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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
8323989 Test system and method of reducing damage in seed layers in metallization systems of semiconductor devices Dec. 4, 2012
8318391 Process window signature patterns for lithography process control Nov. 27, 2012
8315819 Method and apparatus for determining dopant density in semiconductor devices Nov. 20, 2012
8309957 Replacement of scribeline padframe with saw-friendly design Nov. 13, 2012
8305097 Method for calibrating an inspection tool Nov. 6, 2012
8304860 Epitaxially coated silicon wafer and method for producing an epitaxially coated silicon wafer Nov. 6, 2012
8304766 Semiconductor chip with a bonding pad having contact and test areas Nov. 6, 2012
8299464 Comparator receiving expected and mask data from circuit pads Oct. 30, 2012
8299463 Test structure for charged particle beam inspection and method for defect determination using the same Oct. 30, 2012
8298837 System and method for increasing productivity of organic light emitting diode material screening Oct. 30, 2012
8294149 Test structure and methodology for three-dimensional semiconductor structures Oct. 23, 2012
8293545 Critical dimension for trench and vias Oct. 23, 2012
8288851 Method and system for hermetically sealing packages for optics Oct. 16, 2012
8288838 Semiconductor unit Oct. 16, 2012
8288177 SER testing for an IC chip using hot underfill Oct. 16, 2012
8288174 Electrostatic post exposure bake apparatus and method Oct. 16, 2012
8283665 Scan paths, stimulus, and header circuitry with command/frame marker outputs Oct. 9, 2012
8283664 Disguising test pads in a semiconductor package Oct. 9, 2012
8283663 Multichip device Oct. 9, 2012
8274165 Semiconductor substrate, laminated chip package, semiconductor plate and method of manufacturing the same Sep. 25, 2012
8274080 Semiconductor wafer including guard ring patterns and process monitoring patterns Sep. 25, 2012
8269327 Vertical system integration Sep. 18, 2012
8258805 Test device and semiconductor integrated circuit device Sep. 4, 2012
8258509 Micro vacuum gauge Sep. 4, 2012
8257986 Testing wiring structure and method for forming the same Sep. 4, 2012
RE43607 Method and apparatus for evaluating a known good die using both wire bond and flip-chip interconnects Aug. 28, 2012
8248098 Apparatus and method for measuring characteristics of semiconductor device Aug. 21, 2012
8242794 Socket, and test apparatus and method using the socket Aug. 14, 2012
8242613 Bond pad for semiconductor die Aug. 14, 2012
8242499 Method of producing semiconductor device and SOQ (Silicon On Quartz) substrate used in the method Aug. 14, 2012
8237458 Electromigration testing and evaluation apparatus and methods Aug. 7, 2012
8237160 Probe pad on a corner stress relief region in a semiconductor chip Aug. 7, 2012
8237155 Selective nanotube formation and related devices Aug. 7, 2012
8232553 Semiconductor device Jul. 31, 2012
8232115 Test structure for determination of TSV depth Jul. 31, 2012
8228080 Device and method for current estimation Jul. 24, 2012
8228069 Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatus Jul. 24, 2012
8217394 Probe pad on a corner stress relief region in a semiconductor chip Jul. 10, 2012
8217393 Test device, SRAM test device, semiconductor integrated circuit device and methods of fabricating the same Jul. 10, 2012
8215830 Apparatus and method for measuring local surface temperature of semiconductor device Jul. 10, 2012
8212952 Liquid crystal display panel Jul. 3, 2012
8207532 Constant and reducible hole bottom CD in variable post-CMP thickness and after-development-inspection CD Jun. 26, 2012
8206997 Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Jun. 26, 2012
8204704 MOS capacitance test structure and associated method for measuring a curve of capacitance as a function of the voltage Jun. 19, 2012
8203145 Structure for bumped wafer test Jun. 19, 2012
8198658 Device and method for detecting biomolecules using adsorptive medium and field effect transistor Jun. 12, 2012
8198627 Semiconductor device with test pads and pad connection unit Jun. 12, 2012
8198626 Reference wafer for calibration and method for fabricating the same Jun. 12, 2012
8193530 Semiconductor device having pairs of pads Jun. 5, 2012
8188469 Test device and a semiconductor integrated circuit device May. 29, 2012

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