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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
5001544 Product in tape form for supporting and conveying electronic components Mar. 19, 1991
4994735 Flexible tester surface for testing integrated circuits Feb. 19, 1991
4992849 Directly bonded board multiple integrated circuit module Feb. 12, 1991
4977441 Semiconductor device and tape carrier Dec. 11, 1990
4967146 Semiconductor chip production and testing processes Oct. 30, 1990
4962411 Semiconductor device with current detecting function Oct. 9, 1990
4961053 Circuit arrangement for testing integrated circuit components Oct. 2, 1990
4951098 Electrode structure for light emitting diode array chip Aug. 21, 1990
4937655 Film segment having integrated circuit chip bonded thereto and fixture therefor Jun. 26, 1990
4931844 High power transistor with voltage, current, power, resistance, and temperature sensing capability Jun. 5, 1990
4926234 Semiconductor device operating in high frequency range May. 15, 1990
4916002 Microcasting of microminiature tips Apr. 10, 1990
4914739 Structure for contacting devices in three dimensional circuitry Apr. 3, 1990
4910159 Method for incrementally increasing the collector area of a lateral PNP transistor during electrical testing of an integrated device on wafer Mar. 20, 1990
4906921 Structure and process for testing integrated circuits permitting determination of the properties of layers Mar. 6, 1990
4897711 Subassembly for optoelectronic devices Jan. 30, 1990
4888631 Semiconductor dynamic memory device Dec. 19, 1989
4884122 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer Nov. 28, 1989
4881029 Semiconductor integrated circuit devices and methods for testing same Nov. 14, 1989
4868640 Integrated optoelectronic circuit Sep. 19, 1989
4860079 Screening of gate oxides on semiconductors Aug. 22, 1989
4860080 Isolation for transistor devices having a pilot structure Aug. 22, 1989
4845425 Full chip integrated circuit tester Jul. 4, 1989
4800418 Integrated circuit with improved monitoring function by use of built-in elements Jan. 24, 1989
4783690 Power semiconductor device with main current section and emulation current section Nov. 8, 1988
4768073 Testing integrated circuits Aug. 30, 1988
4751458 Test pads for integrated circuit chips Jun. 14, 1988
4739388 Integrated circuit structure for a quality check of a semiconductor substrate wafer Apr. 19, 1988
4720670 On chip performance predictor circuit Jan. 19, 1988
4701779 Isolation diffusion process monitor Oct. 20, 1987
4697139 Logic circuit having testability for defective via contacts Sep. 29, 1987
4677454 Thyristor with self-centering housing means Jun. 30, 1987
4672314 Comprehensive semiconductor test structure Jun. 9, 1987
4618875 Darlington transistor circuit Oct. 21, 1986
4542340 Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells Sep. 17, 1985
4453127 Determination of true electrical channel length of surface FET Jun. 5, 1984
4446475 Means and method for disabling access to a memory May. 1, 1984
4413271 Integrated circuit including test portion and method for making Nov. 1, 1983
4411719 Apparatus and method for tape bonding and testing of integrated circuit chips Oct. 25, 1983
4364010 Semiconductor device with monitor pattern, and a method of monitoring device parameters Dec. 14, 1982
4360964 Nondestructive testing of semiconductor materials Nov. 30, 1982
4343877 System for design and production of integrated circuit photomasks and integrated circuit devices Aug. 10, 1982
4288911 Method for qualifying biased integrated circuits on a wafer level Sep. 15, 1981
4272986 Method and means for measuring moisture content of hermetic semiconductor devices Jun. 16, 1981
4243937 Microelectronic device and method for testing same Jan. 6, 1981
4197632 Semiconductor device Apr. 15, 1980
4196389 Test site for a charged coupled device (CCD) array Apr. 1, 1980
4144493 Integrated circuit test structure Mar. 13, 1979
4104785 Large-scale semiconductor integrated circuit device Aug. 8, 1978
4079505 Method for manufacturing a transistor Mar. 21, 1978











 
 
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