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Class Information
Number: 324/537
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element
Description: Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 5086268 |
Measuring mount for microwave components |
Feb. 4, 1992 |
| 5083087 |
Broken wire detector for wire scribing machines |
Jan. 21, 1992 |
| 5081415 |
Load board insertion system |
Jan. 14, 1992 |
| 5079501 |
Flexible membrane circuit tester |
Jan. 7, 1992 |
| 5077521 |
Supply connection integrity monitor |
Dec. 31, 1991 |
| 5077596 |
Semiconductor device |
Dec. 31, 1991 |
| 5072175 |
Integrated circuit having improved continuity testability and a system incorporating the same |
Dec. 10, 1991 |
| 5072176 |
Flexible membrane circuit tester |
Dec. 10, 1991 |
| 5070296 |
Integrated circuit interconnections testing |
Dec. 3, 1991 |
| 5068599 |
Integrated circuit having an enabling circuit for controlling primary and secondary subcircuits |
Nov. 26, 1991 |
| 5068604 |
Method of and device for testing multiple power supply connections of an integrated circuit on a printed circuit board |
Nov. 26, 1991 |
| 5066908 |
Method for electrically detecting positional deviation of contact hole in semiconductor device |
Nov. 19, 1991 |
| 5061895 |
System for detecting and correcting misalignment of semiconductor package leads |
Oct. 29, 1991 |
| 5059897 |
Method and apparatus for testing passive substrates for integrated circuit mounting |
Oct. 22, 1991 |
| 5059910 |
Optical transformer |
Oct. 22, 1991 |
| 5057772 |
Method and system for concurrent electronic component testing and lead verification |
Oct. 15, 1991 |
| 5057774 |
Apparatus for measuring the quiescent current of an integrated monolithic digital circuit |
Oct. 15, 1991 |
| 5057780 |
Method and apparatus for measuring trigger and latchback voltage of a semiconductor device |
Oct. 15, 1991 |
| 5055776 |
Flexible membrane circuit tester |
Oct. 8, 1991 |
| 5053700 |
Method for wafer scale testing of redundant integrated circuit dies |
Oct. 1, 1991 |
| 5053713 |
Transducer monitoring arrangement |
Oct. 1, 1991 |
| 5051690 |
Apparatus and method for detecting vertically propagated defects in integrated circuits |
Sep. 24, 1991 |
| 5049811 |
Measuring integrity of semiconductor multi-layer metal structures |
Sep. 17, 1991 |
| RE33692 |
Fault diagnosis system for electronic device on automobiles |
Sep. 17, 1991 |
| 5047708 |
Apparatus for testing circuit boards |
Sep. 10, 1991 |
| 5047710 |
System for scan testing of logic circuit networks |
Sep. 10, 1991 |
| 5041761 |
Magnetic automotive lamp current sensor |
Aug. 20, 1991 |
| 5034686 |
Weapon interface system evaluation apparatus and method |
Jul. 23, 1991 |
| 5032783 |
Test circuit and scan tested logic device with isolated data lines during testing |
Jul. 16, 1991 |
| 5032791 |
Apparatus for testing Hall effect device |
Jul. 16, 1991 |
| 5030904 |
Diagnostic system for integrated circuits using existing pads |
Jul. 9, 1991 |
| 5031074 |
Circuit board guide and interfitting device to eliminate floating cables |
Jul. 9, 1991 |
| 5031110 |
System for monitoring electrical contact activity |
Jul. 9, 1991 |
| 5029278 |
Transducer interface circuit |
Jul. 2, 1991 |
| 5027057 |
Input condition sensing circuit |
Jun. 25, 1991 |
| 5024095 |
Diagnostic locator for mechanically malfunctioning electronic circuitry |
Jun. 18, 1991 |
| 5023544 |
Extended input and testing of electrical components for onsertion machines |
Jun. 11, 1991 |
| 5023557 |
Testing process for electronic devices |
Jun. 11, 1991 |
| 5021734 |
In-line coaxial surge protector and test fixture |
Jun. 4, 1991 |
| 5014002 |
ATE jumper programmable interface board |
May. 7, 1991 |
| 5006794 |
Module for preventing instability in integrated circuit testers |
Apr. 9, 1991 |
| 5006807 |
Method for determining undershoot resistance of an electronic device |
Apr. 9, 1991 |
| 5006808 |
Testing electrical circuits |
Apr. 9, 1991 |
| 5004978 |
Method for regenerating in-circuit test sequences for circuit board components |
Apr. 2, 1991 |
| 5004985 |
Method and apparatus for testing the response of a stress wave sensor |
Apr. 2, 1991 |
| 5004998 |
Ion-measuring apparatus for use in process |
Apr. 2, 1991 |
| 4998026 |
Driver circuit for in-circuit overdrive/functional tester |
Mar. 5, 1991 |
| 4994732 |
Automatic test system having a "true tester-per-pin" architecture |
Feb. 19, 1991 |
| 4986778 |
Carrier for use in testing circuit boards |
Jan. 22, 1991 |
| 4985672 |
Test equipment for a low current IC |
Jan. 15, 1991 |
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