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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
6476414 Semiconductor device Nov. 5, 2002
6472748 System and method for providing MMIC seal Oct. 29, 2002
6469316 Test structure to monitor the effects of polysilicon pre-doping Oct. 22, 2002
6469396 Integrated circuit chip having input/output terminals for testing and operation Oct. 22, 2002
6469909 MEMS package with flexible circuit interconnect Oct. 22, 2002
6461880 Method for monitoring silicide failures Oct. 8, 2002
6455334 Probe grid for integrated circuit analysis Sep. 24, 2002
6455352 Pin array assembly and method of manufacture Sep. 24, 2002
6452208 Semiconductor chip including a reference element having reference coordinates Sep. 17, 2002
6452209 Semiconductor devices having backside probing capability Sep. 17, 2002
6452502 Method and apparatus for early detection of reliability degradation of electronic devices Sep. 17, 2002
6448098 Detection of undesired connection between conductive structures within multiple layers on a semiconductor wafer Sep. 10, 2002
6448575 Temperature control structure Sep. 10, 2002
6448664 Ball grid array chip packages having improved testing and stacking characteristics Sep. 10, 2002
6449748 Non-destructive method of detecting die crack problems Sep. 10, 2002
6444483 Method and apparatus of producing partial-area mask data files Sep. 3, 2002
6445001 Semiconductor device with flip-chip structure and method of manufacturing the same Sep. 3, 2002
6445002 SRAM-based semiconductor integrated circuit testing element Sep. 3, 2002
6441396 In-line electrical monitor for measuring mechanical stress at the device level on a semiconductor wafer Aug. 27, 2002
6441397 Evaluation of semiconductor chargeup damage and apparatus therefor Aug. 27, 2002
6441398 Algorithm for detecting sloped contact holes using a critical-dimension waveform Aug. 27, 2002
6441469 Semiconductor memory configuration with dummy components on continuous diffusion regions Aug. 27, 2002
6437364 Internal probe pads for failure analysis Aug. 20, 2002
6437423 Method for fabricating semiconductor components with high aspect ratio features Aug. 20, 2002
6437436 Integrated circuit chip package with test points Aug. 20, 2002
6433360 Structure and method of testing failed or returned die to determine failure location and type Aug. 13, 2002
6433410 Semiconductor device tester and method of testing semiconductor device Aug. 13, 2002
6429452 Test structure and methodology for characterizing ion implantation in an integrated circuit fabrication process Aug. 6, 2002
6429453 Substrate assembly for burn in test of integrated circuit chip Aug. 6, 2002
6429454 Semiconductor device with test circuit Aug. 6, 2002
6429675 Structure and method for probing wiring bond pads Aug. 6, 2002
6426516 Kerf contact to silicon redesign for defect isolation and analysis Jul. 30, 2002
6423555 System for determining overlay error Jul. 23, 2002
6423981 Low-loss elementary standard structure for the calibration of an integrated circuit probe Jul. 23, 2002
6420702 Non-charging critical dimension SEM metrology standard Jul. 16, 2002
6414334 Semi-conductor device with test element group for evaluation of interlayer dielectric and process for producing the same Jul. 2, 2002
6414335 Selective state change analysis of a SOI die Jul. 2, 2002
6414336 Semiconductor device capable of improving manufacturing Jul. 2, 2002
6410353 Contact chain for testing and its relevantly debugging method Jun. 25, 2002
6410354 Semiconductor substrate test device and method Jun. 25, 2002
6410936 Semiconductor device Jun. 25, 2002
6410937 Integrated circuit chip carrier Jun. 25, 2002
6403389 Method for determining on-chip sheet resistivity Jun. 11, 2002
6403978 Test pattern for measuring variations of critical dimensions of wiring patterns formed in the fabrication of semiconductor devices Jun. 11, 2002
6403979 Test structure for measuring effective channel length of a transistor Jun. 11, 2002
6404217 Enhanced security semiconductor device, semiconductor circuit arrangement and method or production thereof Jun. 11, 2002
6399401 Test structures for electrical linewidth measurement and processes for their formation Jun. 4, 2002
6399958 Apparatus for visual inspection during device analysis Jun. 4, 2002
6400037 Method of marking on metallic layer, metallic layer with marks thereon and semiconductor device having the metallic layer Jun. 4, 2002
6400038 Alignment method and semiconductor device Jun. 4, 2002

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