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Class Information
Number: 257/E21.002
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Processes or apparatus adapted for manufacture or treatment of semiconductor or solid-state devices or of parts thereof (epo) > Manufacture or treatment of semiconductor device (epo)
Description: This subclass is indented under subclass E21.001. This subclass is substantially the same in scope as ECLA classification H01L21/02.


Sub-classes under this class:

Class Number Class Name Patents
257/E21.003 Manufacture of two-terminal component for integrated circuit (epo) 5
257/E21.023 Making mask on semicond uctor body for further photolithographic processing (epo) 48
257/E21.04 Device having at least one potential-jump barrier or surface barrier, e.g., pn junction, depletion layer, carrier concentration layer (epo) 14
257/E21.52 Devices having no potential-jump barrier or surface barrier (epo) 5


Patents under this class:
1 2

Patent Number Title Of Patent Date Issued
7459394 Methods of manufacturing semiconductor devices Dec. 2, 2008
7456084 Method of using a setter having a recess in manufacturing a net-shape semiconductor wafer Nov. 25, 2008
7456926 Liquid crystal display device Nov. 25, 2008
7452751 Semiconductor device and method of manufacturing the same Nov. 18, 2008
7446028 Multi-component integrated circuit contacts Nov. 4, 2008
7442636 Method of inhibiting copper corrosion during supercritical CO.sub.2 cleaning Oct. 28, 2008
7419917 Ion implanted microscale and nanoscale device method Sep. 2, 2008
7416967 Semiconductor device, and method for manufacturing the same Aug. 26, 2008
7416969 Void free solder arrangement for screen printing semiconductor wafers Aug. 26, 2008
7411260 Semiconductor device and manufacturing method thereof Aug. 12, 2008
7410903 Methods of patterning substrates Aug. 12, 2008
7407819 Polymer memory having a ferroelectric polymer memory material with cell sizes that are asymmetric Aug. 5, 2008
7407889 Method of manufacturing article having uneven surface Aug. 5, 2008
7393756 Method for fabricating a trench isolation structure having a high aspect ratio Jul. 1, 2008
7364942 Process for wafer level treatment to reduce stiction and passivate micromachined surfaces and compounds used therefor Apr. 29, 2008
7364953 Manufacturing method to construct semiconductor-on-insulator with conductor layer sandwiched between buried dielectric layer and semiconductor layers Apr. 29, 2008
7344907 Apparatus and methods for encapsulating microelectromechanical (MEM) devices on a wafer scale Mar. 18, 2008
7332388 Method to simultaneously form both fully silicided and partially silicided dual work function transistor gates during the manufacture of a semiconductor device, semiconductor devices, and syst Feb. 19, 2008
7329615 Atomic layer deposition method of forming an oxide comprising layer on a substrate Feb. 12, 2008
7314836 Enhanced nitride layers for metal oxide semiconductors Jan. 1, 2008
7314837 Chemical treatment of semiconductor substrates Jan. 1, 2008
7288468 Luminescent efficiency of semiconductor nanocrystals by surface treatment Oct. 30, 2007
7282436 Plasma treatment for silicon-based dielectrics Oct. 16, 2007
7271096 Method for improved deposition of dielectric material Sep. 18, 2007
7271101 High density plasma chemical vapor deposition process Sep. 18, 2007
7226863 Methods for removal of organic materials Jun. 5, 2007
7217647 Structure and method of making a semiconductor integrated circuit tolerant of mis-alignment of a metal contact pattern May. 15, 2007
7189591 Process for producing light-emitting semiconductor device Mar. 13, 2007
7186570 Method of manufacturing ceramic film, method of manufacturing ferroelectric capacitor, ceramic film, ferroelectric capacitor, and semiconductor device Mar. 6, 2007
7186655 Method for manufacturing semiconductor device Mar. 6, 2007
7183146 Method of manufacturing semiconductor device Feb. 27, 2007
7183198 Method for forming a hardmask employing multiple independently formed layers of a capping material to reduce pinholes Feb. 27, 2007
7179747 Use of supercritical fluid for low effective dielectric constant metallization Feb. 20, 2007
7172948 Method to avoid a laser marked area step height Feb. 6, 2007
7166545 Production method for semiconductor device Jan. 23, 2007
7163884 Semiconductor device and fabrication method thereof Jan. 16, 2007
7163902 Infra-red light-emitting device and method for preparing the same Jan. 16, 2007
7157351 Ozone vapor clean method Jan. 2, 2007
7151049 Electroplating compositions and methods Dec. 19, 2006
7144799 Method for pre-retaining CB opening Dec. 5, 2006
7141852 Semiconductor device and fabricating method thereof Nov. 28, 2006
7125324 Insulated pad conditioner and method of using same Oct. 24, 2006
7122414 Method to fabricate dual metal CMOS devices Oct. 17, 2006
7119034 Atomic layer deposition method of forming an oxide comprising layer on a substrate Oct. 10, 2006
7119012 Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation Oct. 10, 2006
7119007 Production method of semiconductor device Oct. 10, 2006
7119014 Method for fabricating a semiconductor device having a tapered-mesa side-wall film Oct. 10, 2006
7113881 Method and apparatus for semi-automatic extraction and monitoring of diode ideality in a manufacturing environment Sep. 26, 2006
7112545 Passivation of material using ultra-fast pulsed laser Sep. 26, 2006
7105363 Cladded conductor for use in a magnetoelectronics device and method for fabricating the same Sep. 12, 2006

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