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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
4018626 Impact sound stressing for semiconductor devices Apr. 19, 1977
4013483 Method of adjusting the threshold voltage of field effect transistors Mar. 22, 1977











 
 
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