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Browse by Category: Main > Physics
Class Information
Number: 257/617
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Including region containing crystal damage
Description: Subject matter wherein the device includes a region which has crystal damage.


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
7459767 Semiconductor device including semiconductor memory element and method for producing same Dec. 2, 2008
7436046 Semiconductor device and manufacturing method of the same Oct. 14, 2008
7391058 Semiconductor devices and methods of making same Jun. 24, 2008
7368763 Semiconductor device and manufacturing method thereof May. 6, 2008
7361970 Method for production of a buried stop zone in a semiconductor component and semiconductor component comprising a buried stop zone Apr. 22, 2008
7332750 Power semiconductor device with improved unclamped inductive switching capability and process for forming same Feb. 19, 2008
7294906 Wiring technique Nov. 13, 2007
7279751 Semiconductor laser device and manufacturing method thereof Oct. 9, 2007
7262485 Substrate for growing electro-optical single crystal thin film and method of manufacturing the same Aug. 28, 2007
7245330 Electrooptic device, liquid crystal device, and projection display device with line defects Jul. 17, 2007
7242075 Silicon wafers and method of fabricating the same Jul. 10, 2007
7235863 Silicon wafer and process for producing it Jun. 26, 2007
7199448 Integrated circuit configuration comprising a sheet-like substrate Apr. 3, 2007
7187057 Nitrogen controlled growth of dislocation loop in stress enhanced transistor Mar. 6, 2007
7164187 Semiconductor and semiconductor substrate, method of manufacturing the same, and semiconductor device Jan. 16, 2007
7129521 Semiconductor device and manufacture method thereof Oct. 31, 2006
7098504 Nonvolatile semiconductor storage device and production method therefor Aug. 29, 2006
7071079 Epitaxial wafer and a method for producing it Jul. 4, 2006
7038300 Apparatus with improved layers of group III-nitride semiconductor May. 2, 2006
7015517 Semiconductor device incorporating a defect controlled strained channel structure and method of making the same Mar. 21, 2006
6831350 Semiconductor structure with different lattice constant materials and method for forming the same Dec. 14, 2004
6818967 Fabricating method of low temperature poly-silicon film and low temperature poly-silicon thin film transistor Nov. 16, 2004
6815792 Epitaxially grown compound semiconductor film and compound semiconductor multi-layer structure Nov. 9, 2004
6803331 Process for the heat treatment of a silicon wafer, and silicon wafer produced Oct. 12, 2004
6774407 Semiconductor device with a suppressed increase in turned-on resistance and an improved turn-off response Aug. 10, 2004
6730964 Semiconductor device and method of producing the same May. 4, 2004
6727147 MOSFET fabrication method Apr. 27, 2004
6713819 SOI MOSFET having amorphized source drain and method of fabrication Mar. 30, 2004
6707106 Semiconductor device with tensile strain silicon introduced by compressive material in a buried oxide layer Mar. 16, 2004
6667523 Highly linear integrated resistive contact Dec. 23, 2003
6657299 Semiconductor with a stress reduction layer and manufacturing method therefor Dec. 2, 2003
6639279 Semiconductor transistor having interface layer between semiconductor and insulating layers Oct. 28, 2003
6621101 Thin-film transistor Sep. 16, 2003
6603189 Semiconductor device with deliberately damaged layer having a shorter carrier lifetime therein Aug. 5, 2003
6555882 Semiconductor element and semiconductor memory device using the same Apr. 29, 2003
6544862 Particle distribution method and resulting structure for a layer transfer process Apr. 8, 2003
6538285 Silicon wafer Mar. 25, 2003
6528851 Post-silicidation implant for introducing recombination center in body of SOI MOSFET Mar. 4, 2003
6518603 Selective electrochemical process for creating semiconductor nano- and micro-patterns Feb. 11, 2003
6465871 Semiconductor switching device and method of controlling a carrier lifetime in a semiconductor switching device Oct. 15, 2002
6420775 Compound semiconductor device having an ion implanted defect-rich layer for improved backgate effect suppression Jul. 16, 2002
6361619 Thermally annealed wafers having improved internal gettering Mar. 26, 2002
6359290 Self-aligned bump bond infrared focal plane array architecture Mar. 19, 2002
6346460 Low cost silicon substrate with impurity gettering and latch up protection and method of manufacture Feb. 12, 2002
6342725 Silicon on insulator structure having a low defect density handler wafer and process for the preparation thereof Jan. 29, 2002
6326667 Semiconductor devices and methods for producing semiconductor devices Dec. 4, 2001
6291852 Semiconductor element and semiconductor memory device using the same Sep. 18, 2001
6261874 Fast recovery diode and method for its manufacture Jul. 17, 2001
6252259 Semiconductor switching device having different carrier lifetimes between a first portion serving as a main current path and the remaining portion of the device Jun. 26, 2001
6229196 Semiconductor device and fabrication method thereof May. 8, 2001

1 2 3 4


 
 
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