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Class Information
Number: 324/158.1
Name: Electricity: measuring and testing > Miscellaneous
Description: Subject matter not provided for in any preceding subclass.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7453280 |
Method for testing semiconductor devices |
Nov. 18, 2008 |
| 7453279 |
Functional and stress testing of LGA devices |
Nov. 18, 2008 |
| 7453277 |
Apparatus for full-wafer test and burn-in mechanism |
Nov. 18, 2008 |
| 7453261 |
Method of and system for monitoring the functionality of a wafer probe site |
Nov. 18, 2008 |
| 7453260 |
Testing circuits on substrate |
Nov. 18, 2008 |
| 7453259 |
Loading a socket and/or adapter device with a semiconductor component |
Nov. 18, 2008 |
| 7453258 |
Method and apparatus for remotely buffering test channels |
Nov. 18, 2008 |
| 7451053 |
On die thermal sensor of semiconductor memory device and method thereof |
Nov. 11, 2008 |
| 7449909 |
System and method for testing one or more dies on a semiconductor wafer |
Nov. 11, 2008 |
| 7449877 |
Current measurement apparatus |
Nov. 11, 2008 |
| 7446550 |
Enhanced signal observability for circuit analysis |
Nov. 4, 2008 |
| 7446542 |
Apparatus and method for automated stress testing of flip-chip packages |
Nov. 4, 2008 |
| 7446277 |
Method for sorting integrated circuit devices |
Nov. 4, 2008 |
| 7443182 |
Coordinate transformation device for electrical signal connection |
Oct. 28, 2008 |
| 7443157 |
Device and method for planeness testing |
Oct. 28, 2008 |
| 7443156 |
Apparatus and method for identifying defects on objects or for locating objects |
Oct. 28, 2008 |
| 7439753 |
Inverter test device and a method thereof |
Oct. 21, 2008 |
| 7439731 |
Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
Oct. 21, 2008 |
| 7439730 |
Apparatus and method for detecting photon emissions from transistors |
Oct. 21, 2008 |
| 7439729 |
Integrated systems testing |
Oct. 21, 2008 |
| 7439728 |
System and method for test socket calibration using composite waveform |
Oct. 21, 2008 |
| 7436199 |
Stack-type semiconductor package sockets and stack-type semiconductor package test systems |
Oct. 14, 2008 |
| 7436197 |
Virtual test head for IC |
Oct. 14, 2008 |
| 7436195 |
Test apparatus for semiconductor elements on a semiconductor wafer, and a test method using the test apparatus |
Oct. 14, 2008 |
| 7436191 |
Differential measurement probe having a ground clip system for the probing tips |
Oct. 14, 2008 |
| 7436190 |
Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device |
Oct. 14, 2008 |
| 7436171 |
Apparatus for probing multiple integrated circuit devices |
Oct. 14, 2008 |
| 7436170 |
Probe station having multiple enclosures |
Oct. 14, 2008 |
| 7436169 |
Mechanical stress characterization in semiconductor device |
Oct. 14, 2008 |
| 7436168 |
Test error detection method and system |
Oct. 14, 2008 |
| 7432702 |
Circuit board damping assembly |
Oct. 7, 2008 |
| 7432701 |
Adjusting device and arrangement for adjusting a wafer |
Oct. 7, 2008 |
| 7432700 |
Surface inspection apparatus |
Oct. 7, 2008 |
| 7429864 |
Systems and methods for rectifying and detecting signals |
Sep. 30, 2008 |
| 7429497 |
Hybrid package with non-insertable and insertable conductive features, complementary receptacle, and methods of fabrication therefor |
Sep. 30, 2008 |
| 7427857 |
Resistor structures to electrically measure unidirectional misalignment of stitched masks |
Sep. 23, 2008 |
| 7427768 |
Apparatus, unit and method for testing image sensor packages |
Sep. 23, 2008 |
| 7425840 |
Semiconductor device with multipurpose pad |
Sep. 16, 2008 |
| 7425822 |
Functional and stress testing of LGA devices |
Sep. 16, 2008 |
| 7424406 |
Filter characteristic measuring method and system |
Sep. 9, 2008 |
| 7423445 |
Method and system for trimming voltage or current references |
Sep. 9, 2008 |
| 7423444 |
Digital test apparatus for testing analog semiconductor device(s) |
Sep. 9, 2008 |
| 7423443 |
Method of performing parallel test on semiconductor devices by dividing voltage supply unit |
Sep. 9, 2008 |
| 7423440 |
Functional and stress testing of LGA devices |
Sep. 9, 2008 |
| 7423419 |
Chuck for holding a device under test |
Sep. 9, 2008 |
| 7423418 |
Module part |
Sep. 9, 2008 |
| 7421365 |
Automated circuit board test actuator system |
Sep. 2, 2008 |
| 7421355 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device |
Sep. 2, 2008 |
| 7417420 |
Switch to bypass optical diode for reducing power consumption of electrical meters |
Aug. 26, 2008 |
| 7414425 |
Damping control in a three-phase motor with a single current sensor |
Aug. 19, 2008 |
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