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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
6916671 Gate oxide measurement apparatus Jul. 12, 2005
6914259 Multi-chip module, semiconductor chip, and interchip connection test method for multi-chip module Jul. 5, 2005
6909293 Space-saving test structures having improved capabilities Jun. 21, 2005
6909294 Time recording device and a time recording method employing a semiconductor element Jun. 21, 2005
6905897 Wafer acceptance testing method and structure of a test key used in the method Jun. 14, 2005
6906341 Probe needle test apparatus and method Jun. 14, 2005
6906399 Integrated circuit including semiconductor power device and electrically isolated thermal sensor Jun. 14, 2005
6902942 Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices Jun. 7, 2005
6900540 Simulating diagonal wiring directions using Manhattan directional wires May. 31, 2005
6900459 Apparatus for automatically positioning electronic dice within component packages May. 31, 2005
6897475 Test structure and related methods for evaluating stress-induced voiding May. 24, 2005
6897476 Test structure for determining electromigration and interlayer dielectric failure May. 24, 2005
6897554 Test circuit and multi-chip package type semiconductor device having the test circuit May. 24, 2005
6897571 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions May. 24, 2005
6897669 Semiconductor device having bonding pads and probe pads May. 24, 2005
6894308 IC with comparator receiving expected and mask data from pads May. 17, 2005
6894522 Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices May. 17, 2005
6890773 Dynamic maintenance of manufacturing system components May. 10, 2005
6888157 N-Gate/N-Substrate or P-Gate/P-Substrate capacitor to characterize polysilicon gate depletion evaluation May. 3, 2005
6888158 Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier May. 3, 2005
6888159 Substrate mapping May. 3, 2005
6885094 Test circuit and multi-chip package type semiconductor device having the test circuit Apr. 26, 2005
6885095 Test circuit and multi-chip package type semiconductor device having the test circuit Apr. 26, 2005
6881593 Semiconductor die adapter and method of using Apr. 19, 2005
6881974 Probe card for testing microelectronic components Apr. 19, 2005
6878595 Technique for suppression of latchup in integrated circuits (ICS) Apr. 12, 2005
6878963 Device for testing electrical characteristics of chips Apr. 12, 2005
6878964 Ground-signal-ground pad layout for device tester structure Apr. 12, 2005
6878965 Test structure for determining a region of a deep trench outdiffusion in a memory cell array Apr. 12, 2005
6879012 Giant planar hall effect in epitaxial ferromagnetic semiconductor devices Apr. 12, 2005
6879025 Semiconductor device incorporating a dicing technique for wafer separation and a method for manufacturing the same Apr. 12, 2005
6875997 Test patterns and methods of controlling CMP process using the same Apr. 5, 2005
6876208 Semiconductor device and method of checking semiconductor storage device Apr. 5, 2005
6872583 Test structure for high precision analysis of a semiconductor Mar. 29, 2005
6873170 Method for detecting the reliability of integrated semiconductor components at high temperatures Mar. 29, 2005
6870185 Integrated microchip design Mar. 22, 2005
6861665 Liquid crystal display device Mar. 1, 2005
6861666 Apparatus and methods for determining and localization of failures in test structures using voltage contrast Mar. 1, 2005
6861667 Grounding inserts Mar. 1, 2005
6861858 Vertical probe card and method for using the same Mar. 1, 2005
6858451 Method for manufacturing a dynamic quantity detection device Feb. 22, 2005
6859023 Evaluation method for evaluating insulating film, evaluation device therefor and method for manufacturing evaluation device Feb. 22, 2005
6855953 Electronic circuit assembly having high contrast fiducial Feb. 15, 2005
6852999 Reduced terminal testing system Feb. 8, 2005
6853000 Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell array Feb. 8, 2005
6849956 Semiconductor integrated circuit with shortened pad pitch Feb. 1, 2005
6847096 Semiconductor wafer having discharge structure to substrate Jan. 25, 2005
6844625 Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuit Jan. 18, 2005
6844631 Semiconductor device having a bond pad and method therefor Jan. 18, 2005
6845407 Semiconductor memory device having externally controllable data input and output mode Jan. 18, 2005

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