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Class Information
Number: 257/E21.553
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Processes or apparatus adapted for manufacture or treatment of semiconductor or solid-state devices or of parts thereof (epo) > Manufacture or treatment of devices consisting of plurality of solid-state components formed in or on common substrate or of parts thereof; manufacture of integrated circuit devices or of parts thereof (epo) > Manufacture of specific parts of devices (epo) > Making of isolation regions between components (epo) > Dielectric regions, e.g., epic dielectric isolation, locos; trench refilling techniques, soi technology, use of channel stoppers (epo) > Using local oxidation of silicon, e.g., locos, swami, silo (epo) > In region recessed from surface, e.g., in recess, groove, tub or trench region (epo)
Description: This subclass is indented under subclass E21.552. This subclass is substantially the same in scope as ECLA classification H01L21/762B2.


Sub-classes under this class:

Class Number Class Name Patents
257/E21.555 Recessed region having shape other than rectangular, e.g., rounded or oblique shape (epo) 86
257/E21.554 Using auxiliary pillars in recessed region, e.g., to form locos over extended areas (epo) 41


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
7384846 Method of fabricating semiconductor device Jun. 10, 2008
7371693 Manufacturing method of semiconductor device with chamfering May. 13, 2008
7365413 Reduced power distribution mesh resistance using a modified swiss-cheese slotting pattern Apr. 29, 2008
7361572 STI liner modification method Apr. 22, 2008
7314792 Method for fabricating transistor of semiconductor device Jan. 1, 2008
7279396 Methods of forming trench isolation regions with nitride liner Oct. 9, 2007
7220640 Method of fabricating recess transistor in integrated circuit device and recess transistor in integrated circuit device fabricated by the same May. 22, 2007
7199450 Materials and method to seal vias in silicon substrates Apr. 3, 2007
7157781 Enhancement of membrane characteristics in semiconductor device with membrane Jan. 2, 2007
7060630 Method of forming isolation film of semiconductor device Jun. 13, 2006
7061128 Semiconductor device and manufacturing method of the same Jun. 13, 2006
7049206 Device isolation for semiconductor devices May. 23, 2006
7049239 STI structure and fabricating methods thereof May. 23, 2006
6979628 Methods of forming semiconductor devices having field oxides in trenches and devices formed thereby Dec. 27, 2005
6949387 Method of designing a semiconductor device Sep. 27, 2005
6849519 Method of forming an isolation layer in a semiconductor devices Feb. 1, 2005
6817903 Process for reducing leakage in an integrated circuit with shallow trench isolated active areas Nov. 16, 2004
6800917 Bladed silicon-on-insulator semiconductor devices and method of making Oct. 5, 2004
6723618 Methods of forming field isolation structures Apr. 20, 2004
6620704 Method of fabricating low stress semiconductor devices with thermal oxide isolation Sep. 16, 2003
6610580 Flash memory array and a method and system of fabrication thereof Aug. 26, 2003
6610581 Method of forming isolation film in semiconductor device Aug. 26, 2003
6599798 Method of preparing buried LOCOS collar in trench DRAMS Jul. 29, 2003
6580088 Semiconductor devices and methods for manufacturing the same Jun. 17, 2003
6559032 Method of fabricating an isolation structure on a semiconductor substrate May. 6, 2003
6489205 Semiconductor device and method for manufacturing the same Dec. 3, 2002
6479370 Isolated structure and method of fabricating such a structure on a substrate Nov. 12, 2002
6465865 Isolated structure and method of fabricating such a structure on a substrate Oct. 15, 2002
6376331 Method for manufacturing a semiconductor device Apr. 23, 2002
6340624 Method of forming a circuitry isolation region within a semiconductive wafer Jan. 22, 2002
6326672 LOCOS fabrication processes and semiconductive material structures Dec. 4, 2001
6306726 Method of forming field oxide Oct. 23, 2001
6274455 Method for isolating semiconductor device Aug. 14, 2001
6258694 Fabrication method of a device isolation structure Jul. 10, 2001
6255218 Semiconductor device and fabrication method thereof Jul. 3, 2001
6251750 Method for manufacturing shallow trench isolation Jun. 26, 2001
6245643 Method of removing polysilicon residual in a LOCOS isolation process using an etching selectivity solution Jun. 12, 2001
6239003 Method of simultaneous fabrication of isolation and gate regions in a semiconductor device May. 29, 2001
6239002 Thermal oxidizing method for forming with attenuated surface sensitivity ozone-teos silicon oxide dielectric layer upon a thermally oxidized silicon substrate layer May. 29, 2001
6225674 Semiconductor structure and method of manufacture May. 1, 2001
6225186 Method for fabricating LOCOS isolation May. 1, 2001
6207539 Semiconductor device having field isolating film of which upper surface is flat and method thereof Mar. 27, 2001
6184106 Method for manufacturing a semiconductor device Feb. 6, 2001
6175147 Device isolation for semiconductor devices Jan. 16, 2001
6153482 Method for fabricating LOCOS isolation having a planar surface which includes having the polish stop layer at a lower level than the LOCOS formation Nov. 28, 2000
6144047 Semiconductor device having impurity concentrations for preventing a parasitic channel Nov. 7, 2000
6133118 Edge polysilicon buffer LOCOS isolation Oct. 17, 2000
6118167 Polysilicon coated nitride-lined shallow trench Sep. 12, 2000
6103595 Assisted local oxidation of silicon Aug. 15, 2000
6100162 Method of forming a circuitry isolation region within a semiconductive wafer Aug. 8, 2000

1 2 3 4


 
 
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