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Class Information
Number: 324/158.1
Name: Electricity: measuring and testing > Miscellaneous
Description: Subject matter not provided for in any preceding subclass.










Patents under this class:

Patent Number Title Of Patent Date Issued
7804294 Non contact method and apparatus for measurement of sheet resistance of P-N junctions Sep. 28, 2010
7804293 Power supply and stabilizer Sep. 28, 2010
7804292 Method for testing integrated circuits mounted on a carrier Sep. 28, 2010
7804291 Semiconductor test device with heating circuit Sep. 28, 2010
7800393 Electronic device test apparatus for successively testing electronic devices Sep. 21, 2010
7800391 Apparatus for testing a chip and methods of making and using the same Sep. 21, 2010
7800390 Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction method Sep. 21, 2010
7800383 Apparatus and method for testing keyboard of mobile phone Sep. 21, 2010
7795860 Multiple probe acquisition system Sep. 14, 2010
7786724 Methods and apparatus for collecting process characterization data after first failure in a group of tested devices Aug. 31, 2010
7786723 Test stage for a carrier having printhead integrated circuitry thereon Aug. 31, 2010
7786722 Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same Aug. 31, 2010
7786721 Multilayer type test board assembly for high-precision inspection Aug. 31, 2010
7786475 In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same Aug. 31, 2010
7782075 Electronic device, load fluctuation compensation circuit, power supply, and test apparatus Aug. 24, 2010
7782071 Probe card analysis system and method Aug. 24, 2010
7782045 Multi-signal input testing apparatus Aug. 24, 2010
7777516 System and method for bearing fault detection using stator current noise cancellation Aug. 17, 2010
7777514 Methods for transferring integrated circuits to a printed circuit board Aug. 17, 2010
7777512 Semiconductor device Aug. 17, 2010
7777479 Current detector with variable output voltage level Aug. 17, 2010
7772867 Structures for testing and locating defects in integrated circuits Aug. 10, 2010
7772834 Handler and process for testing a semiconductor chips using the handler Aug. 10, 2010
7772833 Flexible on chip testing circuit for I/O's characterization Aug. 10, 2010
7772832 Manipulator for positioning a test head on a tester Aug. 10, 2010
7772831 Systems and methods for testing packaged dies Aug. 10, 2010
7772830 Test handler automatic contactor cleaner methods and surrogate cleaning device Aug. 10, 2010
7768287 Methods and apparatus for managing defective processors through power gating Aug. 3, 2010
7768281 Probe assembly for lapping a bar using a patterned probe Aug. 3, 2010
7768280 Apparatus for a low-cost semiconductor test interface system Aug. 3, 2010
7768255 Interconnection substrate, skew measurement method, and test apparatus Aug. 3, 2010
7768253 Sampling module and a method of sampling one or more analogue characteristics of a power transmission system Aug. 3, 2010
7759960 Integrated circuit testing methods using well bias modification Jul. 20, 2010
7759957 Method for fabricating a test structure Jul. 20, 2010
7759955 Method and device for position detection using connection pads Jul. 20, 2010
7759944 Method for verifying the calibration of a multiport network analyzer and corresponding calibration unit Jul. 20, 2010
7759928 Semiconductor device including an internal voltage generation circuit and a first test circuit Jul. 20, 2010
7755378 Clamping top plate using magnetic force Jul. 13, 2010
7755375 Test apparatus, probe card, and test method Jul. 13, 2010
7755365 Electronic element testing and supporting apparatus Jul. 13, 2010
7752000 Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion Jul. 6, 2010
7750660 Integrated circuit with improved test capability via reduced pin count Jul. 6, 2010
7750658 Integrated circuit and testing circuit therein for testing and failure analysis Jul. 6, 2010
7750657 Polishing head testing with movable pedestal Jul. 6, 2010
7750650 Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry Jul. 6, 2010
7750622 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture Jul. 6, 2010
7746068 Method and apparatus for measuring current Jun. 29, 2010
7746062 Radio frequency testing system and testing circuit utilized thereby Jun. 29, 2010
7746061 Method of performing signal-measured calibration Jun. 29, 2010
7746060 Attachment apparatus, test head, and electronic device test system Jun. 29, 2010











 
 
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