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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

Patents under this class:

Patent Number Title Of Patent Date Issued
6700190 Integrated circuit device with exposed upper and lower die surfaces Mar. 2, 2004
6683323 Semiconductor chip Jan. 27, 2004
6683371 Methods of and apparatus for manufacturing ball grid array semiconductor device packages Jan. 27, 2004
6683465 Integrated circuit having stress migration test structure and method therefor Jan. 27, 2004
6680484 Space efficient interconnect test multi-structure Jan. 20, 2004
6680523 Semiconductor wafer with process control modules Jan. 20, 2004
6677608 Semiconductor device for detecting gate defects Jan. 13, 2004
6674092 Thin film CMOS calibration standard having protective cover layer Jan. 6, 2004
6670201 Manufacturing method of semiconductor device Dec. 30, 2003
6670221 Semiconductor device having a built-in contact-type sensor and manufacturing method thereof Dec. 30, 2003
6670632 Reticle and method of fabricating semiconductor device Dec. 30, 2003
6670633 System for split package power and rotational burn-in of a microelectronic device Dec. 30, 2003
6670634 Silicon carbide interconnect for semiconductor components Dec. 30, 2003
6670717 Structure and method for charge sensitive electrical devices Dec. 30, 2003
6667499 Solid-state image sensing device and method of manufacturing the same Dec. 23, 2003
6664120 Method and structure for determining a concentration profile of an impurity within a semiconductor layer Dec. 16, 2003
6660540 Test wafer and method for investigating electrostatic discharge induced wafer defects Dec. 9, 2003
6653655 Integrated semiconductor device including high-voltage interconnections passing through low-voltage regions Nov. 25, 2003
6654919 Automated system for inserting and reading of probe points in silicon embedded testbenches Nov. 25, 2003
6649931 Semiconductor wafer, semiconductor chip, semiconductor device and method for manufacturing semiconductor device Nov. 18, 2003
6649932 Electrical print resolution test die Nov. 18, 2003
6646286 Semiconductor substrate-based BGA interconnection Nov. 11, 2003
6646462 Extraction of drain junction overlap with the gate and the channel length for ultra-small CMOS devices with ultra-thin gate oxides Nov. 11, 2003
6642519 Fine pattern inspection apparatus and method and managing apparatus and method of critical dimension scanning electron microscope device Nov. 4, 2003
6635940 Micro-electromechanical actuator and methods of use Oct. 21, 2003
6630685 Probe look ahead: testing parts not currently under a probehead Oct. 7, 2003
6627917 Method and apparatus for wafer-level burn-in Sep. 30, 2003
6627926 Method of designing and structure for visual and electrical test of semiconductor devices Sep. 30, 2003
6623995 Optimized monitor method for a metal patterning process Sep. 23, 2003
6621169 Stacked semiconductor device and method of producing the same Sep. 16, 2003
6621288 Timing margin alteration via the insulator of a SOI die Sep. 16, 2003
6617610 Semiconductor integrated circuit Sep. 9, 2003
6613595 Test structure and method for flash memory tunnel oxide quality Sep. 2, 2003
6614049 System LSI chip having a logic part and a memory part Sep. 2, 2003
6614050 Semiconductor manufacturing apparatus Sep. 2, 2003
6614051 Device for monitoring substrate charging and method of fabricating same Sep. 2, 2003
6614053 Active matrix substrate, electrooptical device, and method of producing active matrix substrate Sep. 2, 2003
6605824 Semiconductor drive Aug. 12, 2003
6605825 Bipolar transistor characterization apparatus with lateral test probe pads Aug. 12, 2003
6599835 Testing dielectric and barrier layers for integrated circuit interconnects Jul. 29, 2003
6600171 Semiconductor component and system for fabricating contacts on semiconductor components Jul. 29, 2003
6600359 Circuit having a long device configured for testing Jul. 29, 2003
6600686 Apparatus for recognizing chip identification and semiconductor device comprising the apparatus Jul. 29, 2003
6593590 Test structure apparatus for measuring standby current in flash memory devices Jul. 15, 2003
6589860 System and method for calibrating electron beam defect inspection tool Jul. 8, 2003
6590225 Die testing using top surface test pads Jul. 8, 2003
6586765 Wafer-level antenna effect detection pattern for VLSI Jul. 1, 2003
6586264 Method of calculating characteristics of semiconductor device having gate electrode and program thereof Jul. 1, 2003
6586292 Guard mesh for noise isolation in highly integrated circuits Jul. 1, 2003

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