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Class Information
Number: 257/591
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Bipolar transistor structure > With emitter region having specified doping concentration profile (e.g., high-low concentration step)
Description: Subject matter wherein the device has an emitter region with a specified impurity dopant concentration profile (e.g., a specified concentration gradient across the emitter region).


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
4136353 Bipolar transistor with high-low emitter impurity concentration Jan. 23, 1979
4130826 Monolithic integrated semiconductor circuit Dec. 19, 1978
4118250 Process for producing integrated circuit devices by ion implantation Oct. 3, 1978
4118251 Process for the production of a locally high, inverse, current amplification in a planar transistor Oct. 3, 1978
4080619 Bipolar type semiconductor device Mar. 21, 1978
4058825 Complementary transistor structure having two epitaxial layers and method of manufacturing same Nov. 15, 1977
4040081 Alternating current control circuits Aug. 2, 1977
4038680 Semiconductor integrated circuit device Jul. 26, 1977
4035824 Semiconductor device stabilized by an insulating layer formed on a semiconductor region having a low impurity concentration Jul. 12, 1977
4032956 Transistor circuit Jun. 28, 1977
4032957 Semiconductor device Jun. 28, 1977
4027324 Bidirectional transistor May. 31, 1977
4007474 Transistor having an emitter with a low impurity concentration portion and a high impurity concentration portion Feb. 8, 1977
4000506 Bipolar transistor circuit Dec. 28, 1976

1 2 3


 
 
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