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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7220990 Technique for evaluating a fabrication of a die and wafer May. 22, 2007
7220989 Test apparatus for a semiconductor package May. 22, 2007
7217579 Voltage contrast test structure May. 15, 2007
7215021 Electronic device May. 8, 2007
7214962 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer May. 8, 2007
7214961 Semiconductor testing device and semiconductor testing method May. 8, 2007
7208759 Semiconductor integrated circuit device and method of testing the same Apr. 24, 2007
7208758 Dynamic integrated circuit clusters, modules including same and methods of fabricating Apr. 24, 2007
7208331 Methods and structures for critical dimension and profile measurement Apr. 24, 2007
7205567 Semiconductor product having a semiconductor substrate and a test structure and method Apr. 17, 2007
7205566 Transistor-level signal cutting method and structure Apr. 17, 2007
7197726 Test structures for estimating dishing and erosion effects in copper damascene technology Mar. 27, 2007
7196350 Method and apparatus for characterizing features formed on a substrate Mar. 27, 2007
7195933 Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Mar. 27, 2007
7190045 Semiconductor device and method for fabricating the same Mar. 13, 2007
7189586 Test key for monitoring gate conductor to deep trench misalignment Mar. 13, 2007
7187179 Wiring test structures for determining open and short circuits in semiconductor devices Mar. 6, 2007
7187002 Wafer collective reliability evaluation device and wafer collective reliability evaluation method Mar. 6, 2007
7186576 Stacked die module and techniques for forming a stacked die module Mar. 6, 2007
7183780 Electrical open/short contact alignment structure for active region vs. gate region Feb. 27, 2007
7183671 Semiconductor device and method for producing the same Feb. 27, 2007
7183570 IC with comparator receiving expected and mask data from pads Feb. 27, 2007
7176560 Semiconductor device having a chip--chip structure Feb. 13, 2007
7176487 Semiconductor integrated circuit Feb. 13, 2007
7176485 Damascene resistor and method for measuring the width of same Feb. 13, 2007
7170189 Semiconductor wafer and testing method therefor Jan. 30, 2007
7170091 Probe look ahead: testing parts not currently under a probehead Jan. 30, 2007
7170090 Method and structure for testing metal-insulator-metal capacitor structures under high temperature at wafer level Jan. 30, 2007
7164149 Semiconductor device, semiconductor device manufacturing method, and semiconductor device test method Jan. 16, 2007
7163829 Method of integration testing for packaged electronic components Jan. 16, 2007
7161243 System and apparatus for socket and package power/ground bar to increase current carrying capacity for higher IC power delivery Jan. 9, 2007
7161175 Inter-dice signal transfer methods for integrated circuits Jan. 9, 2007
7160741 Planar voltage contrast test structure and method Jan. 9, 2007
7157927 Test pattern for testing resistance of pattern of semiconductor substrate Jan. 2, 2007
7157925 Test structure for speeding a stress-induced voiding test and method of using same Jan. 2, 2007
7157734 Semiconductor bond pad structures and methods of manufacturing thereof Jan. 2, 2007
7157131 Prevention of counterfeit markings on semiconductor devices Jan. 2, 2007
7154116 Rewiring substrate strip with a number of semiconductor component positions Dec. 26, 2006
7154115 Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure Dec. 26, 2006
7148505 Method for using a chip carrier substrate with a land grid array and external bond terminals Dec. 12, 2006
7148504 Semiconductor device Dec. 12, 2006
7148503 Semiconductor device, function setting method thereof, and evaluation method thereof Dec. 12, 2006
7145356 Circuits for transistor testing Dec. 5, 2006
7145171 Probe unit and its manufacturing method Dec. 5, 2006
7143229 Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor Nov. 28, 2006
7141819 Semiconductor package Nov. 28, 2006
7138817 Method and apparatus for testing defective portion of semiconductor device Nov. 21, 2006
7138654 Chemical-mechanical polishing proximity correction method and correction pattern thereof Nov. 21, 2006
7138653 Structures for stabilizing semiconductor devices relative to test substrates and methods for fabricating the stabilizers Nov. 21, 2006
7135704 VCSEL settling fixture Nov. 14, 2006

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