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Class Information
Number: 257/494
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > With means to increase breakdown voltage threshold > Reverse-biased pn junction guard region
Description: Subject matter wherein the means for increasing breakdown voltage in the device includes a reverse biased pn junction guard region, that is, a region located in the material forming one side of an active pn or other rectifying semiconductor junction, which region forms a pn junction with the material of the one side of the active junction, the guard region being adapted to be reverse biased with respect to the material forming one side of the active junction, and being spaced from the active junction, but sufficiently close thereto that the reverse bias depletion region from the active junction can reach the depletion region from the reverse biased guard junction, whereby the depletion region of the guard junction modifies the shape of the depletion region from the active junction thus lowering the electric field intensity at a given applied reverse voltage across the active junction.

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8686531 Structure and method for forming a guard ring to protect a control device in a power semiconductor IC Apr. 1, 2014
8614465 Electronic device and manufacturing method Dec. 24, 2013
8575723 Detection circuit and method for detecting damage to a semiconductor chip Nov. 5, 2013
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8497167 EDS protection diode with pwell-nwell resurf Jul. 30, 2013
8274080 Semiconductor wafer including guard ring patterns and process monitoring patterns Sep. 25, 2012
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8110853 Guard ring structures for high voltage CMOS/low voltage CMOS technology using LDMOS (lateral double-diffused metal oxide semiconductor) device fabrication Feb. 7, 2012
8080858 Semiconductor component having a space saving edge structure Dec. 20, 2011
7999333 Semiconductor device Aug. 16, 2011
7999347 Semiconductor device Aug. 16, 2011
7977762 Effective shield structure for improving substrate isolation of analog circuits from noisy digital circuits on a system-on-chip (SOC) Jul. 12, 2011
7936023 High voltage diode May. 3, 2011
7915676 Integrated circuit Mar. 29, 2011
7911021 Edge termination for semiconductor devices Mar. 22, 2011
7804143 Radiation hardened device Sep. 28, 2010
7777292 Semiconductor device Aug. 17, 2010
7696605 Semiconductor component comprising a temporary field stopping area, and method for the production thereof Apr. 13, 2010
7692262 Rectifying and protection diode Apr. 6, 2010
7667254 Semiconductor integrated circuit device Feb. 23, 2010
7656003 Electrical stress protection apparatus and method of manufacture Feb. 2, 2010
7642139 Semiconductor device production method and semiconductor device Jan. 5, 2010
7598587 Semiconductor device Oct. 6, 2009
7554157 Lateral SOI component having a reduced on resistance Jun. 30, 2009
7525178 Semiconductor device with capacitively coupled field plate Apr. 28, 2009
7488991 Molecular controlled semiconductor device Feb. 10, 2009
7385273 Power semiconductor device Jun. 10, 2008
7279757 Double-sided extended drain field effect transistor Oct. 9, 2007
7247921 Semiconductor apparatus and method of manufacturing same, and method of detecting defects in semiconductor apparatus Jul. 24, 2007
7071528 Double-triggered silicon controlling rectifier and electrostatic discharge protection circuit thereof Jul. 4, 2006
7067883 Lateral high-voltage junction device Jun. 27, 2006
7049663 ESD protection device with high voltage and negative voltage tolerance May. 23, 2006
7038280 Integrated circuit bond pad structures and methods of making May. 2, 2006
6943410 High power vertical semiconductor device Sep. 13, 2005
6940138 Semiconductor device, semiconductor gate array, electro-optical device, and electronic equipment Sep. 6, 2005
6879023 Seal ring for integrated circuits Apr. 12, 2005
6818958 Semiconductor device and process for its manufacture to increase threshold voltage stability Nov. 16, 2004
6815793 Body of a semiconductor material with a reduced mean free path length Nov. 9, 2004
6788507 Electrostatic discharge protection circuit Sep. 7, 2004
6787873 Semiconductor device for providing a noise shield Sep. 7, 2004
6762456 Multiple conductive plug structure including at least one conductive plug region and at least one between-conductive-plug region for lateral RF MOS devices Jul. 13, 2004
6730947 Semiconductor integrated circuit apparatus having an periphery impurity layer May. 4, 2004
6661075 Abrupt pn junction diode formed using chemical vapor deposition processing Dec. 9, 2003
6621122 Termination structure for superjunction device Sep. 16, 2003
6603186 Bipolar transistor with base drive circuit protection Aug. 5, 2003
6476458 Semiconductor device capable of enhancing a withstand voltage at a peripheral region around an element in comparison with a withstand voltage at the element Nov. 5, 2002
6441455 Low dosage field rings for high voltage semiconductor device Aug. 27, 2002
6424014 Semiconductor element with electric field reducing device mounted therein for increasing dielectric strength Jul. 23, 2002
6369424 Field effect transistor having high breakdown withstand capacity Apr. 9, 2002

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