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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
5786621 Microelectromechanical integrated microloading device Jul. 28, 1998
5783461 Temporary semiconductor package having hard-metal, dense-array ball contacts and method of fabrication Jul. 21, 1998
5780870 Semiconductor device and a process of manufacturing the same Jul. 14, 1998
5767527 Semiconductor device suitable for testing Jun. 16, 1998
5767528 Semiconductor device including pad portion for testing Jun. 16, 1998
5768195 Semiconductor memory device Jun. 16, 1998
5757027 Semiconductor wafer testing method and apparatus May. 26, 1998
5757079 Method for repairing defective electrical connections on multi-layer thin film (MLTF) electronic packages and the resulting MLTF structure May. 26, 1998
5757082 Semiconductor chips, devices incorporating same and method of making same May. 26, 1998
5751015 Semiconductor reliability test chip May. 12, 1998
5739546 Semiconductor wafer Apr. 14, 1998
5736863 Abatement of electron beam charging distortion during dimensional measurements of integrated circuit patterns with scanning electron microscopy by the utilization of specially designed test st Apr. 7, 1998
5734175 Insulated-gate semiconductor device having a position recognizing pattern directly on the gate contact area Mar. 31, 1998
5734176 Impedance controlled test fixture for multi-lead surface mounted integrated circuits Mar. 31, 1998
5726458 Hot carrier injection test structure and technique for statistical evaluation Mar. 10, 1998
5726696 Ink jet recording head having reserve functional devices Mar. 10, 1998
5723874 Dishing and erosion monitor structure for damascene metal processing Mar. 3, 1998
5723875 Chip damage detecting circuit for semiconductor IC Mar. 3, 1998
5723876 Device and method for programming a logic level within an intergrated circuit using multiple mask layers Mar. 3, 1998
5712492 Transistor for checking radiation-hardened transistor Jan. 27, 1998
5703381 Semiconductor integrated circuit Dec. 30, 1997
5686759 Integrated circuit package with permanent identification of device characteristics and method for adding the same Nov. 11, 1997
5684301 Monocrystalline test structures, and use for calibrating instruments Nov. 4, 1997
5684304 Structure for testing integrated circuits Nov. 4, 1997
5684305 Pilot transistor for quasi-vertical DMOS device Nov. 4, 1997
5675179 Universal test die and method for fine pad pitch designs Oct. 7, 1997
5670825 Integrated circuit package with internally readable permanent identification of device characteristics Sep. 23, 1997
5663574 Power semiconductor component with monolithically integrated sensor arrangement as well as manufacture and employment thereof Sep. 2, 1997
5654588 Apparatus for performing wafer-level testing of integrated circuits where the wafer uses a segmented conductive top-layer bus structure Aug. 5, 1997
5648661 Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies Jul. 15, 1997
5646422 Semiconductor integrated circuit device Jul. 8, 1997
5644144 Device and method for programming a logic level within an integrated circuit using multiple mask layers Jul. 1, 1997
5642307 Die identifier and die indentification method Jun. 24, 1997
5631502 Multi-chip module May. 20, 1997
5619462 Fault detection for entire wafer stress test Apr. 8, 1997
5616931 Semiconductor device Apr. 1, 1997
5598009 Hot carrier injection test structure and testing technique for statistical evaluation Jan. 28, 1997
5598010 Semiconductor integrated circuit device having dummy pattern effective against micro loading effect Jan. 28, 1997
5596207 Apparatus and method for detecting defects in insulative layers of MOS active devices Jan. 21, 1997
5594258 Semiconductor device with reticle specific implant verification indicator Jan. 14, 1997
5594273 Apparatus for performing wafer-level testing of integrated circuits where test pads lie within integrated circuit die but overly no active circuitry for improved yield Jan. 14, 1997
5589693 Substrates and methods for gas phase deposition of semiconductors and other materials Dec. 31, 1996
5587590 Test piece for X-ray inspection Dec. 24, 1996
5587610 Semiconductor device having a conductive layer with an aperture Dec. 24, 1996
5578870 Top loading test socket for ball grid arrays Nov. 26, 1996
5576554 Wafer-scale integrated circuit interconnect structure architecture Nov. 19, 1996
5561305 Method and apparatus for performing internal device structure analysis of a dual channel transistor by multiple-frequency Schubnikov-de Haas analysis Oct. 1, 1996
5543632 Temperature monitoring pilot transistor Aug. 6, 1996
5543633 Process and structure for measuring the planarity degree of a dielectric layer in an integrated circuit and integrated circuit including means for performing said process Aug. 6, 1996
5532614 Wafer burn-in and test system Jul. 2, 1996

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