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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6916671 |
Gate oxide measurement apparatus |
Jul. 12, 2005 |
| 6914259 |
Multi-chip module, semiconductor chip, and interchip connection test method for multi-chip module |
Jul. 5, 2005 |
| 6909293 |
Space-saving test structures having improved capabilities |
Jun. 21, 2005 |
| 6909294 |
Time recording device and a time recording method employing a semiconductor element |
Jun. 21, 2005 |
| 6905897 |
Wafer acceptance testing method and structure of a test key used in the method |
Jun. 14, 2005 |
| 6906341 |
Probe needle test apparatus and method |
Jun. 14, 2005 |
| 6906399 |
Integrated circuit including semiconductor power device and electrically isolated thermal sensor |
Jun. 14, 2005 |
| 6902942 |
Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices |
Jun. 7, 2005 |
| 6900540 |
Simulating diagonal wiring directions using Manhattan directional wires |
May. 31, 2005 |
| 6900459 |
Apparatus for automatically positioning electronic dice within component packages |
May. 31, 2005 |
| 6897475 |
Test structure and related methods for evaluating stress-induced voiding |
May. 24, 2005 |
| 6897476 |
Test structure for determining electromigration and interlayer dielectric failure |
May. 24, 2005 |
| 6897554 |
Test circuit and multi-chip package type semiconductor device having the test circuit |
May. 24, 2005 |
| 6897571 |
Method for sawing wafers employing multiple indexing techniques for multiple die dimensions |
May. 24, 2005 |
| 6897669 |
Semiconductor device having bonding pads and probe pads |
May. 24, 2005 |
| 6894308 |
IC with comparator receiving expected and mask data from pads |
May. 17, 2005 |
| 6894522 |
Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices |
May. 17, 2005 |
| 6890773 |
Dynamic maintenance of manufacturing system components |
May. 10, 2005 |
| 6888157 |
N-Gate/N-Substrate or P-Gate/P-Substrate capacitor to characterize polysilicon gate depletion evaluation |
May. 3, 2005 |
| 6888158 |
Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier |
May. 3, 2005 |
| 6888159 |
Substrate mapping |
May. 3, 2005 |
| 6885094 |
Test circuit and multi-chip package type semiconductor device having the test circuit |
Apr. 26, 2005 |
| 6885095 |
Test circuit and multi-chip package type semiconductor device having the test circuit |
Apr. 26, 2005 |
| 6881593 |
Semiconductor die adapter and method of using |
Apr. 19, 2005 |
| 6881974 |
Probe card for testing microelectronic components |
Apr. 19, 2005 |
| 6878595 |
Technique for suppression of latchup in integrated circuits (ICS) |
Apr. 12, 2005 |
| 6878963 |
Device for testing electrical characteristics of chips |
Apr. 12, 2005 |
| 6878964 |
Ground-signal-ground pad layout for device tester structure |
Apr. 12, 2005 |
| 6878965 |
Test structure for determining a region of a deep trench outdiffusion in a memory cell array |
Apr. 12, 2005 |
| 6879012 |
Giant planar hall effect in epitaxial ferromagnetic semiconductor devices |
Apr. 12, 2005 |
| 6879025 |
Semiconductor device incorporating a dicing technique for wafer separation and a method for manufacturing the same |
Apr. 12, 2005 |
| 6875997 |
Test patterns and methods of controlling CMP process using the same |
Apr. 5, 2005 |
| 6876208 |
Semiconductor device and method of checking semiconductor storage device |
Apr. 5, 2005 |
| 6872583 |
Test structure for high precision analysis of a semiconductor |
Mar. 29, 2005 |
| 6873170 |
Method for detecting the reliability of integrated semiconductor components at high temperatures |
Mar. 29, 2005 |
| 6870185 |
Integrated microchip design |
Mar. 22, 2005 |
| 6861665 |
Liquid crystal display device |
Mar. 1, 2005 |
| 6861666 |
Apparatus and methods for determining and localization of failures in test structures using voltage contrast |
Mar. 1, 2005 |
| 6861667 |
Grounding inserts |
Mar. 1, 2005 |
| 6861858 |
Vertical probe card and method for using the same |
Mar. 1, 2005 |
| 6858451 |
Method for manufacturing a dynamic quantity detection device |
Feb. 22, 2005 |
| 6859023 |
Evaluation method for evaluating insulating film, evaluation device therefor and method for manufacturing evaluation device |
Feb. 22, 2005 |
| 6855953 |
Electronic circuit assembly having high contrast fiducial |
Feb. 15, 2005 |
| 6852999 |
Reduced terminal testing system |
Feb. 8, 2005 |
| 6853000 |
Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell array |
Feb. 8, 2005 |
| 6849956 |
Semiconductor integrated circuit with shortened pad pitch |
Feb. 1, 2005 |
| 6847096 |
Semiconductor wafer having discharge structure to substrate |
Jan. 25, 2005 |
| 6844625 |
Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuit |
Jan. 18, 2005 |
| 6844631 |
Semiconductor device having a bond pad and method therefor |
Jan. 18, 2005 |
| 6845407 |
Semiconductor memory device having externally controllable data input and output mode |
Jan. 18, 2005 |
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