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Class Information
Number: 324/501
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Using radiant energy
Description: Subject matter wherein some form of radiant energy, e.g., electron beam, light, etc., is used to test the continuity of a conductor line.

Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8686734 System and method for determining radio frequency identification (RFID) system performance Apr. 1, 2014
8643539 Advance manufacturing monitoring and diagnostic tool Feb. 4, 2014
8633710 Method and apparatus for constructing images from measurements of impedence Jan. 21, 2014
8575955 Apparatus and method for electrical detection and localization of shorts in metal interconnect lines Nov. 5, 2013
8552732 Apparatus for measuring conductive pattern on substrate Oct. 8, 2013
8487250 Method for detecting information of an electronic potential on a sample and charged particle beam apparatus Jul. 16, 2013
8482294 Determination of at least one value associated with the electromagnetic radiation of an object under test Jul. 9, 2013
8481345 Method to determine the position-dependant metal correction factor for dose-rate equivalent laser testing of semiconductor devices Jul. 9, 2013
8441276 Solar photovoltaic panel test platform May. 14, 2013
8378706 Method to dice back-contact solar cells Feb. 19, 2013
8378702 Non-contact testing of printed electronics Feb. 19, 2013
8315848 Measurement method of the current-voltage characteristics of photovoltaic device, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradiance Nov. 20, 2012
8306309 Method and apparatus for detecting mechanical defects in a semiconductor device, particularly in a solar cell arrangement Nov. 6, 2012
8288177 SER testing for an IC chip using hot underfill Oct. 16, 2012
8263934 Method for detecting information of an electric potential on a sample and charged particle beam apparatus Sep. 11, 2012
8264251 Characteristic measuring device for solar cell Sep. 11, 2012
8242795 Method of testing durability of CIS based thin-film solar cell module Aug. 14, 2012
8205173 Physical failure analysis guiding methods Jun. 19, 2012
8193815 Photodiode self-test Jun. 5, 2012
8145959 Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit Mar. 27, 2012
8138782 Photovoltaic cell solar simulator Mar. 20, 2012
8121732 Target position detection apparatus for robot Feb. 21, 2012
8106665 3-D mapping focused beam failure analysis Jan. 31, 2012
8106664 System and method for conducting accelerated soft error rate testing Jan. 31, 2012
8022708 Fiber optic fault detection system and method for underground power lines Sep. 20, 2011
8008929 Method and apparatus for measuring a lifetime of charge carriers Aug. 30, 2011
7969046 Power supply control apparatus Jun. 28, 2011
7945939 Method and system for analyzing cable television signal leak information May. 17, 2011
7944365 Systems, methods, and apparatuses for stray voltage detection May. 17, 2011
7869977 Using multiple antennas to characterize a computer system based on electromagnetic signals Jan. 11, 2011
7863565 Electron beam inspection method and electron beam inspection apparatus Jan. 4, 2011
7851758 Portable multi-function inspection systems and methods Dec. 14, 2010
7847237 Method and apparatus for testing and evaluating performance of a solar cell Dec. 7, 2010
7825673 Failure analysis method and failure analysis apparatus Nov. 2, 2010
7782063 Partial discharge charge quantity measuring method and device Aug. 24, 2010
7755364 Image sensor Jul. 13, 2010
7733109 Test structure for resistive open detection using voltage contrast inspection and related methods Jun. 8, 2010
7701222 Method for validating printed circuit board materials for high speed applications Apr. 20, 2010
7692151 Device for analyzing an integrated circuit Apr. 6, 2010
7656170 Multiple directional scans of test structures on semiconductor integrated circuits Feb. 2, 2010
7651874 Method and apparatus for localizing production errors in a semiconductor component part Jan. 26, 2010
7623982 Method of testing an electronic circuit and apparatus thereof Nov. 24, 2009
7601941 Method and apparatus for evaluating solar cell and use thereof Oct. 13, 2009
7602197 High current electron beam inspection Oct. 13, 2009
7573271 Apparatus for measuring electric characteristics of semiconductor Aug. 11, 2009
7550961 Systems and methods for evaluating electromagnetic interference Jun. 23, 2009
7538333 Contactless charge measurement of product wafers and control of corona generation and deposition May. 26, 2009
7528612 System and method for monitoring a motor control center May. 5, 2009
7514681 Electrical process monitoring using mirror-mode electron microscopy Apr. 7, 2009
7495449 Non-destructive testing apparatus and non-destructive testing method Feb. 24, 2009

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