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Class Information
Number: 324/537
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element
Description: Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.










Sub-classes under this class:

Class Number Class Name Patents
324/545 Armature or rotor 146
324/548 Capacitor 191
324/763 Dut including test circuit 1,087
324/538 Electrical connectors 437
324/550 Fuse 111
324/551 Insulation 305
324/770 Liquid crystal device test 415
324/772 Motor or generator fault tests 445
324/539 Multiconductor cable 334
324/771 Power supply test 142
324/549 Resistor 60
324/543 Single conductor cable 170
324/750 System sensing fields adjacent device under test (dut) 378
324/765 Test of semiconductor device 3,698
324/546 Winding or coil 189
324/764 With identification of dut 68
324/754 With probe elements 3,069


Patents under this class:
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Patent Number Title Of Patent Date Issued
6373143 Integrated circuit having wirebond pads suitable for probing Apr. 16, 2002
6373258 Non-contact board inspection probe Apr. 16, 2002
6373269 Circuit board particularly adapted for use with high density test point in-circuit testers Apr. 16, 2002
6373270 Product carrier for environmental test system Apr. 16, 2002
6373272 Arrangement for the testing of semiconductor structures Apr. 16, 2002
6369580 Electrode pattern inspection device and method for detecting voltage variation Apr. 9, 2002
6369581 Methods of calling and turning off failure codes Apr. 9, 2002
6366098 Test structure, integrated circuit, and test method Apr. 2, 2002
6359433 Method and apparatus for preventing data loss in disk drives using predictive failure analysis of magnetoresistive head resistance Mar. 19, 2002
6356853 Enhancing voltmeter functionality Mar. 12, 2002
6344747 Device and method for monitoring the condition of a thermocouple Feb. 5, 2002
6342790 High-speed, adaptive IDDQ measurement Jan. 29, 2002
6339380 Electronic over stress detector circuit for magnetoresistive devices in data storage devices such as disc drives Jan. 15, 2002
6333633 Method for inspecting a flexible printed circuit Dec. 25, 2001
6326792 Method and apparatus for lifetime prediction of dielectric breakdown Dec. 4, 2001
6323656 Wiring harness diagnostic system Nov. 27, 2001
6323694 Differential comparator with a programmable voltage offset for use in an automatic tester Nov. 27, 2001
6324486 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time Nov. 27, 2001
6320391 Interconnection device for low and high current stress electromigration and correlation study Nov. 20, 2001
6320401 Substrate inspection using the propagation characteristics of RF electromagnetic waves Nov. 20, 2001
6317056 Circuit for intrinsically safe detection of the binary signals of a transmitter Nov. 13, 2001
6313656 Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point Nov. 6, 2001
6310482 Capacitance gauge tracking apparatus used for exposure system for manufacturing semiconductor device, method for the tracking surface of semiconductor device using the same, leveling apparatus Oct. 30, 2001
6307382 Device and method for magnetically sensing current in plate structure Oct. 23, 2001
6307479 Running indicator for integrated circuit package Oct. 23, 2001
6308300 Test generation for analog circuits using partitioning and inverted system simulation Oct. 23, 2001
6300768 Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing system for carrying out the same Oct. 9, 2001
6300769 Fast comparator suitable for BIST and BISR applications Oct. 9, 2001
6300770 Host register interface testing on bit stream based systems Oct. 9, 2001
6300786 Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources Oct. 9, 2001
6297643 Connection test method Oct. 2, 2001
6297644 Multipurpose defect test structure with switchable voltage contrast capability and method of use Oct. 2, 2001
6291987 Method and system for detecting incipient failures in a power inverter Sep. 18, 2001
6268734 Operational amplifier input offset voltage and input bias current test circuit Jul. 31, 2001
6265879 Electrical integrity test system for boats Jul. 24, 2001
6262579 Method and structure for detecting open vias in high density interconnect substrates Jul. 17, 2001
6262585 Apparatus for I/O leakage self-test in an integrated circuit Jul. 17, 2001
6258609 Method and system for making known good semiconductor dice Jul. 10, 2001
6259256 Cable testing apparatus Jul. 10, 2001
6259265 Unified test system and method for testing printed circuit boards Jul. 10, 2001
6255827 Search routine for 2-point electrical tester Jul. 3, 2001
6249114 Electronic component continuity inspection method and apparatus Jun. 19, 2001
6249127 Method and circuit for checking lead defects in a two-wire bus system Jun. 19, 2001
6236196 Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry May. 22, 2001
6225810 Loop resistance tester (LRT) for cable shield integrity May. 1, 2001
6222374 Wiring harness diagnostic system Apr. 24, 2001
6215310 Glow plug circuit tester Apr. 10, 2001
6211684 Internal unbalance detection in capacitors Apr. 3, 2001
6204770 Master automotive sensor tester Mar. 20, 2001
6201398 Non-contact board inspection probe Mar. 13, 2001

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