Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Physics
Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next

Patent Number Title Of Patent Date Issued
7034333 Semiconductor sensor, comprising a pixel structure and the use of said sensor in a vacuum system Apr. 25, 2006
7032196 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device Apr. 18, 2006
7026646 Isolation circuit Apr. 11, 2006
7026647 Device and method for detecting alignment of active areas and memory cell structures in DRAM devices Apr. 11, 2006
7024642 Extraction method of defect density and size distributions Apr. 4, 2006
7017821 Individual configuration Mar. 28, 2006
7015566 Semiconductor wafer and a method for manufacturing a semiconductor wafer Mar. 21, 2006
7011980 Method and structures for measuring gate tunneling leakage parameters of field effect transistors Mar. 14, 2006
7009202 Thin film transistor array panel having a means for visual inspection Mar. 7, 2006
7005307 Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer Feb. 28, 2006
7002177 Test region layout for shallow trench isolation Feb. 21, 2006
6998638 Test structure for detecting bonding-induced cracks Feb. 14, 2006
6995392 Test structure for locating electromigration voids in dual damascene interconnects Feb. 7, 2006
6995393 Apparatus and methods for semiconductor IC failure detection Feb. 7, 2006
6991948 Method of electrical characterization of a silicon-on-insulator (SOI) wafer Jan. 31, 2006
6992327 Monitor pattern of semiconductor device and method of manufacturing semiconductor device Jan. 31, 2006
6989551 Test structure for determining a minimum tunnel opening size in a non-volatile memory Jan. 24, 2006
6987383 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same Jan. 17, 2006
6975030 Silicon carbide contact for semiconductor components Dec. 13, 2005
6972840 Method of reducing process plasma damage using optical spectroscopy Dec. 6, 2005
6967111 Techniques for reticle layout to modify wafer test structure area Nov. 22, 2005
6967348 Signal sharing circuit with microelectric die isolation features Nov. 22, 2005
6967349 Method for fabricating a multi-level integrated circuit having scatterometry test structures stacked over same footprint area Nov. 22, 2005
6967397 Test circuit and multi-chip package type semiconductor device having the test circuit Nov. 22, 2005
6963082 Multi-chip package device including a semiconductor memory chip Nov. 8, 2005
6960784 Charging sensor method and apparatus Nov. 1, 2005
6958491 Bipolar transistor test structure with lateral test probe pads Oct. 25, 2005
6953948 Semiconductor substrate and process for its production Oct. 11, 2005
6953989 Film carrier tape for mounting electronic devices thereon and final defect marking method using the same Oct. 11, 2005
6949387 Method of designing a semiconductor device Sep. 27, 2005
6949423 MOSFET-fused nonvolatile read-only memory cell (MOFROM) Sep. 27, 2005
6949765 Padless structure design for easy identification of bridging defects in lines by passive voltage contrast Sep. 27, 2005
6949766 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern Sep. 27, 2005
6946678 Test key for validating the position of a word line overlaying a trench capacitor in DRAMs Sep. 20, 2005
6943614 Fractional biasing of semiconductors Sep. 13, 2005
6943853 Liquid crystal display Sep. 13, 2005
6940093 Special contact points for accessing internal circuitry of an integrated circuit Sep. 6, 2005
6936842 Method and apparatus for process monitoring Aug. 30, 2005
6936843 Fixture used to prepare semiconductor specimens for film adhesion testing Aug. 30, 2005
6936889 Semiconductor device and method for testing semiconductor device Aug. 30, 2005
6933523 Semiconductor alignment aid Aug. 23, 2005
6933524 Semiconductor component having test contacts Aug. 23, 2005
6933731 Method and system for determining transistor degradation mechanisms Aug. 23, 2005
6929965 Early response to plasma/charging damage by special pattern design of active region Aug. 16, 2005
6930323 Test keys structure for a control monitor wafer Aug. 16, 2005
6930324 Device architecture and process for improved vertical memory arrays Aug. 16, 2005
6930325 Test structure for improved vertical memory arrays Aug. 16, 2005
6927416 Wafer support plate Aug. 9, 2005
6924505 Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Aug. 2, 2005
6921916 Overlay marks, methods of overlay mark design and methods of overlay measurements Jul. 26, 2005

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next










 
 
  Recently Added Patents
Hanger
Digital video disc player
Flip-chip mounting resin composition and bump forming resin composition
Plants and seeds of hybrid corn variety CH450823
Tone enhancement bracket
Method of treating a preceramic material
Interferer region identification using image processing
  Randomly Featured Patents
Sealed heat exchanger chamber with disposition of longitudinal water tubes concentrically disposed to a central burner
Dustless Stacker method and apparatus for a bulk solids handling and storage system
Semiconductor memory device
Apparatus for analytical determination of glucose in a biological matrix
iRNA agents targeting VEGF
Carrier bar
Elevator group management and control apparatus using rule-based operation control
Method and apparatus for measuring transmission characteristic of a test object
Door latch for electrical equipment enclosure
Snapshot storage and management system with indexing and user interface