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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7411294 Display device having misalignment detection pattern for detecting misalignment between conductive layer and insulating layer Aug. 12, 2008
7411210 Semiconductor probe with resistive tip having metal shield thereon Aug. 12, 2008
7410837 Method of manufacturing mounting substrate Aug. 12, 2008
7408189 Method of testing FPC bonding yield and FPC having testing pads thereon Aug. 5, 2008
7405423 Random number generating device Jul. 29, 2008
7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes Jul. 15, 2008
7399990 Wafer-level package having test terminal Jul. 15, 2008
7397260 Structure and method for monitoring stress-induced degradation of conductive interconnects Jul. 8, 2008
7394164 Semiconductor device having bumps in a same row for staggered probing Jul. 1, 2008
7393754 Tape carrier type semiconductor device and method of producing the same Jul. 1, 2008
7393619 Method and lithographic structure for measuring lengths of lines and spaces Jul. 1, 2008
7393471 Anisotropic conductive sheet, its manufacturing method, and its application Jul. 1, 2008
7391226 Contact resistance test structure and methods of using same Jun. 24, 2008
7390427 Hydrofluoroether as a heat-transfer fluid Jun. 24, 2008
7388385 Wafer dicing system Jun. 17, 2008
7388224 Structure for determining thermal cycle reliability Jun. 17, 2008
7381986 Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer Jun. 3, 2008
7375371 Structure and method for thermally stressing or testing a semiconductor device May. 20, 2008
7372072 Semiconductor wafer with test structure May. 13, 2008
7370257 Test vehicle data analysis May. 6, 2008
7368749 Method of detecting misalignment of ion implantation area May. 6, 2008
7368748 Test pixel and test pixel array for evaluating pixel quality in CMOS image sensor May. 6, 2008
7368208 Measuring phase errors on phase shift masks May. 6, 2008
7358527 Systems and methods for testing germanium devices Apr. 15, 2008
7355435 On-chip detection of power supply vulnerabilities Apr. 8, 2008
7355291 Overlay marks, methods of overlay mark design and methods of overlay measurements Apr. 8, 2008
7355201 Test structure for measuring electrical and dimensional characteristics Apr. 8, 2008
7355200 Ion-sensitive field effect transistor and method for producing an ion-sensitive field effect transistor Apr. 8, 2008
7352001 Method of editing a semiconductor die Apr. 1, 2008
7351666 Layout and process to contact sub-lithographic structures Apr. 1, 2008
7351597 Fabrication method of semiconductor integrated circuit device Apr. 1, 2008
7348597 Apparatus for performing high frequency electronic package testing Mar. 25, 2008
7348596 Devices for detecting current leakage between deep trench capacitors in DRAM devices Mar. 25, 2008
7348595 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device Mar. 25, 2008
7348594 Test structures and models for estimating the yield impact of dishing and/or voids Mar. 25, 2008
7345366 Apparatus and method for testing component built in circuit board Mar. 18, 2008
7345306 Corona based charge voltage measurement Mar. 18, 2008
7345305 Control of liner thickness for improving thermal cycle reliability Mar. 18, 2008
7342248 Semiconductor device and interposer Mar. 11, 2008
7336089 Power line control circuit of semiconductor device Feb. 26, 2008
7336086 Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure Feb. 26, 2008
7335518 Method for manufacturing semiconductor device Feb. 26, 2008
7332741 Multidirectional leakage path test structure Feb. 19, 2008
7332358 MOSFET temperature sensing Feb. 19, 2008
7329947 Heat treatment jig for semiconductor substrate Feb. 12, 2008
7329900 Bonding strength testing device Feb. 12, 2008
7329899 Wafer-level redistribution circuit Feb. 12, 2008
7323712 Anisotropically conductive connector and production process thereof, and probe member Jan. 29, 2008
7323350 Method of fabricating thin film calibration features for electron/ion beam image based metrology Jan. 29, 2008
7317224 Semiconductor device Jan. 8, 2008

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