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Class Information
Number: 257/513
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Integrated circuit structure with electrically isolated components > Including dielectric isolation means > Combined with pn junction isolation (e.g., isoplanar, locos) > Dielectric in groove > Vertical walled groove
Description: Subject matter wherein the dielectric isolation is located in grooves in the surface of the overall device which extend perpendicular to the surface of the overall device.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7425751 |
Method to reduce junction leakage current in strained silicon on silicon-germanium devices |
Sep. 16, 2008 |
| 7420262 |
Electronic component and semiconductor wafer, and method for producing the same |
Sep. 2, 2008 |
| 7382015 |
Semiconductor device including an element isolation portion having a recess |
Jun. 3, 2008 |
| 7358587 |
Semiconductor structures |
Apr. 15, 2008 |
| 7345352 |
Insulating tube, semiconductor device employing the tube, and method of manufacturing the same |
Mar. 18, 2008 |
| 7332407 |
Method and apparatus for a semiconductor device with a high-k gate dielectric |
Feb. 19, 2008 |
| 7332790 |
Semiconductor device having an active area partially isolated by a lateral cavity |
Feb. 19, 2008 |
| 7329938 |
Semiconductor integrated circuit |
Feb. 12, 2008 |
| 7326983 |
Selective silicon-on-insulator isolation structure and method |
Feb. 5, 2008 |
| 7288462 |
Buffer zone for the prevention of metal migration |
Oct. 30, 2007 |
| 7279769 |
Semiconductor device and manufacturing method thereof |
Oct. 9, 2007 |
| 7279770 |
Isolation techniques for reducing dark current in CMOS image sensors |
Oct. 9, 2007 |
| 7274073 |
Integrated circuit with bulk and SOI devices connected with an epitaxial region |
Sep. 25, 2007 |
| 7268402 |
Memory cell with trench-isolated transistor including first and second isolation trenches |
Sep. 11, 2007 |
| 7262477 |
Semiconductor device |
Aug. 28, 2007 |
| 7239003 |
Isolation techniques for reducing dark current in CMOS image sensors |
Jul. 3, 2007 |
| 7235856 |
Trench isolation for semiconductor devices |
Jun. 26, 2007 |
| 7221030 |
Semiconductor device |
May. 22, 2007 |
| 7205617 |
Semiconductor device including active regions and gate electrodes for field effect transistors, with a trench formed between the active regions |
Apr. 17, 2007 |
| 7196394 |
Method and apparatus for a deposited fill layer |
Mar. 27, 2007 |
| 7176549 |
Shallow trench isolation using low dielectric constant insulator |
Feb. 13, 2007 |
| 7170109 |
Heterojunction semiconductor device with element isolation structure |
Jan. 30, 2007 |
| 7138319 |
Deep trench isolation of embedded DRAM for improved latch-up immunity |
Nov. 21, 2006 |
| 7135753 |
Structure and method for III-nitride monolithic power IC |
Nov. 14, 2006 |
| 7105454 |
Use of ammonia for etching organic low-k dielectrics |
Sep. 12, 2006 |
| 7098515 |
Semiconductor chip with borderless contact that avoids well leakage |
Aug. 29, 2006 |
| 7081397 |
Trench sidewall passivation for lateral RIE in a selective silicon-on-insulator process flow |
Jul. 25, 2006 |
| 7071529 |
Semiconductor device having a Damascene gate or a replacing gate |
Jul. 4, 2006 |
| 7053451 |
Semiconductor device having impurity region under isolation region |
May. 30, 2006 |
| 7045875 |
Semiconductor device with self-aligned junction contact hole and method of fabricating the same |
May. 16, 2006 |
| 7033867 |
Shallow trench antifuse and methods of making and using same |
Apr. 25, 2006 |
| 7030445 |
Power MOSFET, power MOSFET packaged device, and method of manufacturing power MOSFET |
Apr. 18, 2006 |
| 7022583 |
Method of forming a shallow trench isolation device to prevent kick effect |
Apr. 4, 2006 |
| 7019380 |
Semiconductor device |
Mar. 28, 2006 |
| 7009239 |
Vertical semiconductor device and manufacturing method thereof |
Mar. 7, 2006 |
| 6960818 |
Recessed shallow trench isolation structure nitride liner and method for making same |
Nov. 1, 2005 |
| 6958518 |
Semiconductor device having at least one source/drain region formed on an isolation region and a method of manufacture therefor |
Oct. 25, 2005 |
| 6940145 |
Termination structure for a semiconductor device |
Sep. 6, 2005 |
| 6933206 |
Trench isolation employing a high aspect ratio trench |
Aug. 23, 2005 |
| 6924542 |
Trench isolation without grooving |
Aug. 2, 2005 |
| 6924543 |
Method for making a semiconductor device having increased carrier mobility |
Aug. 2, 2005 |
| 6919611 |
Semiconductor memory reducing current consumption and narrow channel effect and method of manufacturing the same |
Jul. 19, 2005 |
| 6917092 |
Wiring structure having a slit dummy |
Jul. 12, 2005 |
| 6914316 |
Semiconductor trench isolation structure |
Jul. 5, 2005 |
| 6906419 |
Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same |
Jun. 14, 2005 |
| 6888214 |
Isolation techniques for reducing dark current in CMOS image sensors |
May. 3, 2005 |
| 6888213 |
Dielectric insulation structure for integrating electronic semiconductor devices and relevant manufacturing process |
May. 3, 2005 |
| 6885080 |
Deep trench isolation of embedded DRAM for improved latch-up immunity |
Apr. 26, 2005 |
| 6882025 |
Strained-channel transistor and methods of manufacture |
Apr. 19, 2005 |
| 6876055 |
Semiconductor device and its production method |
Apr. 5, 2005 |
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