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Class Information
Number: 324/537
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element
Description: Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.










Sub-classes under this class:

Class Number Class Name Patents
324/545 Armature or rotor 144
324/548 Capacitor 189
324/763 Dut including test circuit 1,087
324/538 Electrical connectors 432
324/550 Fuse 110
324/551 Insulation 300
324/770 Liquid crystal device test 415
324/772 Motor or generator fault tests 445
324/539 Multiconductor cable 330
324/771 Power supply test 142
324/549 Resistor 60
324/543 Single conductor cable 168
324/750 System sensing fields adjacent device under test (dut) 378
324/765 Test of semiconductor device 3,698
324/546 Winding or coil 187
324/764 With identification of dut 68
324/754 With probe elements 3,069


Patents under this class:
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Patent Number Title Of Patent Date Issued
5202639 Method and apparatus for testing analogue circuits Apr. 13, 1993
5202640 Capacitance and leakage test method and apparatus Apr. 13, 1993
5198778 Method for inspecting printed circuit boards with through-holes Mar. 30, 1993
5192913 Segmented charge limiting test algorithm for electrical components Mar. 9, 1993
5191282 Unitized test system with bi-directional transport feature Mar. 2, 1993
5189375 Inductive cable resistance tester Feb. 23, 1993
5187430 Method and apparatus for determining nets among nodes in a circuit board Feb. 16, 1993
5184082 Apparatus and method for testing an active matrix pixel display Feb. 2, 1993
5180975 Positioning device and IC conveyor utilizing the same Jan. 19, 1993
5172063 Method and circuit for testing the conductive circuitry of a printed circuit board Dec. 15, 1992
5170125 Tester for the ignition module of a vehicle Dec. 8, 1992
5168217 Method of detecting floated lead of electrical component Dec. 1, 1992
5166601 Test device for electric circuits on boards Nov. 24, 1992
5166609 Adapter and test fixture for an integrated circuit device package Nov. 24, 1992
5164747 Ink jet head with testing resistors Nov. 17, 1992
5162742 Method for locating electrical shorts in electronic substrates Nov. 10, 1992
5159263 LSI system having a test facilitating circuit Oct. 27, 1992
5159266 Test socket and method for failure analysis of plastic quad flat pack devices Oct. 27, 1992
5159273 Tri-state bus driver to support reconfigurable fault tolerant logic Oct. 27, 1992
5159274 Device and methods for measuring the quality of contact between two electrical conductors Oct. 27, 1992
5159369 Integrated circuit for electrostatic discharge testing Oct. 27, 1992
5159526 Method and apparatus for determining orientation of polarized capacitors Oct. 27, 1992
5157326 Board assembly for validation and characterization of a bus system Oct. 20, 1992
5157335 On-chip error detection circuit Oct. 20, 1992
5153521 Broken wire detector for use in a massively parallel array processing system Oct. 6, 1992
5150047 Member for use in assembly of integrated circuit elements and a method of testing assembled integrated circuit elements Sep. 22, 1992
5148102 Apparatus for the electrical function testing of wiring matrices, particularly of printed circuit boards Sep. 15, 1992
5146159 Pin driver for in-circuit test apparatus Sep. 8, 1992
5146160 Auxiliary power unit test kit Sep. 8, 1992
5144230 Method and system for testing integrated circuits by cycle stealing Sep. 1, 1992
5142222 Integrated circuit device having signal discrimination circuit and method of testing same Aug. 25, 1992
5142235 Two wire detection system for producing abnormal state outputs Aug. 25, 1992
5138256 Method and apparatus for determining the thickness of an interfacial polysilicon/silicon oxide film Aug. 11, 1992
5138257 Circuit for testing internal data bus of integrated circuit Aug. 11, 1992
5138266 Single-probe charge measurement testing method Aug. 11, 1992
5132611 Automobile gauge repair Jul. 21, 1992
5126659 Enablement of a test mode in an electronic module with limited pin-outs Jun. 30, 1992
5124633 Dual sided printed circuit board test system Jun. 23, 1992
5122753 Method of testing electrical components for defects Jun. 16, 1992
5122968 Apparatus and method for driving and controlling electric consumers, in particular heat plugs Jun. 16, 1992
5111137 Method and apparatus for the detection of leakage current May. 5, 1992
5105147 Wafer inspection system Apr. 14, 1992
5103166 Semiconductor integrated circuit chip having an identification circuit therein Apr. 7, 1992
5101153 Pin electronics test circuit for IC device testing Mar. 31, 1992
5101154 Open bond detector for an integrated circuit Mar. 31, 1992
5101162 Method and apparatus for testing the response of a stress wave sensor Mar. 31, 1992
5099196 On-chip integrated circuit speed selection Mar. 24, 1992
5097208 Apparatus and method for measuring gate delays in integrated circuit wafers Mar. 17, 1992
5097213 Apparatus for automatic testing of electrical and electronic connectors Mar. 17, 1992
5093984 Printed circuit board loader/unloader Mar. 10, 1992

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