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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
6400425 TFT-LCD array substrate for testing the short/open-circuit of electric line and a method for fabricating the same Jun. 4, 2002
6396075 Transient fuse for change-induced damage detection May. 28, 2002
6396076 Test structures for substrate etching May. 28, 2002
6392251 Test structures for identifying open contacts and methods of making the same May. 21, 2002
6392252 Semiconductor device May. 21, 2002
6392307 Semiconductor device May. 21, 2002
6392434 Method for testing semiconductor wafers May. 21, 2002
6388269 Metal interconnection structure for evaluation on electromigration May. 14, 2002
6384425 Nonconductive substrate forming a strip or a panel on which a multiplicity of carrier elements is formed May. 7, 2002
6384426 System for testing semiconductor chip leads constrained in dielectric media May. 7, 2002
6383827 Electrical alignment test structure using local interconnect ladder resistor May. 7, 2002
6380554 Test structure for electrically measuring the degree of misalignment between successive layers of conductors Apr. 30, 2002
6380555 Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor components Apr. 30, 2002
6380556 Test structure used to measure metal bottom coverage in trenches and vias/contacts and method for creating the test structure Apr. 30, 2002
6380557 Test chip for evaluating fillers of molding material with dams formed on a semiconductor substrate to define slits for capturing the fillers Apr. 30, 2002
6380729 Testing integrated circuit dice Apr. 30, 2002
6376261 Method for varying nitride strip makeup process based on field oxide loss and defect count Apr. 23, 2002
6372525 Wafer-level antenna effect detection pattern for VLSI Apr. 16, 2002
6373143 Integrated circuit having wirebond pads suitable for probing Apr. 16, 2002
6369406 Method for localizing point defects causing leakage currents in a non-volatile memory device Apr. 9, 2002
6369407 Semiconductor device Apr. 9, 2002
6365914 Semiconductor device provided with a built-in minute charge detecting circuit Apr. 2, 2002
6366209 Method and apparatus for early detection of reliability degradation of electronic devices Apr. 2, 2002
6362641 Integrated circuit device and semiconductor wafer having test circuit therein Mar. 26, 2002
6362642 Method of chip testing of chip leads constrained in dielectric media Mar. 26, 2002
6359342 Flip-chip bumping structure with dedicated test pads on semiconductor chip and method of fabricating the same Mar. 19, 2002
6353235 Plasma damage detector and plasma damage evaluation method Mar. 5, 2002
6350627 Interlevel dielectric thickness monitor for complex semiconductor chips Feb. 26, 2002
6350994 Structure of critical dimension bar Feb. 26, 2002
6351392 Offset array adapter Feb. 26, 2002
6348356 Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors Feb. 19, 2002
6348701 Method for determining metal concentration in a field area Feb. 19, 2002
6348742 Sacrificial bond pads for laser configured integrated circuits Feb. 19, 2002
6344092 Epitaxial semiconductor substrate, manufacturing method thereof, manufacturing method of semiconductor device and manufacturing method of solid-state imaging device Feb. 5, 2002
6340823 Semiconductor wafer having a multi-test circuit, and method for manufacturing a semiconductor device including multi-test process Jan. 22, 2002
6340838 Apparatus and method for containing semiconductor chips to identify known good dies Jan. 22, 2002
6339228 DRAM cell buried strap leakage measurement structure and method Jan. 15, 2002
6339229 Test structure for insulation-film evaluation Jan. 15, 2002
6333517 Semiconductor integrated circuit device equipped with power make-up circuit used in burn-in test after packaging and method for testing the same Dec. 25, 2001
6329669 Semiconductor device able to test changeover circuit which switches connection between terminals Dec. 11, 2001
6329670 Conductive material for integrated circuit fabrication Dec. 11, 2001
6329671 Semiconductor device and method of manufacturing the same Dec. 11, 2001
6326797 Apparatus and method for evaluating printed circuit board assembly manufacturing processes Dec. 4, 2001
6323045 Method and structure for top-to-bottom I/O nets repair in a thin film transfer and join process Nov. 27, 2001
6323505 Failure analysis apparatus of semiconductor integrated circuits and methods thereof Nov. 27, 2001
6323556 Interconnect structure of semiconductor device Nov. 27, 2001
6320201 Semiconductor reliability test chip Nov. 20, 2001
6313480 Structure and method for evaluating an integrated electronic device Nov. 6, 2001
6313542 Method and apparatus for detecting edges under an opaque layer Nov. 6, 2001
6313999 Self alignment device for ball grid array devices Nov. 6, 2001











 
 
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