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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7852103 |
Implementing at-speed Wafer Final Test (WFT) with complete chip coverage |
Dec. 14, 2010 |
| 7851866 |
Electric power conversion device |
Dec. 14, 2010 |
| 7851864 |
Test structure of a semiconductor device and semiconductor device |
Dec. 14, 2010 |
| 7851794 |
Rotating contact element and methods of fabrication |
Dec. 14, 2010 |
| 7851793 |
Test structure with TDDB test pattern |
Dec. 14, 2010 |
| 7851235 |
Test element group for monitoring leakage current in semiconductor device and method of manufacturing the same |
Dec. 14, 2010 |
| 7848828 |
Method and apparatus for managing manufacturing equipment, method for manufacturing device thereby |
Dec. 7, 2010 |
| 7847384 |
Semiconductor package and manufacturing method thereof |
Dec. 7, 2010 |
| 7847288 |
Method and resulting structure for fabricating test key structures in DRAM structures |
Dec. 7, 2010 |
| 7843206 |
Semiconductor integrated circuit and method for inspecting same |
Nov. 30, 2010 |
| 7842949 |
IC with comparator receiving expected and mask data from pads |
Nov. 30, 2010 |
| 7842948 |
Flip chip semiconductor die internal signal access system and method |
Nov. 30, 2010 |
| 7838943 |
Shared gate for conventional planar device and horizontal CNT |
Nov. 23, 2010 |
| 7838878 |
Semiconductor-based sub-mounts for optoelectronic devices with conductive paths to facilitate testing and binning |
Nov. 23, 2010 |
| 7834394 |
Semiconductor structure and method of fabricating the same |
Nov. 16, 2010 |
| 7834377 |
Semiconductor integrated circuit device |
Nov. 16, 2010 |
| 7834351 |
Semiconductor device |
Nov. 16, 2010 |
| 7834350 |
Semiconductor device with test pads and pad connection unit |
Nov. 16, 2010 |
| 7829889 |
Method and semiconductor structure for monitoring etch characteristics during fabrication of vias of interconnect structures |
Nov. 9, 2010 |
| 7825704 |
Threshold personalization testmode |
Nov. 2, 2010 |
| 7825410 |
Semiconductor device |
Nov. 2, 2010 |
| 7825409 |
GaN crystal substrate |
Nov. 2, 2010 |
| 7824930 |
Method of manufacturing substrate, substrate manufacturing system, and method of manufacturing display |
Nov. 2, 2010 |
| 7823038 |
Connecting analog response to separate strobed comparator input on IC |
Oct. 26, 2010 |
| 7818698 |
Accurate parasitic capacitance extraction for ultra large scale integrated circuits |
Oct. 19, 2010 |
| 7814773 |
Reference leak |
Oct. 19, 2010 |
| 7812347 |
Integrated circuit and methods of measurement and preparation of measurement structure |
Oct. 12, 2010 |
| 7808248 |
Radio frequency test key structure |
Oct. 5, 2010 |
| 7807998 |
Evaluation pattern suitable for evaluation of lateral hillock formation |
Oct. 5, 2010 |
| 7807997 |
Test element group (TEG) system for measurement of SOI-MOSFET without a body contact comprising first and second TEGs of unequal gate electrode areas |
Oct. 5, 2010 |
| 7807996 |
Test pattern of CMOS image sensor and method of measuring process management using the same |
Oct. 5, 2010 |
| 7807552 |
Method of inspecting defect of semiconductor device |
Oct. 5, 2010 |
| 7807481 |
Method of semiconductor device protection, package of semiconductor device |
Oct. 5, 2010 |
| 7807480 |
Test cells for semiconductor yield improvement |
Oct. 5, 2010 |
| 7804313 |
Semiconductor device |
Sep. 28, 2010 |
| 7804148 |
Opto-thermal mask including aligned thermal dissipative layer, reflective layer and transparent capping layer |
Sep. 28, 2010 |
| 7800810 |
Packaging and testing of multiple MEMS devices on a wafer |
Sep. 21, 2010 |
| 7800108 |
Semiconductor device and method of manufacturing semiconductor device including optical test pattern above a light shielding film |
Sep. 21, 2010 |
| 7800107 |
Test module for semiconductor device |
Sep. 21, 2010 |
| 7800106 |
Test structure for OPC-related shorts between lines in a semiconductor device |
Sep. 21, 2010 |
| 7799583 |
System for separation of an electrically conductive connection |
Sep. 21, 2010 |
| 7799237 |
Method and apparatus for etching a structure in a plasma chamber |
Sep. 21, 2010 |
| 7798703 |
Apparatus and method for measuring local surface temperature of semiconductor device |
Sep. 21, 2010 |
| 7795615 |
Capacitor integrated in a structure surrounding a die |
Sep. 14, 2010 |
| 7793237 |
System, structure and method of providing dynamic optimization of integrated circuits using a non-contact method of selection, and a design structure |
Sep. 7, 2010 |
| 7791071 |
Profiling solid state samples |
Sep. 7, 2010 |
| 7791070 |
Semiconductor device fault detection system and method |
Sep. 7, 2010 |
| 7787838 |
Integrated circuit, and an arrangement and method for interconnecting components of an integrated circuit |
Aug. 31, 2010 |
| 7786478 |
Semiconductor integrated circuit having terminal for measuring bump connection resistance and semiconductor device provided with the same |
Aug. 31, 2010 |
| 7786477 |
Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method |
Aug. 31, 2010 |
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