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Class Information
Number: 257/E29.02
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Semiconductors devices adapted for rectifying, amplifying, oscillating, or switching, capacitors, or resistors with at least one potential-jump barrier or surface barrier (epo) > Electrical characteristics due to properties of entire semiconductor body rather than just surface region (epo) > Characterized by specified shape or size of pn junction or by specified impurity concentration gradient within the device (epo) > Characterized by particular design considerations to control electrical field effect within device (epo) > Comprising internal isolation within devices or components (epo) > Isolation by dielectric regions (epo)
Description: This subclass is indented under subclass E29.018. This subclass is substantially the same in scope as ECLA classification H01L29/06B3C.










Sub-classes under this class:

Class Number Class Name Patents
257/E29.021 For source or drain region of field-effect device (epo) 336


Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8710619 Semiconductor device and manufacturing method thereof Apr. 29, 2014
8692352 Semiconductor device and method for manufacturing the same Apr. 8, 2014
8692353 Semiconductor structure and method Apr. 8, 2014
8686533 Isolation structure Apr. 1, 2014
8686534 Trench isolation structure and method for forming the same Apr. 1, 2014
8673699 Semiconductor structure having NFET extension last implants Mar. 18, 2014
8664742 Semiconductor substrates with undercut structures Mar. 4, 2014
8664080 Vertical ESD protection device Mar. 4, 2014
8659114 Semiconductor device Feb. 25, 2014
8643034 Monolithic, optoelectronic semiconductor body and method for the production thereof Feb. 4, 2014
8643104 Lateral diffusion metal oxide semiconductor transistor structure Feb. 4, 2014
8643138 High breakdown voltage integrated circuit isolation structure Feb. 4, 2014
8637934 Semiconductor device having vertical channels and method of manufacturing the same Jan. 28, 2014
8629559 Stress reduction apparatus with an inverted cup-shaped layer Jan. 14, 2014
8614490 Semiconductor device Dec. 24, 2013
8614482 Semiconductor power device having improved termination structure for mask saving Dec. 24, 2013
8614137 Dual contact trench resistor in shallow trench isolation (STI) and methods of manufacture Dec. 24, 2013
8610239 Semiconductor device and method of manufacturing the same Dec. 17, 2013
8587086 Self-aligned dual depth isolation and method of fabrication Nov. 19, 2013
8575040 Low temperature process for polysilazane oxidation/densification Nov. 5, 2013
8575694 Insulated gate bipolar transistor structure having low substrate leakage Nov. 5, 2013
8575716 Integrated circuit devices and methods of forming memory array and peripheral circuitry isolation Nov. 5, 2013
8569839 Semiconductor device and manufacturing method thereof Oct. 29, 2013
8552491 Semiconductor devices semiconductor pillars and method of fabricating the same Oct. 8, 2013
8551858 Self-aligned SI rich nitride charge trap layer isolation for charge trap flash memory Oct. 8, 2013
8546203 Semiconductor structure having NFET extension last implants Oct. 1, 2013
8546242 Hybrid gap-fill approach for STI formation Oct. 1, 2013
8546888 Isolation regions Oct. 1, 2013
8541863 Data retention in a single poly EPROM cell Sep. 24, 2013
8541864 Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture Sep. 24, 2013
8530999 Semiconductor component with isolation trench intersections Sep. 10, 2013
8525145 Self-aligned, planar phase change memory elements and devices, systems employing the same and methods of forming the same Sep. 3, 2013
8525245 eDRAM having dynamic retention and performance tradeoff Sep. 3, 2013
8518777 Method for forming accumulation-mode field effect transistor with improved current capability Aug. 27, 2013
8501579 Process of fabricating chip Aug. 6, 2013
8492842 Method for forming retrograded well for MOSFET Jul. 23, 2013
8486818 Semiconductor devices including buried gate electrodes and isolation layers and methods of forming semiconductor devices including buried gate electrodes and isolation layers using self aligne Jul. 16, 2013
8487398 Capacitor device using an isolated well and method therefor Jul. 16, 2013
8482095 High-voltage transistor having shielding gate Jul. 9, 2013
8470679 Semiconductor device including a deep contact and a method of manufacturing such a device Jun. 25, 2013
8450170 Semiconductor memory device and method of forming the same May. 28, 2013
8450828 Semiconductor device May. 28, 2013
8432000 Trench MOS barrier schottky rectifier with a planar surface using CMP techniques Apr. 30, 2013
8426926 Semiconductor devices having field effect transistors with epitaxial patterns in recessed regions Apr. 23, 2013
8420458 Semiconductor device and method of producing same Apr. 16, 2013
8410573 SOI (silicon on insulator) structure semiconductor device and method of manufacturing the same Apr. 2, 2013
8383481 Semiconductor memory device and method of manufacturing the same Feb. 26, 2013
8383489 SOI wafer and method for forming the same Feb. 26, 2013
8384188 Semiconductor device and fabrication method thereof Feb. 26, 2013
8368170 Reducing device performance drift caused by large spacings between active regions Feb. 5, 2013

1 2 3 4 5 6 7 8










 
 
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