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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
8519388 Embedded structure for passivation integrity testing Aug. 27, 2013
8514203 Flexible calibration device for touch sensor panel calibration Aug. 20, 2013
8513822 Thin overlay mark for imaging based metrology Aug. 20, 2013
8513663 Signal repowering chip for 3-dimensional integrated circuit Aug. 20, 2013
8508017 Test device and semiconductor integrated circuit device Aug. 13, 2013
8507909 Measuring apparatus that includes a chip with a through silicon via, a heater having plural switches, and a stress sensor Aug. 13, 2013
8507908 Probe and probe card Aug. 13, 2013
8507297 Packaging and testing of multiple MEMS devices on a wafer Aug. 13, 2013
8502304 Semiconductor substrate and semiconductor chip Aug. 6, 2013
8502224 Measuring apparatus that includes a chip having a through silicon via, a heater, and a stress sensor Aug. 6, 2013
8502223 Silicon wafer having testing pad(s) and method for testing the same Aug. 6, 2013
8497695 Semiconductor device with fault detection function Jul. 30, 2013
8492763 Semiconductor device including an edge seal and plural pad pieces Jul. 23, 2013
8492762 Electrical interface for a sensor array Jul. 23, 2013
8487305 Semiconductor device and method of manufacturing the same Jul. 16, 2013
8487304 High performance compliant wafer test probe Jul. 16, 2013
8484595 Semiconductor integrated circuit device, design method, design apparatus, and program Jul. 9, 2013
8482002 Semiconductor device including bonding pads and semiconductor package including the semiconductor device Jul. 9, 2013
8476911 System and method for on-chip resistor calibration in semiconductor devices Jul. 2, 2013
8476629 Enhanced wafer test line structure Jul. 2, 2013
8476086 Semiconductor device and method of its manufacture Jul. 2, 2013
8466521 Hydrogen ion-sensitive field effect transistor and manufacturing method thereof Jun. 18, 2013
8466464 Test and enable circuitry connected between embedded die circuits Jun. 18, 2013
8461589 Circuit having integrated heating structure for parametric trimming Jun. 11, 2013
8461588 In-situ monitoring and method to determine accumulated printed wiring board thermal and/or vibration stress fatigue using a mirrored monitor chip and continuity circuit Jun. 11, 2013
8461011 Method for fabricating a back contact solar cell Jun. 11, 2013
8456395 Method for adjusting settings of a display panel Jun. 4, 2013
8456014 Semiconductor device Jun. 4, 2013
8455889 Lead frame for chip package, chip package, package module, and illumination apparatus including chip package module Jun. 4, 2013
8451012 Contact resistance test structure and method suitable for three-dimensional integrated circuits May. 28, 2013
8450734 Semiconductor device and fabrication method for the same May. 28, 2013
8450126 Semiconductor test pad structures May. 28, 2013
8448101 Layout method for vertical power transistors having a variable channel width May. 21, 2013
8445961 Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET) May. 21, 2013
8445908 Parallel scan paths with stimulus and header data circuitry May. 21, 2013
8445907 Semiconductor device including process monitoring pattern having overlapping input/output pad array area May. 21, 2013
8445906 Method for sorting and acquiring semiconductor element, method for producing semiconductor device, and semiconductor device May. 21, 2013
8445295 Semiconductor device and method for manufacturing the same May. 21, 2013
8441135 Semiconductor device May. 14, 2013
8436352 Semiconductor integrated circuit May. 7, 2013
8431970 Integrated circuits with edge-adjacent devices having reactance values Apr. 30, 2013
8431827 Circuit modules and method of managing the same Apr. 30, 2013
8431484 Stable electroless fine pitch interconnect plating Apr. 30, 2013
8426927 Penetrating implant for forming a semiconductor device Apr. 23, 2013
8426864 Infrared sensor Apr. 23, 2013
8426857 Semiconductor device and method for producing the same Apr. 23, 2013
8426856 Thermally sensitive material embedded in the substrate Apr. 23, 2013
8426855 Pad structure having a metalized region and a non-metalized region Apr. 23, 2013
8423851 Measured device and test system utilizing the same Apr. 16, 2013
8421224 Semiconductor chip having double bump structure and smart card including the same Apr. 16, 2013











 
 
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