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Class Information
Number: 257/487
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > With means to increase breakdown voltage threshold
Description: Subject matter wherein the device is provided with means to increase the voltage that may be applied thereto without causing electrical breakdown.










Sub-classes under this class:

Class Number Class Name Patents
257/488 Field relief electrode 268
257/495 Floating pn junction guard region 161
257/491 In integrated circuit 179
257/494 Reverse-biased pn junction guard region 105
257/493 With electric field controlling semiconductor layer having a low enough doping level in relationship to its thickness to be fully depleted prior to avalanche breakdown (e.g., resurf devices) 268
257/496 With physical configuration of semiconductor surface to reduce electric field (e.g., reverse bevels, double bevels, stepped mesas, etc.) 165


Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8710617 Semiconductor device element formed on SOI substrate comprising a hollow region, and having capacitors in an electric field alleviation region Apr. 29, 2014
8692318 Trench MOS structure and method for making the same Apr. 8, 2014
8686530 Electronic component and a method of manufacturing an electronic component Apr. 1, 2014
8680607 Trench gated power device with multiple trench width and its fabrication process Mar. 25, 2014
8642987 Semiconductor device and manufacturing method thereof Feb. 4, 2014
8637385 High voltage durability transistor and method for fabricating same Jan. 28, 2014
8633561 Termination for a superjunction device Jan. 21, 2014
8618557 Wide-band-gap reverse-blocking MOS-type semiconductor device Dec. 31, 2013
8592923 Coupling well structure for improving HVMOS performance Nov. 26, 2013
8575694 Insulated gate bipolar transistor structure having low substrate leakage Nov. 5, 2013
8569150 Method for producing a semiconductor device with a semiconductor body Oct. 29, 2013
8558315 Trench isolation MOS P-N junction diode device and method for manufacturing the same Oct. 15, 2013
8546906 System and method for packaging of high-voltage semiconductor devices Oct. 1, 2013
8525289 Adjusting threshold voltage for sophisticated transistors by diffusing a gate dielectric cap layer material prior to gate dielectric stabilization Sep. 3, 2013
8497167 EDS protection diode with pwell-nwell resurf Jul. 30, 2013
8476698 Corner layout for superjunction device Jul. 2, 2013
8471337 Integrated circuit Jun. 25, 2013
8431460 Method for fabricating semiconductor device Apr. 30, 2013
8395244 Fast recovery diode Mar. 12, 2013
8390092 Area-efficient high voltage bipolar-based ESD protection targeting narrow design windows Mar. 5, 2013
8384163 Layout design tool for semiconductor integrated circuit Feb. 26, 2013
8299578 High voltage bipolar transistor with bias shield Oct. 30, 2012
8294235 Edge termination with improved breakdown voltage Oct. 23, 2012
8241973 Method for increasing penetration depth of drain and source implantation species for a given gate height Aug. 14, 2012
8212322 Techniques for enabling multiple V.sub.t devices using high-K metal gate stacks Jul. 3, 2012
8143679 Termination structure for power devices Mar. 27, 2012
8138569 Guard ring structures and method of fabricating thereof Mar. 20, 2012
8097925 Integrated circuit guard rings Jan. 17, 2012
8093676 Semiconductor component including an edge termination having a trench and method for producing Jan. 10, 2012
8080858 Semiconductor component having a space saving edge structure Dec. 20, 2011
8076695 Semiconductor device Dec. 13, 2011
8076748 Semiconductor device Dec. 13, 2011
8076749 Semiconductor device Dec. 13, 2011
8063467 Semiconductor structure and method of manufacture Nov. 22, 2011
8053859 Semiconductor device and the method of manufacturing the same Nov. 8, 2011
8049295 Coupling well structure for improving HVMOS performance Nov. 1, 2011
8034700 Method of fabricating a diode Oct. 11, 2011
8024139 Method and computer code for statistical process control for censored production data Sep. 20, 2011
8018022 Guard ring structures and method of fabricating thereof Sep. 13, 2011
8013381 Semiconductor device Sep. 6, 2011
7973382 Semiconductor device Jul. 5, 2011
7936042 Field effect transistor containing a wide band gap semiconductor material in a drain May. 3, 2011
7923804 Edge termination with improved breakdown voltage Apr. 12, 2011
7915676 Integrated circuit Mar. 29, 2011
7911020 Semiconductor device having breakdown voltage maintaining structure and its manufacturing method Mar. 22, 2011
7888767 Structures of high-voltage MOS devices with improved electrical performance Feb. 15, 2011
7884426 Layout design method of semiconductor integrated circuit having well supplied with potential different from substrate potential Feb. 8, 2011
7855427 Semiconductor device with a plurality of isolated conductive films Dec. 21, 2010
7838969 Diode Nov. 23, 2010
7825487 Guard ring structures and method of fabricating thereof Nov. 2, 2010

1 2 3 4 5










 
 
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