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Class Information
Number: 257/913
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > With means to absorb or localize unwanted impurities or defects from semiconductors (e.g., heavy metal gettering)
Description: Subject matter including a semiconductor device having means to absorb or localize semiconductor impurities or defects which would adversely affect the performance of the device, e.g., phosphosilicate glass coating to absorb deep level impurities.

Patents under this class:
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Patent Number Title Of Patent Date Issued
8541305 3D integrated circuit and method of manufacturing the same Sep. 24, 2013
8507917 Thin film transistor, method for manufacturing the same, and display device using the same Aug. 13, 2013
8466043 Process of internal gettering for Czochralski silicon wafer Jun. 18, 2013
8329563 Semiconductor device including a gettering layer and manufacturing method therefor Dec. 11, 2012
8309436 Method of producing epitaxial substrate with gettering for solid-state imaging device, and method of producing solid-state imaging device using same substrate Nov. 13, 2012
8294185 Solid-state imaging device Oct. 23, 2012
8227299 Removal of impurities from semiconductor device layers Jul. 24, 2012
7972942 Method of reducing metal impurities of upgraded metallurgical grade silicon wafer by using epitaxial silicon film Jul. 5, 2011
7821005 Method of manufacturing semiconductor device and semiconductor device Oct. 26, 2010
7763962 Wafer-level packaging of micro devices Jul. 27, 2010
7755085 Semiconductor device and method for fabricating same Jul. 13, 2010
7564082 Gettering using voids formed by surface transformation Jul. 21, 2009
7459735 Solid-state image device Dec. 2, 2008
7397063 Semiconductor device Jul. 8, 2008
7342290 Semiconductor metal contamination reduction for ultra-thin gate dielectrics Mar. 11, 2008
7242037 Process for making non-uniform minority carrier lifetime distribution in high performance silicon power devices Jul. 10, 2007
7141822 Semiconductor device and method for manufacturing the same Nov. 28, 2006
7126194 Method for removing impurities of a semiconductor wafer, semiconductor wafer assembly, and semiconductor device Oct. 24, 2006
7045418 Semiconductor device including a dielectric layer having a gettering material located therein and a method of manufacture therefor May. 16, 2006
6998648 Protected organic electronic device structures incorporating pressure sensitive adhesive and desiccant Feb. 14, 2006
6967391 Electronic control device Nov. 22, 2005
6946711 Semiconductor device Sep. 20, 2005
6828690 Non-uniform minority carrier lifetime distributions in high performance silicon power devices Dec. 7, 2004
6709955 Method of fabricating electronic devices integrated in semiconductor substrates provided with gettering sites, and a device fabricated by the method Mar. 23, 2004
6635950 Semiconductor device having buried boron and carbon regions, and method of manufacture thereof Oct. 21, 2003
6465873 Semiconductor gettering structures Oct. 15, 2002
6452271 Interconnect component for a semiconductor die including a ruthenium layer and a method for its fabrication Sep. 17, 2002
6452219 Insulated gate bipolar transistor and method of fabricating the same Sep. 17, 2002
6313507 SOI semiconductor device capable of preventing floating body effect Nov. 6, 2001
6300680 Semiconductor substrate and manufacturing method thereof Oct. 9, 2001
6284384 Epitaxial silicon wafer with intrinsic gettering Sep. 4, 2001
6271541 Semiconductor device with high gettering capability to impurity present in semiconductor layer of SOI substrate Aug. 7, 2001
6255719 Semiconductor device including thermal neutron absorption material Jul. 3, 2001
6252294 Semiconductor device and semiconductor storage device Jun. 26, 2001
6236104 Silicon on insulator structure from low defect density single crystal silicon May. 22, 2001
6232205 Method for producing a semiconductor device May. 15, 2001
6229196 Semiconductor device and fabrication method thereof May. 8, 2001
6222252 Semiconductor substrate and method for producing the same Apr. 24, 2001
6198157 Semiconductor device having buried boron and carbon regions Mar. 6, 2001
6180220 Ideal Oxygen precipitating silicon wafers and oxygen out-diffusion-less process therefor Jan. 30, 2001
6120749 Silicon single crystal with no crystal defect in peripheral part of wafer and process for producing the same Sep. 19, 2000
6066893 Contaminant resistant barriers to prevent outgassing May. 23, 2000
5994761 Ideal oxygen precipitating silicon wafers and oxygen out-diffusion-less process therefor Nov. 30, 1999
5993493 Method of manufacturing mirror-polished silicon wafers, and apparatus for processing silicon wafers Nov. 30, 1999
5973370 Preventing boron penetration through thin gate oxide of P-channel devices in advanced CMOS technology Oct. 26, 1999
5973386 Semiconductor substrate having silicon oxide layers formed between polysilicon layers Oct. 26, 1999
5949115 Semiconductor device including nickel formed on a crystalline silicon substrate Sep. 7, 1999
5939770 Semiconductor device and its manufacturing method Aug. 17, 1999
5929507 Gettering regions and methods of forming gettering regions within a semiconductor wafer Jul. 27, 1999
5883403 Power semiconductor device Mar. 16, 1999

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