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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
8618821 Device for detecting the thinning down of the substrate of an integrated circuit chip Dec. 31, 2013
8618542 Response and header circuitry with command and frame marker inputs Dec. 31, 2013
8618541 Semiconductor apparatus Dec. 31, 2013
8618540 Semiconductor packages Dec. 31, 2013
8618539 Interconnect sensor for detecting delamination Dec. 31, 2013
8617774 Method and calibration mask for calibrating a position measuring apparatus Dec. 31, 2013
8614108 Electronic device having thermally managed electron path and method of thermal management of very cold electrons Dec. 24, 2013
8614105 Production flow and reusable testing method Dec. 24, 2013
8610451 Post silicide testing for replacement high-k metal gate technologies Dec. 17, 2013
8610121 Methods for discretized processing and process sequence integration of regions of a substrate Dec. 17, 2013
8604824 Hacking detecting device, integrated circuit and method of detecting a hacking attempt Dec. 10, 2013
8604475 IC dies with serarate connections to expected and mask data Dec. 10, 2013
8604474 Semiconductor device integrated with monitoring device in center thereof Dec. 10, 2013
8604427 Three-dimensional mapping using scanning electron microscope images Dec. 10, 2013
8598579 Test structure for ILD void testing and contact resistance measurement in a semiconductor device Dec. 3, 2013
8592813 Semiconductor device and stacked semiconductor apparatus Nov. 26, 2013
8592812 Device for analyzing charge and ultraviolet (UV) light Nov. 26, 2013
8587102 Vertical system integration Nov. 19, 2013
8586983 Semiconductor chip embedded with a test circuit Nov. 19, 2013
8586982 Semiconductor test chip device to mimic field thermal mini-cycles to assess reliability Nov. 19, 2013
8586981 Silicon-on-insulator ("SOI") transistor test structure for measuring body-effect Nov. 19, 2013
8581251 Device for protecting an electronic integrated circuit housing against physical or chemical ingression Nov. 12, 2013
8581250 Method and apparatus of fabricating a pad structure for a semiconductor device Nov. 12, 2013
8581249 Film thickness monitoring structure for semiconductor substrate Nov. 12, 2013
8581230 Light-emitting device having enhanced luminescence by using surface plasmon resonance and method of fabricating the same Nov. 12, 2013
8580584 System and method for increasing productivity of organic light emitting diode material screening Nov. 12, 2013
8563848 System and method for placement of photovoltaic strips Oct. 22, 2013
8558287 Apparatus and method for introducing a controllable delay to an input signal Oct. 15, 2013
8558229 Passivation layer for packaged chip Oct. 15, 2013
8558228 Four-terminal metal-over-metal capacitor design kit Oct. 15, 2013
8557675 Methods of patterning features in a structure using multiple sidewall image transfer technique Oct. 15, 2013
8552428 Power semiconductor device Oct. 8, 2013
8552427 Fuse part of semiconductor device and method of fabricating the same Oct. 8, 2013
8546948 Silicon structure having bonding pad Oct. 1, 2013
8546904 Integrated circuit with temperature increasing element and electronic system having the same Oct. 1, 2013
8546805 Two-beam laser annealing with improved temperature performance Oct. 1, 2013
8546802 Pick-and-place tool for packaging process Oct. 1, 2013
8546801 Semiconductor apparatus manufacturing method and semiconductor apparatus Oct. 1, 2013
8541782 Method for evaluating oxide semiconductor and method for manufacturing semiconductor device Sep. 24, 2013
8536573 Plating process and structure Sep. 17, 2013
8536572 Assembled multi-component electronic apparatus using alignment and reference marks Sep. 17, 2013
8530894 Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions Sep. 10, 2013
8525238 Semiconductor device production method and semiconductor device Sep. 3, 2013
8525169 Reliable physical unclonable function for device authentication Sep. 3, 2013
8525168 Integrated circuit (IC) test probe Sep. 3, 2013
8525167 Laminated chips package, semiconductor substrate and method of manufacturing the laminated chips package Sep. 3, 2013
8524513 Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET) Sep. 3, 2013
8519391 Semiconductor chip with backside conductor structure Aug. 27, 2013
8519390 Test pattern for measuring semiconductor alloys using X-ray Diffraction Aug. 27, 2013
8519389 Semiconductor device, method of manufacturing the same, and method of designing the same Aug. 27, 2013











 
 
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