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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
7968878 Electrical test structure to detect stress induced defects using diodes Jun. 28, 2011
7960728 Method of manufacturing TFT substrate and TFT substrate Jun. 14, 2011
7956357 Test pads coupled with leads unconnected with die pads Jun. 7, 2011
7955886 Apparatus and method for reducing interference Jun. 7, 2011
7951615 System and method for implementing multi-resolution advanced process control May. 31, 2011
7948258 Semiconductor arrangement and method for the measurement of a resistance May. 24, 2011
7947979 Semiconductor device May. 24, 2011
7947978 Semiconductor chip with bond area May. 24, 2011
7943970 Method of detecting bio-molecules using the same field effect transistor on the gate sensing surface May. 17, 2011
7940059 Method for testing H-bridge May. 10, 2011
7939824 Test structure May. 10, 2011
7939823 Method and structures for accelerated soft-error testing May. 10, 2011
7939348 E-beam inspection structure for leakage analysis May. 10, 2011
7936178 Test probe May. 3, 2011
7936176 Method for providing alignment of a probe May. 3, 2011
7935965 Test structures and methods for electrical characterization of alignment of line patterns defined with double patterning May. 3, 2011
7932739 BGA package holder device and method for testing of BGA packages Apr. 26, 2011
7932519 Pixel structure Apr. 26, 2011
7932517 Semiconductor device comprising circuit substrate with inspection connection pads and manufacturing method thereof Apr. 26, 2011
7932157 Test structure formation in semiconductor processing Apr. 26, 2011
7932103 Integrated circuit system with MOS device Apr. 26, 2011
7928750 Contactless interfacing of test signals with a device under test Apr. 19, 2011
7928591 Apparatus and method for predetermined component placement to a target platform Apr. 19, 2011
7928435 Interposer chip and multi-chip package having the interposer chip Apr. 19, 2011
7928432 Sensing devices from molecular electronic devices Apr. 19, 2011
7919869 Semiconductor device and method of visual inspection and apparatus for visual inspection Apr. 5, 2011
7919847 Semiconductor wafer, semiconductor device, and semiconductor device manufacturing method Apr. 5, 2011
7919839 Support structures for on-wafer testing of wafer-level packages and multiple wafer stacked structures Apr. 5, 2011
7919775 Semiconductor device and method comprising a high voltage reset driver and an isolated memory array Apr. 5, 2011
7915056 Image sensor monitor structure in scribe area Mar. 29, 2011
7910385 Method of fabricating microelectronic devices Mar. 22, 2011
7904770 Testing circuit split between tiers of through silicon stacking chips Mar. 8, 2011
7903187 Static electricity preventing assembly for display device and method of manufacturing the same Mar. 8, 2011
7902548 Planar voltage contrast test structure Mar. 8, 2011
7900519 Microfluidic measuring tool to measure through-silicon via depth Mar. 8, 2011
7898269 Semiconductor device and method for measuring analog channel resistance thereof Mar. 1, 2011
7897965 Display substrate, display panel having the same, and method of testing a display substrate Mar. 1, 2011
7893432 Thermal interface Feb. 22, 2011
7889013 Microelectronic die having CMOS ring oscillator thereon and method of using same Feb. 15, 2011
7888776 Capacitor-based method for determining and characterizing scribe seal integrity and integrity loss Feb. 15, 2011
7888683 Organic light emitting display and method for making the same Feb. 15, 2011
7888673 Monitoring semiconductor device and method of manufacturing the same Feb. 15, 2011
7888672 Device for detecting stress migration properties Feb. 15, 2011
7881848 Lane departure prevention apparatus and method Feb. 1, 2011
7876438 Apparatus and methods for determining overlay and uses of same Jan. 25, 2011
7875850 Standard component for calibration and electron-beam system using the same Jan. 25, 2011
7872283 Semiconductor integrated circuit and multi-chip module Jan. 18, 2011
7859291 Method of measuring on-resistance in backside drain wafer Dec. 28, 2010
7859290 Apparatus and method for measuring effective channel Dec. 28, 2010
7855090 In line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same Dec. 21, 2010











 
 
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