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Class Information
Number: 257/E21.521
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Processes or apparatus adapted for manufacture or treatment of semiconductor or solid-state devices or of parts thereof (epo) > Testing or measuring during manufacture or treatment or reliability measurement, i.e., testing of parts followed by no processing which modifies parts as such (epo)
Description: This subclass is indented under subclass E21.001. This subclass is substantially the same in scope as ECLA classification H01L21/66.

Sub-classes under this class:

Class Number Class Name Patents
257/E21.529 Measuring as part of manufacturing process (epo) 143
257/E21.525 Procedures, i.e., sequence of activities consisting of plurality of measurement and correction, marking or sorting steps (epo) 1,089
257/E21.522 Structural arrangement (epo) 81

Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8710859 Method for testing multi-chip stacked packages Apr. 29, 2014
8680524 Method of arranging pads in semiconductor device, semiconductor memory device using the method, and processing system having mounted therein the semiconductor memory device Mar. 25, 2014
8674357 Method for measuring impurity concentration profile, wafer used for same, and method for manufacturing semiconductor device using same Mar. 18, 2014
8674355 Integrated circuit test units with integrated physical and electrical test regions Mar. 18, 2014
8673668 Test structure for controlling the incorporation of semiconductor alloys in transistors comprising high-k metal gate electrode structures Mar. 18, 2014
8673655 Semiconductor package repair process Mar. 18, 2014
8669555 Semiconductor device Mar. 11, 2014
8664671 Display device and fabrication method for display device Mar. 4, 2014
8659132 Microelectronic package assembly, method for disconnecting a microelectronic package Feb. 25, 2014
8648339 Semiconductor device including first semiconductor chip including first pads connected to first terminals, and second semiconductor chip including second pads connected to second terminals Feb. 11, 2014
8637353 Through silicon via repair Jan. 28, 2014
8609479 Gated-varactors Dec. 17, 2013
8598579 Test structure for ILD void testing and contact resistance measurement in a semiconductor device Dec. 3, 2013
8580584 System and method for increasing productivity of organic light emitting diode material screening Nov. 12, 2013
8574931 Singulation and strip testing of no-lead integrated circuit packages without tape frame Nov. 5, 2013
8563435 Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate Oct. 22, 2013
8563993 Display device and fabrication method for display device Oct. 22, 2013
8546952 Electrical test structure applying 3D-ICS bonding technology for stacking error measurement Oct. 1, 2013
8541782 Method for evaluating oxide semiconductor and method for manufacturing semiconductor device Sep. 24, 2013
8535968 High speed aligning of photovoltaic cells Sep. 17, 2013
8536670 Semiconductor device, manufacturing method therefor, and electronic apparatus Sep. 17, 2013
8505481 Apparatus for growth of dilute-nitride materials using an isotope for enhancing the sensitivity of resonant nuclear reaction analysis Aug. 13, 2013
8507908 Probe and probe card Aug. 13, 2013
8508005 STRAM with compensation element and method of making the same Aug. 13, 2013
8507297 Packaging and testing of multiple MEMS devices on a wafer Aug. 13, 2013
8487294 Nanostructure quick-switch memristor and method of manufacturing the same Jul. 16, 2013
8481345 Method to determine the position-dependant metal correction factor for dose-rate equivalent laser testing of semiconductor devices Jul. 9, 2013
8476659 Light emitting device Jul. 2, 2013
8460947 Fluid ejection device and method Jun. 11, 2013
8450125 Methods of evaluating epitaxial growth and methods of forming an epitaxial layer May. 28, 2013
8445295 Semiconductor device and method for manufacturing the same May. 21, 2013
8445296 Apparatus and methods for end point determination in reactive ion etching May. 21, 2013
8436454 Reprogrammable circuit board with alignment-insensitive support for multiple component contact types May. 7, 2013
8423942 Fill patterning for symmetrical circuits Apr. 16, 2013
8420498 Alignment method of chips Apr. 16, 2013
8409967 Method for manufacturing semiconductor chips from a semiconductor wafer Apr. 2, 2013
8399891 Active device array substrate and method for fabricating the same Mar. 19, 2013
8394719 System and method for implementing multi-resolution advanced process control Mar. 12, 2013
8375558 Semiconductor apparatus and repairing method thereof Feb. 19, 2013
8378498 Chip assembly with a coreless substrate employing a patterned adhesive layer Feb. 19, 2013
RE43980 Laser decapsulation method Feb. 5, 2013
8362480 Reusable test chip for inline probing of three dimensionally arranged experiments Jan. 29, 2013
8357549 Method for identifying an incorrect position of a semiconductor wafer during a thermal treatment Jan. 22, 2013
8357935 Electronic component having an authentication pattern Jan. 22, 2013
8350263 Semiconductor package, method of evaluating same, and method of manufacturing same Jan. 8, 2013
8350393 Apparatus and method for predetermined component placement to a target platform Jan. 8, 2013
8343386 Electrostatic dissipative adhesive Jan. 1, 2013
8338192 High precision semiconductor chip and a method to construct the semiconductor chip Dec. 25, 2012
8338829 Semiconductor device Dec. 25, 2012

1 2 3 4 5 6 7

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