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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
6781218 Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrate Aug. 24, 2004
6781365 Conductive material for integrated circuit fabrication Aug. 24, 2004
6777145 In-line focus monitor structure and method using top-down SEM Aug. 17, 2004
6777676 Non-destructive root cause analysis on blocked contact or via Aug. 17, 2004
6777707 Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing Aug. 17, 2004
6777708 Apparatus and methods for determining floating body effects in SOI devices Aug. 17, 2004
6774640 Test coupon pattern design to control multilayer saw singulated plastic ball grid array substrate mis-registration Aug. 10, 2004
6774659 Method of testing a semiconductor package device Aug. 10, 2004
6773938 Probe card, e.g., for testing microelectronic components, and methods for making same Aug. 10, 2004
6774394 Inline detection device for self-aligned contact defects Aug. 10, 2004
6774395 Apparatus and methods for characterizing floating body effects in SOI devices Aug. 10, 2004
6770138 Pattern for monitoring epitaxial layer washout Aug. 3, 2004
6770906 Semiconductor reliability test chip Aug. 3, 2004
6770907 Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure Aug. 3, 2004
6768133 Semiconductor device, test method for semiconductor device, and tester for semiconductor device Jul. 27, 2004
6765228 Bonding pad with separate bonding and probing areas Jul. 20, 2004
6762431 Wafer-level package with test terminals Jul. 13, 2004
6762432 Electrical field alignment vernier Jul. 13, 2004
6762433 Semiconductor product wafer having vertically and horizontally arranged patterned areas including a limited number of test element group regions Jul. 13, 2004
6762434 Electrical print resolution test die Jul. 13, 2004
6762478 Integrated circuit inductors Jul. 13, 2004
6762486 Test circuit and multi-chip package type semiconductor device having the test circuit Jul. 13, 2004
6762597 Structure, system, and method for assessing electromigration permeability of layer material within interconnect Jul. 13, 2004
6756606 Apparatus and method for marking defective sections of laminate substrates Jun. 29, 2004
6756607 Method and device for determining backgate characteristics Jun. 29, 2004
6756803 Semiconductor device downsizing its built-in driver Jun. 29, 2004
6753547 Method and apparatus for wafer level testing of semiconductor using sacrificial on die power and ground metalization Jun. 22, 2004
6747445 Stress migration test structure and method therefor Jun. 8, 2004
6744067 Wafer-level testing apparatus and method Jun. 1, 2004
6740907 Junction field-effect transistor May. 25, 2004
6740929 Semiconductor device and method for testing semiconductor device May. 25, 2004
6737671 Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices May. 18, 2004
6734028 Method of detecting shallow trench isolation corner thinning by electrical stress May. 11, 2004
6734458 Test pattern for measuring contact resistance and method of manufacturing the same May. 11, 2004
6734481 Semiconductor device having a monitor pattern May. 11, 2004
6734549 Semiconductor device having a device for testing the semiconductor May. 11, 2004
6730931 Integrated circuit feature layout for improved chemical mechanical polishing May. 4, 2004
6727501 Method for detecting over-etch defects Apr. 27, 2004
6724030 System and method for back-side contact for trench semiconductor device characterization Apr. 20, 2004
6720574 Method of testing a semiconductor chip Apr. 13, 2004
6720641 Semiconductor structure having backside probe points for direct signal access from active and well regions Apr. 13, 2004
6712903 Mask for evaluating selective epitaxial growth process Mar. 30, 2004
6713782 Polishing of conductive layers in fabrication of integrated circuits Mar. 30, 2004
6713881 Semiconductor device and method of manufacturing same Mar. 30, 2004
6714002 Integrated semiconductor circuit and multi-chip module with a plurality of integrated semiconductor circuits Mar. 30, 2004
6710369 Liquid metal socket system and method Mar. 23, 2004
6707064 Test element group structure Mar. 16, 2004
6707065 Method and apparatus for wafer-level burn-in and testing of integrated circuits Mar. 16, 2004
6703640 Spring element for use in an apparatus for attaching to a semiconductor and a method of attaching Mar. 9, 2004
6703641 Structure for detecting charging effects in device processing Mar. 9, 2004











 
 
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