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Class Information
Number: 324/617
Name: Electricity: measuring and testing > Impedance, admittance or other quantities representative of electrical stimulus/response relationships > Parameter related to the reproduction or fidelity of a signal affected by a circuit under test > Transfer function type characteristics > Response time or phase delay
Description: Subject matter wherein the transmission characteristic of the signal being evaluated relates to transit time or phase changes.

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8680875 System and method for analyzing timing of semiconductor chip Mar. 25, 2014
8654931 Communication channel capacity estimation Feb. 18, 2014
8552740 Method of measuring delay in an integrated circuit Oct. 8, 2013
8461850 Time-domain measurements in a test and measurement instrument Jun. 11, 2013
8248094 Acquisition of silicon-on-insulator switching history effects statistics Aug. 21, 2012
8159209 Digital signal delay measuring circuit and digital signal delay measuring method Apr. 17, 2012
8143910 Semiconductor integrated circuit and method of testing the same Mar. 27, 2012
8093911 Time-of-flight measurement based on transfer function and simulated exponential stimulus Jan. 10, 2012
7969163 Measuring signal propagation and adjustable delays in electronic devices Jun. 28, 2011
7949922 Test apparatus, shift amount measuring apparatus, shift amount measuring method and diagnostic method May. 24, 2011
7868607 Test method for frequency converters with embedded local oscillators Jan. 11, 2011
7834642 Testing apparatus and method which adjusts a phase difference between rising and falling signals output from a DUT Nov. 16, 2010
7816935 Test apparatus Oct. 19, 2010
7635985 Test pattern for analyzing delay characteristic of interconnection line and method for analyzing delay characteristic of interconnection line using the same Dec. 22, 2009
7548071 Reflectometry test system using a sliding pseudo-noise reference Jun. 16, 2009
7519489 Determination of a jitter property of a signal Apr. 14, 2009
7459915 Electric circuit and test apparatus for outputting a recovered clock input signal Dec. 2, 2008
7394238 High frequency delay circuit and test apparatus Jul. 1, 2008
7385403 KVM switch configured to estimate a length of a conductor Jun. 10, 2008
7378854 Dual sine-wave time stamp method and apparatus May. 27, 2008
7292176 Delay line, analog-to-digital converting device and load-sensing circuit using the same Nov. 6, 2007
7196526 Matched delay line voltage converter Mar. 27, 2007
7154274 High-sensitivity measuring instrument and method of using the instrument to measure a characteristic value at a point in time Dec. 26, 2006
7096443 Method for determining the critical path of an integrated circuit Aug. 22, 2006
7002357 Method and apparatus for phase calculation from attenuation values using a Hilbert transform for FDR measurements Feb. 21, 2006
6980915 Phase noise compensation for spectral measurements Dec. 27, 2005
6975951 Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals Dec. 13, 2005
6960926 Method and apparatus for characterizing a circuit with multiple inputs Nov. 1, 2005
6940293 Modeling miller effect in static timing analysis Sep. 6, 2005
6927580 Detection of a variation in the environment of an integrated circuit Aug. 9, 2005
6919727 Accurate time measurement system circuit and method Jul. 19, 2005
6900895 Phase noise compensation in an interferometric system May. 31, 2005
6842716 Method and apparatus for measuring the propagation time of a signal, in particular a ultrasonic signal Jan. 11, 2005
6828799 Propagation delay time measuring method and testing apparatus Dec. 7, 2004
6807497 Laser measurement system with digital delay compensation Oct. 19, 2004
6794857 Apparatus and method for measuring a phase delay characteristic Sep. 21, 2004
6791343 Modeling miller effect in static timing analysis Sep. 14, 2004
6784819 Measuring skew between digitizer channels using fourier transform Aug. 31, 2004
6721920 Systems and methods for facilitating testing of pad drivers of integrated circuits Apr. 13, 2004
6707307 Fluid sensor Mar. 16, 2004
6678134 Digital protective relay system Jan. 13, 2004
6675117 Calibrating single ended channels for differential performance Jan. 6, 2004
6611477 Built-in self test using pulse generators Aug. 26, 2003
6577150 Testing apparatus and method of measuring operation timing of semiconductor device Jun. 10, 2003
6574169 Delay test system for normal circuit Jun. 3, 2003
6574168 Time measuring device and testing apparatus Jun. 3, 2003
6466520 Built-in AC self test using pulse generators Oct. 15, 2002
6459278 Method for characterizing delay of frequency translation devices Oct. 1, 2002
6452459 Circuit for measuring signal delays of synchronous memory elements Sep. 17, 2002
6438163 Cable length and quality indicator Aug. 20, 2002

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