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Class Information
Number: 257/E23.147
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Packaging, interconnects, and markings for semiconductor or other solid-state devices (epo) > Arrangements for conducting electric current within device in operation from one component to another, interconnections, e.g., wires, lead frames (epo) > Including external interconnections consisting of multilayer structure of conductive and insulating layers inseparably formed on semiconductor body (epo) > With adaptable interconnections (epo) > Comprising antifuses, i.e., connections having their state changed from nonconductive to conductive (epo)
Description: This subclass is indented under subclass E23.146. This subclass is substantially the same in scope as ECLA classification H01L23/525A.










Sub-classes under this class:

Class Number Class Name Patents
257/E23.148 Change of state resulting from use of external beam, e.g., laser beam or ion beam (epo) 79


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12

Patent Number Title Of Patent Date Issued
8674475 Antifuse and methods of operating and manufacturing the same Mar. 18, 2014
8674476 Anti-fuse device structure and electroplating circuit structure and method Mar. 18, 2014
8664744 Anti-fuse element without defective opens Mar. 4, 2014
8638589 Operating method for non-volatile memory unit Jan. 28, 2014
8633567 Devices including a P-I-N diode disposed adjacent a silicide in series with a dielectric material Jan. 21, 2014
8624299 Stacked bit line dual word line nonvolatile memory Jan. 7, 2014
8610245 Anti-fuse element without defective opens Dec. 17, 2013
8575719 Silicon nitride antifuse for use in diode-antifuse memory arrays Nov. 5, 2013
8569755 Secure anti-fuse with low voltage programming through localized diffusion heating Oct. 29, 2013
8542517 Low voltage programmable mosfet antifuse with body contact for diffusion heating Sep. 24, 2013
8519508 Semiconductor device having an anti-fuse element and a transistor with a pocket region Aug. 27, 2013
8513768 Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same Aug. 20, 2013
8513769 Electrical fuses and resistors having sublithographic dimensions Aug. 20, 2013
8493767 One-time programmable device having an LDMOS structure Jul. 23, 2013
8476157 Buried bit line anti-fuse one-time-programmable nonvolatile memory Jul. 2, 2013
8471355 AND-type one time programmable memory cell Jun. 25, 2013
8471356 Programmable anti-fuse structures with conductive material islands Jun. 25, 2013
8455973 Region divided substrate and semiconductor device Jun. 4, 2013
8395232 Semiconductor device and method of manufacturing the same Mar. 12, 2013
8384131 Semiconductor device and methods of forming the same Feb. 26, 2013
8368172 Fused buss for plating features on a semiconductor die Feb. 5, 2013
8368070 Antifuse structure for in line circuit modification Feb. 5, 2013
8368069 Antifuse structure for in line circuit modification Feb. 5, 2013
8367484 Antifuse structure for in line circuit modification Feb. 5, 2013
8367483 Antifuse structure for in line circuit modification Feb. 5, 2013
8361887 Method of programming electrical antifuse Jan. 29, 2013
8361886 Method for programming an anti-fuse element, and semiconductor device Jan. 29, 2013
8357994 Antifuse with a single silicon-rich silicon nitride insulating layer Jan. 22, 2013
8350264 Secure anti-fuse with low voltage programming through localized diffusion heating Jan. 8, 2013
8330250 P-I-N diode crystallized adjacent to a silicide in series with a dielectric material Dec. 11, 2012
8330189 One-time programmable memory and method for making the same Dec. 11, 2012
8330249 Semiconductor device with driver circuit and memory element Dec. 11, 2012
8324708 Semiconductor integrated circuit device and manufacturing method thereof Dec. 4, 2012
8299569 Semiconductor device and method of cutting electrical fuse Oct. 30, 2012
8278732 Antifuse element for integrated circuit device Oct. 2, 2012
8258586 Non-volatile anti-fuse with consistent rupture Sep. 4, 2012
8242578 Anti-fuse device structure and electroplating circuit structure and method Aug. 14, 2012
8232146 Semiconductor device with resistor and fuse and method of manufacturing the same Jul. 31, 2012
8227890 Method of forming an electrical fuse and a metal gate transistor and the related electrical fuse Jul. 24, 2012
8217490 Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same Jul. 10, 2012
8211755 Method for multi-level interconnection memory device Jul. 3, 2012
8193074 Integration of damascene type diodes and conductive wires for memory device Jun. 5, 2012
8183665 Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same May. 22, 2012
8179709 Semiconductor device including antifuse element May. 15, 2012
8178945 Programmable PN anti-fuse May. 15, 2012
8159042 Adopting feature of buried electrically conductive layer in dielectrics for electrical anti-fuse application Apr. 17, 2012
8134220 Two-terminal nanotube devices including a nanotube bridge and methods of making same Mar. 13, 2012
8125013 Structure, design structure and method of manufacturing a structure having VIAS and high density capacitors Feb. 28, 2012
8124971 Implementation of diffusion barrier in 3D memory Feb. 28, 2012
8125048 Antifuse structure for in line circuit modification Feb. 28, 2012

1 2 3 4 5 6 7 8 9 10 11 12










 
 
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