Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Physics
Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next

Patent Number Title Of Patent Date Issued
6841796 Substrate mapping Jan. 11, 2005
6838296 Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices Jan. 4, 2005
6838869 Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters Jan. 4, 2005
6835579 Method of monitoring internal voltage and controlling a parameter of an integrated circuit Dec. 28, 2004
6833557 Integrated circuit and a method of manufacturing an integrated circuit Dec. 21, 2004
6833595 Semiconductor device having an improved layout pattern of pair transistors Dec. 21, 2004
6831294 Semiconductor integrated circuit device having bump electrodes for signal or power only, and testing pads that are not coupled to bump electrodes Dec. 14, 2004
6831295 TFT-LCD device having a reduced feed-through voltage Dec. 14, 2004
6831296 Device for seating semiconductor device in semiconductor test handler Dec. 14, 2004
6829419 Fiber array alignment Dec. 7, 2004
6825490 On chip resistor calibration structure and method Nov. 30, 2004
6825558 Carrier module for .mu.-BGA type device Nov. 30, 2004
6826637 Implementing for buffering devices in circuit layout to ensure same arriving time for clock signal from source root to output bonding pads Nov. 30, 2004
6822259 Method of detecting and distinguishing stack gate edge defects at the source or drain junction Nov. 23, 2004
6822260 Linewidth measurement structure with embedded scatterometry structure Nov. 23, 2004
6818920 Integrated circuit provided with a substrate and memory transponder Nov. 16, 2004
6815128 Box-in-box field-to-field alignment structure Nov. 9, 2004
6815230 Control signal transmitting method with package power pin and related integrated circuit package structure Nov. 9, 2004
6815712 Method for selecting components for a matched set from a wafer-interposer assembly Nov. 9, 2004
6815713 Process via mismatch detecting device Nov. 9, 2004
6815714 Conductive structure in a semiconductor material Nov. 9, 2004
6812485 Dual interposer packaging for high density interconnect Nov. 2, 2004
6812486 Conductive structure and method of forming the structure Nov. 2, 2004
6812487 Test key and method for validating the doping concentration of buried layers within a deep trench capacitors Nov. 2, 2004
6812488 Electrically programmable three-dimensional memory-based self test Nov. 2, 2004
6808948 Test structures to define COP electrical effects Oct. 26, 2004
6809540 Integrated circuit test structure Oct. 26, 2004
6806105 Method of measuring meso-scale structures on wafers Oct. 19, 2004
6806107 Electrical fuse element test structure and method Oct. 19, 2004
6806493 Spring element for use in an apparatus for attaching to a semiconductor and a method of attaching Oct. 19, 2004
6806494 Method and apparatus for wafer-level burn-in and testing of integrated circuits Oct. 19, 2004
6800495 Lot-optimized wafer level burn-in Oct. 5, 2004
6797981 Test wafer and method for producing the test wafer Sep. 28, 2004
6798307 Sheet substrate for crystal oscillator and method of manufacturing surface-mount crystal oscillators using same Sep. 28, 2004
6794678 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device Sep. 21, 2004
6794679 Semiconductor device that can measure timing difference between input and output signals Sep. 21, 2004
6794680 Semiconductor device having pad Sep. 21, 2004
6791110 Semiconductor-package measuring method, measuring socket, and semiconductor package Sep. 14, 2004
6791197 Reducing layer separation and cracking in semiconductor devices Sep. 14, 2004
6787797 Semiconductor wafer and device for semiconductor device manufacturing process Sep. 7, 2004
6787798 Method and system for storing information using nano-pinned dipole magnetic vortices in superconducting materials Sep. 7, 2004
6787799 Device and method for detecting a reliability of integrated semiconductor components at high temperatures Sep. 7, 2004
6787800 Test vehicle with zig-zag structures Sep. 7, 2004
6787801 Wafer with additional circuit parts in the kerf area for testing integrated circuits on the wafer Sep. 7, 2004
6787802 Semiconductor device including evaluation elements Sep. 7, 2004
6787803 Test patterns for measurement of low-k dielectric cracking thresholds Sep. 7, 2004
6788082 Probe card Sep. 7, 2004
6785143 Semiconductor memory module Aug. 31, 2004
6781150 Test structure for detecting bonding-induced cracks Aug. 24, 2004
6781151 Failure analysis vehicle Aug. 24, 2004

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next










 
 
  Recently Added Patents
Process for the production of an acylation catalyst
System and method for displaying relationships between electronically stored information to provide classification suggestions via inclusion
Single-wavelength correction method for luminescent homogeneous biological assay
Cucumber plants with a compact growing habit
Memory device having collaborative filtering to reduce noise
Maize variety hybrid X03A157
Methods and system for displaying segmented images
  Randomly Featured Patents
Electrostatic image transfer device having a two level transfer voltage for improving image quality at leading and trailing edge regions
High pressure discharge lamp with reduced bulb thickness
Contact fixing device with an improved cleaning roller
Locking connection for supporting grid systems
Printer device
Process for producing shaped synthetic resin articles varying in shape of longitudinal section
Prefabricated construction elements provided with a reinforcement operating as a caisson, equipment for producing such elements and method of fabrication and application in building erection
Anisometric metal needles with L-shaped cross-section
Sialosylceramides and production method thereof
Hydraulic transmission coupling apparatus