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Class Information
Number: 257/487
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > With means to increase breakdown voltage threshold
Description: Subject matter wherein the device is provided with means to increase the voltage that may be applied thereto without causing electrical breakdown.


Sub-classes under this class:

Class Number Class Name Patents
257/488 Field relief electrode 200
257/495 Floating pn junction guard region 115
257/491 In integrated circuit 139
257/494 Reverse-biased pn junction guard region 78
257/493 With electric field controlling semiconductor layer having a low enough doping level in relationship to its thickness to be fully depleted prior to avalanche breakdown (e.g., resurf devices) 177
257/496 With physical configuration of semiconductor surface to reduce electric field (e.g., reverse bevels, double bevels, stepped mesas, etc.) 121


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
7411272 Semiconductor device and method of forming a semiconductor device Aug. 12, 2008
7355257 Semiconductor superjunction device Apr. 8, 2008
7355261 Thin film device, thin film device module, and method of forming thin film device module Apr. 8, 2008
7327007 Semiconductor device with high breakdown voltage Feb. 5, 2008
7327008 Structure and method for mixed-substrate SIMOX technology Feb. 5, 2008
7321142 Field effect transistor Jan. 22, 2008
7304356 IGBT or like semiconductor device of high voltage-withstanding capability Dec. 4, 2007
7301179 Semiconductor device having a high breakdown voltage transistor formed thereon Nov. 27, 2007
7279767 Semiconductor structure with high-voltage sustaining capability and fabrication method of the same Oct. 9, 2007
7279768 Semiconductor device for overvoltage protection Oct. 9, 2007
7259440 Fast switching diode with low leakage current Aug. 21, 2007
7244975 High-voltage device structure Jul. 17, 2007
7230310 Super-junction voltage sustaining layer with alternating semiconductor and High-K dielectric regions Jun. 12, 2007
7180133 Method and structure for addressing hot carrier degradation in high voltage devices Feb. 20, 2007
7135751 High breakdown voltage junction terminating structure Nov. 14, 2006
7106628 Semiconductor device having enhanced breakdown voltage Sep. 12, 2006
7081656 CMOS constructions Jul. 25, 2006
7064399 Advanced CMOS using super steep retrograde wells Jun. 20, 2006
7049663 ESD protection device with high voltage and negative voltage tolerance May. 23, 2006
6989566 High-voltage semiconductor device including a floating block Jan. 24, 2006
6921945 Semiconductor device with structure for improving breakdown voltage Jul. 26, 2005
6900518 Semiconductor device May. 31, 2005
6873012 SOI component Mar. 29, 2005
6847080 Semiconductor device with high and low breakdown voltage and its manufacturing method Jan. 25, 2005
6847081 Dual gate oxide high-voltage semiconductor device Jan. 25, 2005
6828605 Field-effect-controlled semiconductor component and method of fabricating a doping layer in a vertically configured semiconductor component Dec. 7, 2004
6815793 Body of a semiconductor material with a reduced mean free path length Nov. 9, 2004
6768170 Superjunction device with improved avalanche capability and breakdown voltage Jul. 27, 2004
6740952 High withstand voltage semiconductor device May. 25, 2004
6724021 Semiconductor devices and their peripheral termination Apr. 20, 2004
6717230 Lateral device with improved conductivity and blocking control Apr. 6, 2004
6703684 Semiconductor device and method of forming a semiconductor device Mar. 9, 2004
6696741 High breakdown voltage PN junction structure, and related manufacturing process Feb. 24, 2004
6683363 Trench structure for semiconductor devices Jan. 27, 2004
6653669 Device for the adjustment of circuits after packaging Nov. 25, 2003
6649995 Semiconductor device and method of manufacturing the same Nov. 18, 2003
6621116 Enhanced EPROM structures with accentuated hot electron generation regions Sep. 16, 2003
6607972 Method for producing an edge termination suitable for high voltages in a basic material wafer prefabricated according to the principle of lateral charge compensation Aug. 19, 2003
6600206 High voltage semiconductor device having high breakdown voltage isolation region Jul. 29, 2003
6583453 Semiconductor device having a voltage-regulator device Jun. 24, 2003
6486541 Semiconductor device and fabrication method Nov. 26, 2002
6476457 Semiconductor device with drift layer Nov. 5, 2002
6469359 Semiconductor device and a method for production thereof Oct. 22, 2002
6462382 MOS type semiconductor apparatus Oct. 8, 2002
6445054 Semiconductor device Sep. 3, 2002
6439514 Semiconductor device with elements surrounded by trenches Aug. 27, 2002
6429501 Semiconductor device having high breakdown voltage and method for manufacturing the device Aug. 6, 2002
6414358 Arrangements to reduce charging damage in structures of integrated circuits Jul. 2, 2002
6396084 Structure of semiconductor rectifier May. 28, 2002
6373082 Compound semiconductor field effect transistor Apr. 16, 2002

1 2 3


 
 
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