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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
8421073 Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC) Apr. 16, 2013
8421072 Electronic device having thermally managed electron path and method of thermal management of very cold electrons Apr. 16, 2013
8415783 Apparatus and methodology for testing stacked die Apr. 9, 2013
8415663 System and method for test structure on a wafer Apr. 9, 2013
8409882 Differential FET structures for electrical monitoring of overlay Apr. 2, 2013
8405078 Test device and a semiconductor integrated circuit device Mar. 26, 2013
8399883 Nitrogen-oxide gas sensor with long signal stability Mar. 19, 2013
8399266 Test structure for detection of gap in conductive layer of multilayer gate stack Mar. 19, 2013
8395609 Organic light emitting display device and mother substrate for performing sheet unit test and testing method thereof Mar. 12, 2013
8395260 Semiconductor device and manufacturing method thereof Mar. 12, 2013
8394719 System and method for implementing multi-resolution advanced process control Mar. 12, 2013
8394574 Metrology systems and methods for lithography processes Mar. 12, 2013
8389744 TTPO (5 6,7-trithiapentacene-13-one) and its derivatives: a new class of thermally stable, photooxidatively resistant organic semiconductors Mar. 5, 2013
8384411 Method and device for measuring inter-chip signals Feb. 26, 2013
8378697 Method for providing alignment of a probe Feb. 19, 2013
8378424 Semiconductor structure having test and transistor structures Feb. 19, 2013
8378347 LED package Feb. 19, 2013
8378346 Circuit architecture for the parallel supplying during electric or electromagnetic testing of a plurality of electronic devices integrated on a semiconductor wafer Feb. 19, 2013
8367432 Manufacturing method of semiconductor device Feb. 5, 2013
8362785 Semiconductor device and semiconductor device measuring system Jan. 29, 2013
8362613 Flip chip device having simplified routing Jan. 29, 2013
8362590 Power semiconductor component including a potential probe Jan. 29, 2013
8362544 Switching device and testing apparatus Jan. 29, 2013
8362483 Thin film transistor substrate and flat panel display comprising the same Jan. 29, 2013
8362482 Semiconductor device and structure Jan. 29, 2013
8362481 Ultra high speed signal transmission/reception Jan. 29, 2013
8362480 Reusable test chip for inline probing of three dimensionally arranged experiments Jan. 29, 2013
8357935 Electronic component having an authentication pattern Jan. 22, 2013
8357934 Semiconductor-based sub-mounts for optoelectronic devices with conductive paths Jan. 22, 2013
8357933 Manufacturing method of semiconductor integrated circuit device Jan. 22, 2013
8357932 Test pad structure for reuse of interconnect level masks Jan. 22, 2013
8357931 Flip chip semiconductor die internal signal access system and method Jan. 22, 2013
8354753 3D integrated circuit structure and method for detecting chip mis-alignement Jan. 15, 2013
8354671 Integrated circuit with adaptive VGG setting Jan. 15, 2013
8350586 Method and apparatus of deembedding Jan. 8, 2013
8350393 Apparatus and method for predetermined component placement to a target platform Jan. 8, 2013
8350263 Semiconductor package, method of evaluating same, and method of manufacturing same Jan. 8, 2013
8344510 Semiconductor device with void detection monitor Jan. 1, 2013
8344376 Apparatus and method for predetermined component placement to a target platform Jan. 1, 2013
8343781 Electrical mask inspection Jan. 1, 2013
8338829 Semiconductor device Dec. 25, 2012
8338828 Semiconductor package and method of testing same Dec. 25, 2012
8334595 Silicon contactor including plate type powders for testing semiconductor device Dec. 18, 2012
8334533 Semiconductor device including a circuit area and a monitor area having a plurality of monitor layers and method for manufacturing the same Dec. 18, 2012
8330160 Random number generating device Dec. 11, 2012
8330159 Mask design elements to aid circuit editing and mask redesign Dec. 11, 2012
8330142 Quantum dot light emitting device having quantum dot multilayer Dec. 11, 2012
8329480 Test pattern for detecting piping in a memory array Dec. 11, 2012
8324622 Method of repairing probe pads Dec. 4, 2012
8323990 Reliability test structure for multilevel interconnect Dec. 4, 2012

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