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Class Information
Number: 324/158.1
Name: Electricity: measuring and testing > Miscellaneous
Description: Subject matter not provided for in any preceding subclass.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620519 |
Burn-in process of producing data correlating elevation of disk drive head to temperature and method of controlling the elevation of the disk drive head using the data |
Nov. 17, 2009 |
| 7619434 |
System for multiple layer printed circuit board misregistration testing |
Nov. 17, 2009 |
| 7619432 |
Tandem handler system and method for reduced index time |
Nov. 17, 2009 |
| 7619404 |
System and method for testing integrated circuit timing margins |
Nov. 17, 2009 |
| 7616017 |
Probe station thermal chuck with shielding for capacitive current |
Nov. 10, 2009 |
| 7616006 |
Method and system for electrolyzer diagnosis based on curve fitting analysis and efficiency optimization |
Nov. 10, 2009 |
| 7615992 |
Apparatus and method for detecting electronic device testing socket |
Nov. 10, 2009 |
| 7615991 |
Method for measuring analog channel resistance of a semiconductor device having a gate, a source, a drain, a drain sense and a source sense |
Nov. 10, 2009 |
| 7615990 |
Loadboard enhancements for automated test equipment |
Nov. 10, 2009 |
| 7612575 |
Electronic device test apparatus for successively testing electronic devices |
Nov. 3, 2009 |
| 7610538 |
Test apparatus and performance board for diagnosis |
Oct. 27, 2009 |
| 7609053 |
Wafer testing system integrated with RFID techniques and thesting method thereof |
Oct. 27, 2009 |
| 7609052 |
Contact pusher, contact arm, and electronic device handling apparatus |
Oct. 27, 2009 |
| 7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices |
Oct. 20, 2009 |
| 7605594 |
Automated electrical wiring inspection system |
Oct. 20, 2009 |
| 7605584 |
Voltage generating apparatus, current generating apparatus, and test apparatus |
Oct. 20, 2009 |
| 7605583 |
Modular interface |
Oct. 20, 2009 |
| 7605582 |
Modular interface |
Oct. 20, 2009 |
| 7605581 |
Apparatus and method for controlling die force in a semiconductor device testing assembly |
Oct. 20, 2009 |
| 7602205 |
Electromigration tester for high capacity and high current |
Oct. 13, 2009 |
| 7602199 |
Mini-prober for TFT-LCD testing |
Oct. 13, 2009 |
| 7602192 |
Passive station power distribution for cable reduction |
Oct. 13, 2009 |
| 7602172 |
Test apparatus having multiple head boards at one handler and its test method |
Oct. 13, 2009 |
| 7602171 |
System for testing memory modules using a rotating-type module mounting portion |
Oct. 13, 2009 |
| 7598762 |
Semiconductor driver circuit with signal swing balance and enhanced testing |
Oct. 6, 2009 |
| 7598761 |
Semiconductor integrated circuit having a degradation notice signal generation circuit |
Oct. 6, 2009 |
| 7598755 |
Probe navigation method and device and defect inspection device |
Oct. 6, 2009 |
| 7598731 |
Systems and methods for adjusting threshold voltage |
Oct. 6, 2009 |
| 7598730 |
Semiconductor wafer examination method and semiconductor chip manufacturing method |
Oct. 6, 2009 |
| 7598729 |
Semiconductor chip flipping assembly and apparatus for bonding semiconductor chip using the same |
Oct. 6, 2009 |
| 7598728 |
System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms |
Oct. 6, 2009 |
| 7598727 |
Probe card head protection device for wafer sort set up |
Oct. 6, 2009 |
| 7598726 |
Methods and apparatuses for test methodology of input-output circuits |
Oct. 6, 2009 |
| 7598725 |
Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head |
Oct. 6, 2009 |
| 7598722 |
Method and apparatus for sensing temperature |
Oct. 6, 2009 |
| 7598721 |
Locating a cable using synchronization portion and data portion of a tone packet of a system |
Oct. 6, 2009 |
| 7595632 |
Wafer probe station having environment control enclosure |
Sep. 29, 2009 |
| 7595631 |
Wafer level assemble chip multi-site testing solution |
Sep. 29, 2009 |
| 7595630 |
Automated laser header testing |
Sep. 29, 2009 |
| 7595629 |
Method and apparatus for calibrating and/or deskewing communications channels |
Sep. 29, 2009 |
| 7592823 |
Electrical component handler having self-cleaning lower contact |
Sep. 22, 2009 |
| 7592797 |
Semiconductor device and electronics device |
Sep. 22, 2009 |
| 7592796 |
Plate with an indicator for discerning among pre-identified probe holes in the plate |
Sep. 22, 2009 |
| 7590499 |
Recording and conveying energy consumption and power information |
Sep. 15, 2009 |
| 7589546 |
Inspection apparatus and method for semiconductor IC |
Sep. 15, 2009 |
| 7589521 |
Universal cover for a burn-in socket |
Sep. 15, 2009 |
| 7589520 |
Soak profiling |
Sep. 15, 2009 |
| 7589519 |
Electronic apparatus with driving power having different voltage levels |
Sep. 15, 2009 |
| 7589518 |
Wafer probe station having a skirting component |
Sep. 15, 2009 |
| 7586318 |
Differential measurement probe having a ground clip system for the probing tips |
Sep. 8, 2009 |
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