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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
8063401 Testing for correct undercutting of an electrode during an etching step Nov. 22, 2011
8062911 Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Nov. 22, 2011
8058648 Switching device and testing apparatus Nov. 15, 2011
8057967 Process window signature patterns for lithography process control Nov. 15, 2011
8053774 Method and apparatus to fabricate polymer arrays on patterned wafers using electrochemical synthesis Nov. 8, 2011
8049345 Overlay mark Nov. 1, 2011
8049214 Degradation correction for finFET circuits Nov. 1, 2011
8049213 Feature dimension measurement Nov. 1, 2011
8044396 Semiconductor device and method of designing the same Oct. 25, 2011
8044395 Semiconductor memory apparatus for controlling pads and multi-chip package having the same Oct. 25, 2011
8044394 Semiconductor wafer with electrically connected contact and test areas Oct. 25, 2011
8039837 In-line voltage contrast detection of PFET silicide encroachment Oct. 18, 2011
8039367 Scribe line structure and method for dicing a wafer Oct. 18, 2011
8039277 Providing current control over wafer borne semiconductor devices using overlayer patterns Oct. 18, 2011
8034641 Method for inspection of defects on a substrate Oct. 11, 2011
8030650 Pixel structure and methods for fabricating, detecting, and repairing the pixel structure Oct. 4, 2011
8030649 Scan testing in single-chip multicore systems Oct. 4, 2011
8030099 Method for determining time to failure of submicron metal interconnects Oct. 4, 2011
8026516 Carrier module for use in a handler and handler for handling packaged chips for a test using the carrier modules Sep. 27, 2011
8026515 Platform-independent system and method for controlling a temperature of an integrated circuit Sep. 27, 2011
8022448 Apparatus and methods for evaporation including test wafer holder Sep. 20, 2011
8022403 Semiconductor apparatus including photodiode unit and method of inspection of the same Sep. 20, 2011
8022402 Active device array substrate Sep. 20, 2011
8021712 Wafer and manufacturing method of electronic component Sep. 20, 2011
8017943 Semiconductor device with reduced pad pitch Sep. 13, 2011
8017942 Semiconductor device and method Sep. 13, 2011
8013362 Semiconductor integrated circuit and multi-chip module Sep. 6, 2011
8013334 Bonding structure of circuit substrate for instant circuit inspecting Sep. 6, 2011
8013333 Semiconductor test pad structures Sep. 6, 2011
8013332 Portable memory devices Sep. 6, 2011
8008661 Insert module for a test handler Aug. 30, 2011
8008660 Display apparatus and electrophoretic display apparatus Aug. 30, 2011
8008659 Semiconductor integrated circuit device Aug. 30, 2011
8003984 Reticle for wafer test structure areas Aug. 23, 2011
8003983 Wafer for manufacturing image sensors, test key layout for defects inspection, and methods for manufacturing image sensors and for forming test key Aug. 23, 2011
8000826 Predicting IC manufacturing yield by considering both systematic and random intra-die process variations Aug. 16, 2011
7999256 Semiconductor device Aug. 16, 2011
7999242 Substrate holding apparatus, and inspection or processing apparatus Aug. 16, 2011
7994501 Method and apparatus for electronically aligning capacitively coupled mini-bars Aug. 9, 2011
7989804 Test pattern structure Aug. 2, 2011
7989803 Manufacturing method for semiconductor chips and semiconductor wafer Aug. 2, 2011
7989232 Method of using electrical test structure for semiconductor trench depth monitor Aug. 2, 2011
7982217 Semiconductor device and its test method Jul. 19, 2011
7977618 Testing of transimpedance amplifiers Jul. 12, 2011
7977125 Display apparatus and method of manufacturing the same Jul. 12, 2011
7977124 Semiconductor device and method of designing the same Jul. 12, 2011
7973544 Thermal monitoring and management of integrated circuits Jul. 5, 2011
7973310 Semiconductor package structure and method for manufacturing the same Jul. 5, 2011
7973309 TEG pattern for detecting void in device isolation layer and method of forming the same Jul. 5, 2011
7969564 System and method for defect localization on electrical test structures Jun. 28, 2011

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