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Class Information
Number: 257/E27.062
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Device consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate, e.g., integrated circuit device (epo) > Including semiconductor component with at least one potential barrier or surface barrier adapted for rectifying, oscillating, amplifying, or switching, or including integrated passive circuit elements (epo) > With semiconductor substrate only (epo) > Including only semiconductor components of a single kind, e.g., all bipolar transistors, all diodes, or all cmos (epo) > Including field-effect component only (epo) > Field-effect transistor with insulated gate (epo) > Complementary mis (epo)
Description: This subclass is indented under subclass E27.06. This subclass is substantially the same in scope as ECLA classification H01L27/092.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7629212 |
Doped WGe to form dual metal gates |
Dec. 8, 2009 |
| 7608895 |
Modular CMOS analog integrated circuit and power technology |
Oct. 27, 2009 |
| 7608896 |
Semiconductor device |
Oct. 27, 2009 |
| 7605432 |
Modular bipolar-CMOS-DMOS analog integrated circuit and power transistor technology |
Oct. 20, 2009 |
| 7605433 |
Modular bipolar-CMOS-DMOS analog integrated circuit and power transistor technology |
Oct. 20, 2009 |
| 7602024 |
Modular bipolar-CMOS-DMOS analog integrated circuit and power transistor technology |
Oct. 13, 2009 |
| 7602023 |
Modular bipolar-CMOS-DMOS analog integrated circuit and power transistor technology |
Oct. 13, 2009 |
| 7592675 |
Partial FinFET memory cell |
Sep. 22, 2009 |
| 7589385 |
Semiconductor CMOS transistors and method of manufacturing the same |
Sep. 15, 2009 |
| 7585762 |
Vapor deposition processes for tantalum carbide nitride materials |
Sep. 8, 2009 |
| 7576397 |
Semiconductor device |
Aug. 18, 2009 |
| 7569891 |
Semiconductor device with reduced contact resistance and method for manufacturing the same |
Aug. 4, 2009 |
| 7569894 |
Semiconductor device with NMOS transistors arranged continuously |
Aug. 4, 2009 |
| 7569898 |
Semiconductor device and method of manufacturing the same |
Aug. 4, 2009 |
| 7545003 |
Defect-free source/drain extensions for MOSFETS having germanium based channel regions |
Jun. 9, 2009 |
| 7541650 |
Gate electrode structures |
Jun. 2, 2009 |
| 7538351 |
Method for forming an SOI structure with improved carrier mobility and ESD protection |
May. 26, 2009 |
| 7534677 |
Method of fabricating a dual gate oxide |
May. 19, 2009 |
| 7535064 |
Semiconductor device having a fin and method of manufacturing the same |
May. 19, 2009 |
| 7531880 |
Semiconductor device and manufacturing method thereof |
May. 12, 2009 |
| 7531853 |
Semiconductor device and manufacturing method of the same |
May. 12, 2009 |
| 7525160 |
Multigate device with recessed strain regions |
Apr. 28, 2009 |
| 7518167 |
Semiconductor device |
Apr. 14, 2009 |
| 7511347 |
Semiconductor integrated circuit for high-speed, high-frequency signal transmission |
Mar. 31, 2009 |
| 7511348 |
MOS transistors with selectively strained channels |
Mar. 31, 2009 |
| 7449731 |
Semiconductor gate circuit and delay circuit comprising series connected CMOS transistors |
Nov. 11, 2008 |
| 7442601 |
Stress enhanced CMOS circuits and methods for their fabrication |
Oct. 28, 2008 |
| 7442960 |
TFT, method of manufacturing the TFT, flat panel display having the TFT, and method of manufacturing the flat panel display |
Oct. 28, 2008 |
| 7436036 |
PMOS transistor of semiconductor device, semiconductor device comprising the same, and method for manufacturing the same |
Oct. 14, 2008 |
| 7429770 |
Semiconductor device and manufacturing method thereof |
Sep. 30, 2008 |
| 7423330 |
Semiconductor device with strain |
Sep. 9, 2008 |
| 7420254 |
Semiconductor device having a metal gate electrode |
Sep. 2, 2008 |
| 7414293 |
Structure and method of applying localized stresses to the channels of PFET and NFET transistors for improved performance |
Aug. 19, 2008 |
| 7408210 |
Solid state image pickup device and camera |
Aug. 5, 2008 |
| 7391085 |
Semiconductor device |
Jun. 24, 2008 |
| 7385256 |
Transistor arrangement in monocrystalline substrate having stress exerting insulators |
Jun. 10, 2008 |
| 7385257 |
Hybrid orientation SOI substrates, and method for forming the same |
Jun. 10, 2008 |
| 7372108 |
Semiconductor device and manufacturing method thereof |
May. 13, 2008 |
| 7361540 |
Method of reducing noise disturbing a signal in an electronic device |
Apr. 22, 2008 |
| 7348611 |
Strained complementary metal oxide semiconductor (CMOS) on rotated wafers and methods thereof |
Mar. 25, 2008 |
| 7348635 |
Device having enhanced stress state and related methods |
Mar. 25, 2008 |
| 7345329 |
Method for reduced N+ diffusion in strained Si on SiGe substrate |
Mar. 18, 2008 |
| 7335911 |
Semiconductor device and manufacturing method thereof |
Feb. 26, 2008 |
| 7317229 |
Gate electrode structures and methods of manufacture |
Jan. 8, 2008 |
| 7285831 |
CMOS device with improved performance and method of fabricating the same |
Oct. 23, 2007 |
| 7271442 |
Transistor structure having stressed regions of opposite types underlying channel and source/drain regions |
Sep. 18, 2007 |
| 7271450 |
Dual-gate structure and method of fabricating integrated circuits having dual-gate structures |
Sep. 18, 2007 |
| 7224006 |
Semiconductor device |
May. 29, 2007 |
| 7211869 |
Increasing carrier mobility in NFET and PFET transistors on a common wafer |
May. 1, 2007 |
| 7160786 |
Silicon on insulator device and layout method of the same |
Jan. 9, 2007 |
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