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Class Information
Number: 324/537
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element
Description: Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7616004 |
Backplane tester and method of use |
Nov. 10, 2009 |
| 7617064 |
Self-test circuit for high-definition multimedia interface integrated circuits |
Nov. 10, 2009 |
| 7612568 |
Open-circuit testing system and method |
Nov. 3, 2009 |
| 7609068 |
System and method for particulate sensor diagnostic |
Oct. 27, 2009 |
| 7598749 |
Integrated circuit with fuse programming damage detection |
Oct. 6, 2009 |
| 7598762 |
Semiconductor driver circuit with signal swing balance and enhanced testing |
Oct. 6, 2009 |
| 7598743 |
Battery maintenance device having databus connection |
Oct. 6, 2009 |
| 7594206 |
Fault detecting method and layout method for semiconductor integrated circuit |
Sep. 22, 2009 |
| 7587298 |
Diagnostic method for root-cause analysis of FET performance variation |
Sep. 8, 2009 |
| 7583833 |
Method and apparatus for manufacturing data indexing |
Sep. 1, 2009 |
| 7583093 |
Electrical test method of an integrated circuit |
Sep. 1, 2009 |
| 7576643 |
Sensor for measuring physical variables and for passing on the measured variable, circuit having such a sensor and method for operating the sensor and the circuit |
Aug. 18, 2009 |
| 7573315 |
Control device and method of operating the control device having controller chips and change-over unit |
Aug. 11, 2009 |
| 7573393 |
Integrated fault output/fault response delay circuit |
Aug. 11, 2009 |
| 7573937 |
Phase rotator control test scheme |
Aug. 11, 2009 |
| 7560936 |
Method and apparatus for ground bounce and power supply bounce detection |
Jul. 14, 2009 |
| 7554335 |
Production test technique for RF circuits using embedded test sensors |
Jun. 30, 2009 |
| 7550976 |
Apparatus/method for measuring the switching time of output signals of a DUT |
Jun. 23, 2009 |
| 7548069 |
Signal measurement systems and methods |
Jun. 16, 2009 |
| 7541815 |
Electronic device, testing apparatus, and testing method |
Jun. 2, 2009 |
| 7537943 |
Method of manufacturing a semiconductor integrated circuit device |
May. 26, 2009 |
| 7531756 |
Shielding apparatus |
May. 12, 2009 |
| 7518129 |
Preventing dosage drift with duplicate dose integrators |
Apr. 14, 2009 |
| 7519486 |
Method and apparatus to test the power-on-reset trip point of an integrated circuit |
Apr. 14, 2009 |
| 7518377 |
Measurement apparatus, test apparatus, and measurement method |
Apr. 14, 2009 |
| 7516037 |
Method evaluating threshold level of a data cell in a memory device |
Apr. 7, 2009 |
| 7511507 |
Integrated circuit and circuit board |
Mar. 31, 2009 |
| 7508217 |
Test apparatus and test module |
Mar. 24, 2009 |
| 7502326 |
Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices |
Mar. 10, 2009 |
| 7501832 |
Method and circuit for the detection of solder-joint failures in a digital electronic package |
Mar. 10, 2009 |
| 7496466 |
System for fault determinations for high frequency electronic circuits |
Feb. 24, 2009 |
| 7493226 |
Method and construct for enabling programmable, integrated system margin testing |
Feb. 17, 2009 |
| 7492559 |
Intelligent life testing methods and apparatus for leakage current protection |
Feb. 17, 2009 |
| 7492529 |
Bi-convex solid immersion lens |
Feb. 17, 2009 |
| 7489139 |
System and method for checking decoupling of power supply in printed wiring board |
Feb. 10, 2009 |
| 7486083 |
Managing system stability |
Feb. 3, 2009 |
| 7477110 |
Method and device for testing a phase locked loop |
Jan. 13, 2009 |
| 7477064 |
Probing apparatus and positional deviation acquiring method |
Jan. 13, 2009 |
| 7472038 |
Method of predicting microprocessor lifetime reliability using architecture-level structure-aware techniques |
Dec. 30, 2008 |
| 7466140 |
Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus |
Dec. 16, 2008 |
| 7456636 |
Test structures and method of defect detection using voltage contrast inspection |
Nov. 25, 2008 |
| 7456635 |
Circuit arrangement comprising a multi-wire line for supplying current and emitting signals |
Nov. 25, 2008 |
| 7453169 |
Integrity testing of isolation means in an uninterruptible power supply |
Nov. 18, 2008 |
| 7453932 |
Test device and setting method |
Nov. 18, 2008 |
| 7447964 |
Difference signal path test and characterization circuit |
Nov. 4, 2008 |
| 7446538 |
Device for identifying AC power supply arrangement |
Nov. 4, 2008 |
| 7446541 |
Solenoid test device |
Nov. 4, 2008 |
| 7437258 |
Use of I2C programmable clock generator to enable frequency variation under BMC control |
Oct. 14, 2008 |
| 7432720 |
Method and system for isolated current and voltage monitoring |
Oct. 7, 2008 |
| 7432722 |
Flexible continuity and circuit tester |
Oct. 7, 2008 |
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