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Class Information
Number: 324/525
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > For fault location > By resistance or impedance measuring
Description: Subject matter where measured resistance or impedance value indicate the location of a fault.

Sub-classes under this class:

Class Number Class Name Patents
324/526 Using a bridge circuit 38

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8710987 Secure data entry device Apr. 29, 2014
8686735 Input device receiver path and transmitter path error diagnosis Apr. 1, 2014
8680870 Energy-recycling burn-in apparatus for electronic ballasts and a method of burning-in electronic ballasts Mar. 25, 2014
8680871 Alignment correction system and method of use Mar. 25, 2014
8653841 Method and apparatus for monitoring a high-voltage electrical circuit including a discharge circuit Feb. 18, 2014
8624979 Monitoring apparatus for television Jan. 7, 2014
8618821 Device for detecting the thinning down of the substrate of an integrated circuit chip Dec. 31, 2013
8603840 Manufacturing method of semiconductor device Dec. 10, 2013
8593152 Earth ground tester with remote control Nov. 26, 2013
8581605 Nanopore platforms for ion channel recordings and single molecule detection and analysis Nov. 12, 2013
8558564 Heat spreader flatness detection Oct. 15, 2013
8497692 Resistance measurement in high power apparatus environments Jul. 30, 2013
8493082 Seating sensing device and method of the same Jul. 23, 2013
8487640 Internal node resistance testing for a tire Jul. 16, 2013
8482291 Substrate structure Jul. 9, 2013
8471573 Dynamic quantity sensor and manufacturing method thereof Jun. 25, 2013
8471567 Circuit for detection of failed solder-joints on array packages Jun. 25, 2013
8451008 Alignment correction system and method of use May. 28, 2013
8427167 Architecture and method to determine leakage impedance and leakage voltage node Apr. 23, 2013
8415955 Electrical test device Apr. 9, 2013
8415956 Electronic device and method for wire check Apr. 9, 2013
8405400 Device for detecting interruptions in a ring bus Mar. 26, 2013
8405506 Secure data entry device Mar. 26, 2013
8395403 Semiconductor device and defect analysis method for a semiconductor device Mar. 12, 2013
8395392 Parameter extraction using radio frequency signals Mar. 12, 2013
8395391 Method and apparatus for locating a parallel arc fault Mar. 12, 2013
8390298 Method for determination of a setting value which indicates a ground impedance, and measurement device Mar. 5, 2013
8390299 Earth ground tester with remote control Mar. 5, 2013
8379358 Motor control circuit Feb. 19, 2013
8358138 Method of discrimination of a device as powerable through a LAN line and device for estimating electric parameters of a LAN line Jan. 22, 2013
8358139 Optical reproducing apparatus connectable to optical pickups and method of controlling optical pickups Jan. 22, 2013
8332177 System and method for testing a characteristic impedance of a signal path routing of a printed circuit board Dec. 11, 2012
8325931 Detecting a loudspeaker configuration Dec. 4, 2012
8310243 Local electrochemical impedance spectroscopy (LEIS) for detecting coating defects in buried pipelines Nov. 13, 2012
8299814 PDU testing apparatus Oct. 30, 2012
8300028 Method and device for detecting terminal connection of 4-terminal or 5-terminal resistive touch panel Oct. 30, 2012
8294684 Method and device for detecting terminal connection of 4-terminal or 5-terminal resistive touch panel Oct. 23, 2012
8294689 Method and device for detecting terminal connection of 4-terminal or 5-terminal resistive touch panel Oct. 23, 2012
8294690 Method and device for detecting terminal connection of 4-terminal or 5-terminal resistive touch panel Oct. 23, 2012
8284904 Method for performing a shield integrity test and for isolating trouble in the shield using graphical analysis Oct. 9, 2012
8278935 Probe resistance measurement method and semiconductor device with pads for probe resistance measurement Oct. 2, 2012
8275569 Test apparatus and diagnosis method Sep. 25, 2012
8264235 Test structure for detection of defect devices with lowered resistance Sep. 11, 2012
8258799 MEMS dosimeter Sep. 4, 2012
8253420 Integrated electrical circuit and test to determine the integrity of a silicon die Aug. 28, 2012
8253421 Impedance measurement method and impedance measurement device Aug. 28, 2012
8253422 Method of manufacture of wafers using an electro-chemical residue sensor (ECRS) Aug. 28, 2012
8242769 Method for measuring transconductance Aug. 14, 2012
8228068 Systems and methods for detecting wire breaks Jul. 24, 2012

1 2 3 4 5 6 7 8

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