| |
 |
|
Class Information
Number: 324/537
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element
Description: Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6150825 |
Electric circuit board tester |
Nov. 21, 2000 |
| 6150827 |
Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards |
Nov. 21, 2000 |
| 6144210 |
Method and apparatus for finding and locating manufacturing defects on a printed circuit board |
Nov. 7, 2000 |
| 6141093 |
Method and apparatus for locating power plane shorts using polarized light microscopy |
Oct. 31, 2000 |
| 6127828 |
Apparatus for measuring resistance of electronic component |
Oct. 3, 2000 |
| 6124715 |
Testing of live circuit boards |
Sep. 26, 2000 |
| 6121769 |
Method of and apparatus for detecting malfunction of displacement detector |
Sep. 19, 2000 |
| 6118279 |
Magnetic detection of short circuit defects in plate structure |
Sep. 12, 2000 |
| 6118285 |
Non-contact plasma probe for testing electrical continuity of printed wire boards |
Sep. 12, 2000 |
| 6118294 |
Integrated circuit testing device |
Sep. 12, 2000 |
| 6107808 |
Internal unbalance detection in capacitors |
Aug. 22, 2000 |
| 6103978 |
Printed wiring board having inner test-layer for improved test probing |
Aug. 15, 2000 |
| 6100701 |
Ignition coil current monitoring |
Aug. 8, 2000 |
| 6100710 |
Semiconductor device having two ground pads connected to a ground connection lead and method for testing the same |
Aug. 8, 2000 |
| 6097202 |
Circuit board inspection apparatus and method |
Aug. 1, 2000 |
| 6098027 |
Charge mode open/short test circuit |
Aug. 1, 2000 |
| 6081114 |
Method and apparatus for testing magnetic head with magnetoresistive element |
Jun. 27, 2000 |
| 6074158 |
IC transporting apparatus, IC posture altering apparatus and IC take-out apparatus |
Jun. 13, 2000 |
| 6066951 |
External light tester |
May. 23, 2000 |
| 6054720 |
Apparatus and method for evaluating the surface insulation resistance of electronic assembly manufacture |
Apr. 25, 2000 |
| 6054863 |
System for testing circuit board integrity |
Apr. 25, 2000 |
| 6051978 |
TDR tester for x-y prober |
Apr. 18, 2000 |
| 6051979 |
System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment |
Apr. 18, 2000 |
| 6049213 |
Method and system for testing the reliability of gate dielectric films |
Apr. 11, 2000 |
| 6037781 |
Measurement of electrical characteristics of semiconductor wafer |
Mar. 14, 2000 |
| 6034601 |
Method and apparatus for determining proper installation of alarm devices |
Mar. 7, 2000 |
| 6031370 |
Semiconductor testing apparatus |
Feb. 29, 2000 |
| 6028431 |
On-board wiring fault detection device |
Feb. 22, 2000 |
| 6028439 |
Modular integrated circuit tester with distributed synchronization and control |
Feb. 22, 2000 |
| 6028442 |
Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof |
Feb. 22, 2000 |
| 6008655 |
Frequency divider testing circuit clock-sampling window variable with divider output |
Dec. 28, 1999 |
| 6005385 |
Test board circuit for detecting tester malfunction and protecting devices under test |
Dec. 21, 1999 |
| 6005394 |
Process and apparatus for the capacitive testing of printed circuits |
Dec. 21, 1999 |
| 6002261 |
Trimming circuit |
Dec. 14, 1999 |
| 6002267 |
In-line voltage plane tests for multi-chip modules |
Dec. 14, 1999 |
| 5998751 |
Sorting system for computer chips |
Dec. 7, 1999 |
| 5999002 |
Contact check for remote sensed measurement |
Dec. 7, 1999 |
| 5999003 |
Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification |
Dec. 7, 1999 |
| 5996996 |
Method of sorting computer chips |
Dec. 7, 1999 |
| 5994916 |
LCD panel test system and test method thereof |
Nov. 30, 1999 |
| 5982125 |
Automatic door test apparatus |
Nov. 9, 1999 |
| 5982185 |
Direct connect carrier for testing semiconductor dice and method of fabrication |
Nov. 9, 1999 |
| 5977775 |
System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic equipment |
Nov. 2, 1999 |
| 5977776 |
Circuit board testing method |
Nov. 2, 1999 |
| 5969530 |
Circuit board inspection apparatus and method employing a rapidly changing electrical parameter signal |
Oct. 19, 1999 |
| 5962934 |
Arrangement for electrical power supply |
Oct. 5, 1999 |
| 5963038 |
Method of testing a connection which includes a conductor in an integrated circuit |
Oct. 5, 1999 |
| 5963039 |
Testing attachment reliability of devices |
Oct. 5, 1999 |
| 5963046 |
Method for detecting and locating open-circuit defects within digital CMOS integrated circuits |
Oct. 5, 1999 |
| 5952833 |
Programmable voltage divider and method for testing the impedance of a programmable element |
Sep. 14, 1999 |
|
|
|
