system circuit and method |
Jul. 19, 2005 |
| 6900895 |
Phase noise compensation in an interferometric system |
May. 31, 2005 |
| 6842716 |
Method and apparatus for measuring the propagation time of a signal, in particular a ultrasonic signal |
Jan. 11, 2005 |
| 6828799 |
Propagation delay time measuring method and testing apparatus |
Dec. 7, 2004 |
| 6807497 |
Laser measurement system with digital delay compensation |
Oct. 19, 2004 |
| 6794857 |
Apparatus and method for measuring a phase delay characteristic |
Sep. 21, 2004 |
| 6791343 |
Modeling miller effect in static timing analysis |
Sep. 14, 2004 |
| 6784819 |
Measuring skew between digitizer channels using fourier transform |
Aug. 31, 2004 |
| 6721920 |
Systems and methods for facilitating testing of pad drivers of integrated circuits |
Apr. 13, 2004 |
| 6707307 |
Fluid sensor |
Mar. 16, 2004 |
| 6678134 |
Digital protective relay system |
Jan. 13, 2004 |
| 6675117 |
Calibrating single ended channels for differential performance |
Jan. 6, 2004 |
| 6611477 |
Built-in self test using pulse generators |
Aug. 26, 2003 |
| 6577150 |
Testing apparatus and method of measuring operation timing of semiconductor device |
Jun. 10, 2003 |
| 6574169 |
Delay test system for normal circuit |
Jun. 3, 2003 |
| 6574168 |
Time measuring device and testing apparatus |
Jun. 3, 2003 |
| 6466520 |
Built-in AC self test using pulse generators |
Oct. 15, 2002 |
| 6459278 |
Method for characterizing delay of frequency translation devices |
Oct. 1, 2002 |
| 6452459 |
Circuit for measuring signal delays of synchronous memory elements |
Sep. 17, 2002 |
| 6437553 |
Method for delay line linearity testing |
Aug. 20, 2002 |
| 6438163 |
Cable length and quality indicator |
Aug. 20, 2002 |
| 6369601 |
Method of measuring a propagation delay time through a transmission path in a semiconductor integrated circuit testing apparatus and semiconductor integrated circuit testing apparatus using th |
Apr. 9, 2002 |
| 6366095 |
Method and device for detecting and locating irregularities in a dielectric |
Apr. 2, 2002 |
| 6362631 |
Method for characterizing delay of frequency translation devices |
Mar. 26, 2002 |
| 6351281 |
Delay tracker |
Feb. 26, 2002 |
| 6347287 |
Calibration system and method for receiver guardband reductions |
Feb. 12, 2002 |
| 6327394 |
Apparatus and method for deriving temporal delays in integrated circuits |
Dec. 4, 2001 |
| 6316944 |
Effective netlength calculation |
Nov. 13, 2001 |
| 6285195 |
Time domain reflectometry apparatus and method |
Sep. 4, 2001 |
| 6232845 |
Circuit for measuring signal delays in synchronous memory elements |
May. 15, 2001 |
| 6219305 |
Method and system for measuring signal propagation delays using ring oscillators |
Apr. 17, 2001 |
| 6144262 |
Circuit for measuring signal delays of asynchronous register inputs |
Nov. 7, 2000 |
| 6060878 |
Spectrum analyzer |
May. 9, 2000 |
| 6057691 |
Delay element testing apparatus and integrated circuit having testing function for delay elements |
May. 2, 2000 |
| 6046595 |
Group delay estimate system using least square fit to phase response ramp |
Apr. 4, 2000 |
| 6031385 |
Method and apparatus for testing compensated buffer circuits |
Feb. 29, 2000 |
| 5955901 |
Wave shaping circuit of semiconductor testing apparatus |
Sep. 21, 1999 |
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