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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
6580092 Semiconductor chip, semiconductor device, and process for producing a semiconductor device Jun. 17, 2003
6580140 Metal oxide temperature monitor Jun. 17, 2003
6576922 Ferroelectric capacitor plasma charging monitor Jun. 10, 2003
6576923 Inspectable buried test structures and methods for inspecting the same Jun. 10, 2003
6577015 Partial slot cover for encapsulation process Jun. 10, 2003
6573751 Semiconductor device and electronic apparatus using the same Jun. 3, 2003
6570181 Semiconductor metal interconnect reliability test structure May. 27, 2003
6570263 Structure of plated wire of fiducial marks for die-dicing package May. 27, 2003
6566149 Method for manufacturing substrate for inspecting semiconductor device May. 20, 2003
6566681 Apparatus for assisting backside focused ion beam device modification May. 20, 2003
6566751 Carrier module for holding a .mu.-BGU type device for testing May. 20, 2003
6567715 Method and system for automated on-chip material and structural certification of MEMS devices May. 20, 2003
6559475 Test pattern for evaluating a process of silicide film formation May. 6, 2003
6559476 Method and structure for measuring bridge induced by mask layout amendment May. 6, 2003
6555841 Testable substrate and a testing method Apr. 29, 2003
6551846 Semiconductor memory device capable of correctly and surely effecting voltage stress acceleration Apr. 22, 2003
6552359 Drive circuit and method of testing the same Apr. 22, 2003
6552360 Method and circuit layout for reducing post chemical mechanical polishing defect count Apr. 22, 2003
6548826 Apparatus for wafer-level burn-in and testing of integrated circuits Apr. 15, 2003
6548827 Semiconductor apparatus with misalignment mounting detection Apr. 15, 2003
6548881 Method and apparatus to achieve bond pad crater sensing and stepping identification in integrated circuit products Apr. 15, 2003
6548907 Semiconductor device having a matrix array of contacts and a fabrication process thereof Apr. 15, 2003
6541770 Charged particle system error diagnosis Apr. 1, 2003
6541777 Optical sensing and control of ultraviolet fluid treatment dynamics Apr. 1, 2003
6541791 Method and system for semiconductor die testing Apr. 1, 2003
6538264 Semiconductor reliability test chip Mar. 25, 2003
6534785 Reduced terminal testing system Mar. 18, 2003
6534786 Semiconductor device having a test element, and method of manufacturing the same Mar. 18, 2003
6531709 Semiconductor wafer and fabrication method of a semiconductor chip Mar. 11, 2003
6528817 Semiconductor device and method for testing semiconductor device Mar. 4, 2003
6528818 Test structures and methods for inspection of semiconductor integrated circuits Mar. 4, 2003
6525343 Micro-chip for chemical reaction Feb. 25, 2003
6521910 Structure of a test key for monitoring salicide residue Feb. 18, 2003
6518591 Contact monitor, method of forming same and method of analizing contact-, via- and/or trench-forming processes in an integrated circuit Feb. 11, 2003
6518592 Apparatus, method and pattern for evaluating semiconductor device characteristics Feb. 11, 2003
6518593 Integrated circuit and method of designing integrated circuit Feb. 11, 2003
6512289 Direct current regulation on integrated circuits under high current design conditions Jan. 28, 2003
6509582 Semiconductor pad construction enabling pre-bump probing by planarizing the post-sort pad surface Jan. 21, 2003
6507044 Position-selective and material-selective silicon etching to form measurement structures for semiconductor fabrication Jan. 14, 2003
6507076 Microwave transistor subjected to burn-in testing Jan. 14, 2003
6504223 Contact structure and production method thereof and probe contact assembly using same Jan. 7, 2003
6501683 Nonvolatile semiconductor memory device Dec. 31, 2002
6495855 Semiconductor device Dec. 17, 2002
6495856 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit Dec. 17, 2002
6496959 Method and system for estimating plasma damage to semiconductor device for layout design Dec. 17, 2002
6492187 Method for automatically positioning electronic die within component packages Dec. 10, 2002
6489800 Method of testing an integrated circuit Dec. 3, 2002
6485991 System and method for output track unit detection and safe storage tube removal Nov. 26, 2002
6486492 Integrated critical dimension control for semiconductor device manufacturing Nov. 26, 2002
6486493 Semiconductor integrated circuit device having hierarchical test interface circuit Nov. 26, 2002











 
 
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