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Class Information
Number: 257/E21.642
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Processes or apparatus adapted for manufacture or treatment of semiconductor or solid-state devices or of parts thereof (epo) > Manufacture or treatment of devices consisting of plurality of solid-state components formed in or on common substrate or of parts thereof; manufacture of integrated circuit devices or of parts thereof (epo) > Manufacture or treatment of devices consisting of plurality of solid-state components or integrated circuits formed in, or on, common substrate (epo) > With subsequent division of substrate into plural individual devices (epo) > To produce devices each consisting of plurality of components, e.g., integrated circuits (epo) > Substrate being semiconductor, using silicon technology (epo) > Field-effect technology (epo) > Mis technology (epo) > Complementary field-effect transistors, e.g., cmos (epo) > Isolation region manufacturing related aspects, e.g., to avoid interaction of isolation region with adjacent structure (epo)
Description: This subclass is indented under subclass E21.632. This subclass is substantially the same in scope as ECLA classification H01L21/8238U.

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8685830 Method of filling shallow trenches Apr. 1, 2014
8679938 Shallow trench isolation for device including deep trench capacitors Mar. 25, 2014
8673724 Methods of fabricating semiconductor devices Mar. 18, 2014
8404537 Method of manufacturing semiconductor device Mar. 26, 2013
8338919 Semiconductor device with strain Dec. 25, 2012
8299538 Differential nitride pullback to create differential NFET to PFET divots for improved performance versus leakage Oct. 30, 2012
8232178 Method for forming a semiconductor device with stressed trench isolation Jul. 31, 2012
8102030 Semiconductor device with strain Jan. 24, 2012
8097503 Method of manufacturing semiconductor device Jan. 17, 2012
8053305 Method for producing semiconductor device Nov. 8, 2011
8053303 SOI body contact using E-DRAM technology Nov. 8, 2011
8039338 Method for reducing defects of gate of CMOS devices during cleaning processes by modifying a parasitic PN junction Oct. 18, 2011
8003458 Methods of manufacturing a semiconductor device with active regions of different heights Aug. 23, 2011
7998811 Semiconductor device and method for semiconductor device Aug. 16, 2011
7981800 Shallow trench isolation structures and methods for forming the same Jul. 19, 2011
7943455 CMOS image sensors and methods of fabricating the same May. 17, 2011
7932143 Methods for protecting gate stacks during fabrication of semiconductor devices and semiconductor devices fabricated from such methods Apr. 26, 2011
7910423 Semiconductor device and method of manufacturing the same Mar. 22, 2011
7902020 Semiconductor device and method of manufacturing the same Mar. 8, 2011
7902037 Isolation structure in memory device and method for fabricating the same Mar. 8, 2011
7892929 Shallow trench isolation corner rounding Feb. 22, 2011
7880261 Isolation technique allowing both very high and low voltage circuits to be fabricated on the same chip Feb. 1, 2011
7868413 Semiconductor device Jan. 11, 2011
7858467 Method of manufacturing semiconductor device Dec. 28, 2010
7846789 Isolation trench with rounded corners for BiCMOS process Dec. 7, 2010
7842577 Two-step STI formation process Nov. 30, 2010
7838355 Differential nitride pullback to create differential NFET to PFET divots for improved performance versus leakage Nov. 23, 2010
7824999 Method for enhancing field oxide Nov. 2, 2010
7772027 Barrier regions for image sensors Aug. 10, 2010
7767515 Managing integrated circuit stress using stress adjustment trenches Aug. 3, 2010
7763515 Transistor with embedded silicon/germanium material on a strained semiconductor on insulator substrate Jul. 27, 2010
7759204 Process for high voltage superjunction termination Jul. 20, 2010
7749833 Semiconductor MOS transistor device and method for making the same Jul. 6, 2010
7723817 Semiconductor device and manufacturing method thereof May. 25, 2010
7719090 Semiconductor device with strain May. 18, 2010
7709300 Structure and method for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks May. 4, 2010
7652344 Semiconductor device Jan. 26, 2010
7622341 Sige channel epitaxial development for high-k PFET manufacturability Nov. 24, 2009
7598551 High voltage device Oct. 6, 2009
7592676 Semiconductor device with a transistor having different source and drain lengths Sep. 22, 2009
7592684 Semiconductor device and method for manufacturing the same Sep. 22, 2009
7547605 Microelectronic device and a method for its manufacture Jun. 16, 2009
7544548 Trench liner for DSO integration Jun. 9, 2009
7531392 Multi-orientation semiconductor-on-insulator (SOI) substrate, and method of fabricating same May. 12, 2009
7521741 Shielding structures for preventing leakages in high voltage MOS devices Apr. 21, 2009
7521763 Dual stress STI Apr. 21, 2009
7514318 Method for fabricating non-volatile memory cells Apr. 7, 2009
7514339 Method for fabricating shallow trench isolation structures using diblock copolymer patterning Apr. 7, 2009
7514312 Method of manufacturing semiconductor device Apr. 7, 2009
7485523 Method for forming high voltage device and semiconductor device Feb. 3, 2009

1 2 3 4 5 6 7 8

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