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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
8183691 Semiconductor device with pads overlapping wiring layers including dummy wiring May. 22, 2012
8183565 Programmable resistance memory array with dedicated test cell May. 22, 2012
8183549 Substrate holding apparatus, and inspection or processing apparatus May. 22, 2012
8178942 Electrically alterable circuit for use in an integrated circuit device May. 15, 2012
8178876 Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturing May. 15, 2012
8178364 Testing method of surface-emitting laser device and testing device thereof May. 15, 2012
8174282 Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method May. 8, 2012
8174011 Positional offset measurement pattern unit featuring via-plug and interconnections, and method using such positional offset measurement pattern unit May. 8, 2012
8174010 Unified test structure for stress migration tests May. 8, 2012
8173449 Method for making COP evaluation on single-crystal silicon wafer May. 8, 2012
8169230 Semiconductor device and method of testing the same May. 1, 2012
8168970 Die having embedded circuitry with test and test enable circuitry May. 1, 2012
8168452 Method for manufacturing semiconductor device May. 1, 2012
8164091 Multi-purpose poly edge test structure Apr. 24, 2012
8163574 System and method for sensing voltage in medium-to-high voltage applications Apr. 24, 2012
8159254 Crack sensors for semiconductor devices Apr. 17, 2012
8159252 Test handler and method for operating the same for testing semiconductor devices Apr. 17, 2012
8154019 Semiconductor apparatus and calibration method thereof Apr. 10, 2012
8149152 Capacitor based digital to analog converter layout design for high speed analog to digital converter Apr. 3, 2012
8145959 Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit Mar. 27, 2012
8143705 Tamper-resistant semiconductor device and methods of manufacturing thereof Mar. 27, 2012
8143619 Methods of combinatorial processing for screening multiple samples on a semiconductor substrate Mar. 27, 2012
8143098 Integrated circuit packaging system with interposer and method of manufacture thereof Mar. 27, 2012
8142966 Substrate matrix to decouple tool and process effects Mar. 27, 2012
8138498 Apparatus and methods for determining overlay of structures having rotational or mirror symmetry Mar. 20, 2012
8138497 Test structure for detecting via contact shorting in shallow trench isolation regions Mar. 20, 2012
8134187 Integrated mask-programmable logic devices with multiple metal levels and manufacturing process thereof Mar. 13, 2012
8125796 Devices with faraday cages and internal flexibility sipes Feb. 28, 2012
8124428 Structure and method for testing MEMS devices Feb. 28, 2012
8120026 Testing wiring structure and method for forming the same Feb. 21, 2012
8120024 Semiconductor package having test pads on top and bottom substrate surfaces and method of testing same Feb. 21, 2012
8115202 Thin film transistor array substrate and electronic ink display device Feb. 14, 2012
8110926 Redistribution layer power grid Feb. 7, 2012
8110905 Integrated circuit packaging system with leadframe interposer and method of manufacture thereof Feb. 7, 2012
8110852 Semiconductor integrated circuit device Feb. 7, 2012
8106654 Magnetic sensor integrated circuit device and method Jan. 31, 2012
8106396 Thin film transistor array substrate Jan. 31, 2012
8106395 Semiconductor device and method of manufacturing the same Jan. 31, 2012
8102053 Displacement detection pattern for detecting displacement between wiring and via plug, displacement detection method, and semiconductor device Jan. 24, 2012
8097475 Method of production of a contact structure Jan. 17, 2012
8084872 Overlay mark, method of checking local aligmnent using the same and method of controlling overlay based on the same Dec. 27, 2011
8084770 Test structures for development of metal-insulator-metal (MIM) devices Dec. 27, 2011
8084769 Testkey design pattern for gate oxide Dec. 27, 2011
8080823 IC chip package and image display device incorporating same Dec. 20, 2011
8076951 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis Dec. 13, 2011
8072076 Bond pad structures and integrated circuit chip having the same Dec. 6, 2011
8067830 Dual or multiple row package Nov. 29, 2011
8067769 Wafer level package structure, and sensor device obtained from the same package structure Nov. 29, 2011
8064832 Method and test system for determining gate-to-body current in a floating body FET Nov. 22, 2011
8063402 Integrated circuit having a filler standard cell Nov. 22, 2011

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