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Browse by Category: Main > Physics
Class Information
Number: 257/E21.531
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Processes or apparatus adapted for manufacture or treatment of semiconductor or solid-state devices or of parts thereof (epo) > Testing or measuring during manufacture or treatment or reliability measurement, i.e., testing of parts followed by no processing which modifies parts as such (epo) > Measuring as part of manufacturing process (epo) > For electrical parameters, e.g., resistance, deep-levels, cv, diffusions by electrical means (epo)
Description: This subclass is indented under subclass E21.529. This subclass is substantially the same in scope as ECLA classification H01L21/66M4.










Patents under this class:
1 2 3 4 5 6

Patent Number Title Of Patent Date Issued
8709834 Methods of fabricating semiconductor device Apr. 29, 2014
8692246 Leakage measurement structure having through silicon vias Apr. 8, 2014
8691601 Semiconductor device and penetrating electrode testing method Apr. 8, 2014
8691597 Method for manufacturing a semiconductor device including application of a plating voltage Apr. 8, 2014
8674355 Integrated circuit test units with integrated physical and electrical test regions Mar. 18, 2014
8664014 High productivity combinatorial workflow for photoresist strip applications Mar. 4, 2014
8658436 Method for separating and transferring IC chips Feb. 25, 2014
8633037 Semiconductor device Jan. 21, 2014
8623673 Structure and method for detecting defects in BEOL processing Jan. 7, 2014
8598579 Test structure for ILD void testing and contact resistance measurement in a semiconductor device Dec. 3, 2013
8586981 Silicon-on-insulator ("SOI") transistor test structure for measuring body-effect Nov. 19, 2013
8536650 Strained ultra-thin SOI transistor formed by replacement gate Sep. 17, 2013
8492176 Method of manufacturing semiconductor device Jul. 23, 2013
8481346 Method of analyzing iron concentration of boron-doped P-type silicon wafer and method of manufacturing silicon wafer Jul. 9, 2013
8470613 Flexible packaging for chip-on-chip and package-on-package technologies Jun. 25, 2013
8460971 Semiconductor device packaging structure and packaging method Jun. 11, 2013
8399339 Nanosensors Mar. 19, 2013
8399266 Test structure for detection of gap in conductive layer of multilayer gate stack Mar. 19, 2013
8375558 Semiconductor apparatus and repairing method thereof Feb. 19, 2013
8378346 Circuit architecture for the parallel supplying during electric or electromagnetic testing of a plurality of electronic devices integrated on a semiconductor wafer Feb. 19, 2013
8362620 Electronic devices with extended metallization layer on a passivation layer Jan. 29, 2013
8350393 Apparatus and method for predetermined component placement to a target platform Jan. 8, 2013
8350382 Semiconductor device including electronic component coupled to a backside of a chip Jan. 8, 2013
8343781 Electrical mask inspection Jan. 1, 2013
8338193 Semiconductor device Dec. 25, 2012
8338192 High precision semiconductor chip and a method to construct the semiconductor chip Dec. 25, 2012
8329573 Wafer level integration module having controlled resistivity interconnects Dec. 11, 2012
8309951 Test structure for determining gate-to-body tunneling current in a floating body FET Nov. 13, 2012
8294149 Test structure and methodology for three-dimensional semiconductor structures Oct. 23, 2012
8241927 Methods relating to capacitive monitoring of layer characteristics during back end-of the-line processing Aug. 14, 2012
8232115 Test structure for determination of TSV depth Jul. 31, 2012
8206997 Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Jun. 26, 2012
8202740 Method of manufacturing a semiconductor device and a testing method of the same Jun. 19, 2012
8178397 Field effect transistor May. 15, 2012
8178368 Test chiplets for devices May. 15, 2012
8168472 Semiconductor device having a semiconductor chip, and method for the production thereof May. 1, 2012
8159076 Method of producing a via in a reconstituted substrate Apr. 17, 2012
8148798 Semiconductor device and method for manufacturing the same Apr. 3, 2012
8106395 Semiconductor device and method of manufacturing the same Jan. 31, 2012
8093074 Analysis method for semiconductor device Jan. 10, 2012
8062911 Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Nov. 22, 2011
8048690 Pressure-sensitive adhesive sheet and process for producing semiconductor device having same Nov. 1, 2011
8026120 Method of manufacturing MEMS device Sep. 27, 2011
8013332 Portable memory devices Sep. 6, 2011
7993942 Method of detecting heavy metal in semiconductor substrate Aug. 9, 2011
7977125 Display apparatus and method of manufacturing the same Jul. 12, 2011
7972874 Semiconductor process evaluation methods including variable ion implanting conditions Jul. 5, 2011
7955943 High voltage sensor device and method therefor Jun. 7, 2011
7943529 Passivation structure and fabricating method thereof May. 17, 2011
7943402 Ion implantation process characterization method May. 17, 2011

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