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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
7852103 Implementing at-speed Wafer Final Test (WFT) with complete chip coverage Dec. 14, 2010
7851866 Electric power conversion device Dec. 14, 2010
7851864 Test structure of a semiconductor device and semiconductor device Dec. 14, 2010
7851794 Rotating contact element and methods of fabrication Dec. 14, 2010
7851793 Test structure with TDDB test pattern Dec. 14, 2010
7851235 Test element group for monitoring leakage current in semiconductor device and method of manufacturing the same Dec. 14, 2010
7848828 Method and apparatus for managing manufacturing equipment, method for manufacturing device thereby Dec. 7, 2010
7847384 Semiconductor package and manufacturing method thereof Dec. 7, 2010
7847288 Method and resulting structure for fabricating test key structures in DRAM structures Dec. 7, 2010
7843206 Semiconductor integrated circuit and method for inspecting same Nov. 30, 2010
7842949 IC with comparator receiving expected and mask data from pads Nov. 30, 2010
7842948 Flip chip semiconductor die internal signal access system and method Nov. 30, 2010
7838943 Shared gate for conventional planar device and horizontal CNT Nov. 23, 2010
7838878 Semiconductor-based sub-mounts for optoelectronic devices with conductive paths to facilitate testing and binning Nov. 23, 2010
7834394 Semiconductor structure and method of fabricating the same Nov. 16, 2010
7834377 Semiconductor integrated circuit device Nov. 16, 2010
7834351 Semiconductor device Nov. 16, 2010
7834350 Semiconductor device with test pads and pad connection unit Nov. 16, 2010
7829889 Method and semiconductor structure for monitoring etch characteristics during fabrication of vias of interconnect structures Nov. 9, 2010
7825704 Threshold personalization testmode Nov. 2, 2010
7825410 Semiconductor device Nov. 2, 2010
7825409 GaN crystal substrate Nov. 2, 2010
7824930 Method of manufacturing substrate, substrate manufacturing system, and method of manufacturing display Nov. 2, 2010
7823038 Connecting analog response to separate strobed comparator input on IC Oct. 26, 2010
7818698 Accurate parasitic capacitance extraction for ultra large scale integrated circuits Oct. 19, 2010
7814773 Reference leak Oct. 19, 2010
7812347 Integrated circuit and methods of measurement and preparation of measurement structure Oct. 12, 2010
7808248 Radio frequency test key structure Oct. 5, 2010
7807998 Evaluation pattern suitable for evaluation of lateral hillock formation Oct. 5, 2010
7807997 Test element group (TEG) system for measurement of SOI-MOSFET without a body contact comprising first and second TEGs of unequal gate electrode areas Oct. 5, 2010
7807996 Test pattern of CMOS image sensor and method of measuring process management using the same Oct. 5, 2010
7807552 Method of inspecting defect of semiconductor device Oct. 5, 2010
7807481 Method of semiconductor device protection, package of semiconductor device Oct. 5, 2010
7807480 Test cells for semiconductor yield improvement Oct. 5, 2010
7804313 Semiconductor device Sep. 28, 2010
7804148 Opto-thermal mask including aligned thermal dissipative layer, reflective layer and transparent capping layer Sep. 28, 2010
7800810 Packaging and testing of multiple MEMS devices on a wafer Sep. 21, 2010
7800108 Semiconductor device and method of manufacturing semiconductor device including optical test pattern above a light shielding film Sep. 21, 2010
7800107 Test module for semiconductor device Sep. 21, 2010
7800106 Test structure for OPC-related shorts between lines in a semiconductor device Sep. 21, 2010
7799583 System for separation of an electrically conductive connection Sep. 21, 2010
7799237 Method and apparatus for etching a structure in a plasma chamber Sep. 21, 2010
7798703 Apparatus and method for measuring local surface temperature of semiconductor device Sep. 21, 2010
7795615 Capacitor integrated in a structure surrounding a die Sep. 14, 2010
7793237 System, structure and method of providing dynamic optimization of integrated circuits using a non-contact method of selection, and a design structure Sep. 7, 2010
7791071 Profiling solid state samples Sep. 7, 2010
7791070 Semiconductor device fault detection system and method Sep. 7, 2010
7787838 Integrated circuit, and an arrangement and method for interconnecting components of an integrated circuit Aug. 31, 2010
7786478 Semiconductor integrated circuit having terminal for measuring bump connection resistance and semiconductor device provided with the same Aug. 31, 2010
7786477 Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method Aug. 31, 2010











 
 
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