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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7531836 Body bias compensation for aged transistors May. 12, 2009
7528491 Semiconductor components and assemblies including vias of varying lateral dimensions May. 5, 2009
7527987 Fast localization of electrical failures on an integrated circuit system and method May. 5, 2009
7525118 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device Apr. 28, 2009
7521952 Test structure for electromigration analysis and related method Apr. 21, 2009
7520956 On-wafer monitoring system Apr. 21, 2009
7514800 Semiconductor device and wire bonding method therefor Apr. 7, 2009
7514274 Enhanced uniqueness for pattern recognition Apr. 7, 2009
7511299 Packaged integrated circuit with raised test points Mar. 31, 2009
7510176 Submount assembly and method of preparing optical module Mar. 31, 2009
7508051 Wafer with optical control modules in dicing paths Mar. 24, 2009
7504658 Sensor elements with cantilevered bar structures made of semiconductors based on group III-nitride Mar. 17, 2009
7504270 Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same Mar. 17, 2009
7501655 Thin film transistor array panel Mar. 10, 2009
7501651 Test structure of semiconductor device Mar. 10, 2009
7498604 Deposition stop time detection apparatus and methods for fabricating copper using the same Mar. 3, 2009
7495255 Test pads on flash memory cards Feb. 24, 2009
7495254 Test structure and method for detecting and studying crystal lattice dislocation defects in integrated circuit devices Feb. 24, 2009
7491970 IC with comparator receiving expected and mask data from pads Feb. 17, 2009
7485475 Method of accelerating test of semiconductor device Feb. 3, 2009
7482675 Probing pads in kerf area for wafer testing Jan. 27, 2009
7479655 Semiconductor device Jan. 20, 2009
7476983 Semiconductor device including wire bonding pads and pad layout method Jan. 13, 2009
7468549 Method for producing a package for an electronic circuit and a substrate for a package Dec. 23, 2008
7468525 Test structures for development of metal-insulator-metal (MIM) devices Dec. 23, 2008
7467360 LSI design support apparatus and LSI design support method Dec. 16, 2008
7466157 Contactless interfacing of test signals with a device under test Dec. 16, 2008
7456449 Semiconductor apparatus, LED print head, and printer Nov. 25, 2008
7456033 Method of evaluating semiconductor device Nov. 25, 2008
7455939 Method of improving grating test pattern for lithography monitoring and controlling Nov. 25, 2008
7453272 Electrical open/short contact alignment structure for active region vs. gate region Nov. 18, 2008
7449909 System and method for testing one or more dies on a semiconductor wafer Nov. 11, 2008
7449716 Bond quality indication by bump structure on substrate Nov. 11, 2008
7439586 Liquid crystal display device and fabricating method thereof Oct. 21, 2008
7439538 Multi-purpose poly edge test structure Oct. 21, 2008
7439122 Method of manufacturing semiconductor device having improved RESURF Trench isolation and method of evaluating manufacturing method Oct. 21, 2008
7439083 Technique for compensating for substrate shrinkage during manufacture of an electronic assembly Oct. 21, 2008
7436199 Stack-type semiconductor package sockets and stack-type semiconductor package test systems Oct. 14, 2008
7435991 Micromechanical sensor Oct. 14, 2008
7435990 Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer Oct. 14, 2008
7427774 Targets for measurements in semiconductor devices Sep. 23, 2008
7423288 Technique for evaluating a fabrication of a die and wafer Sep. 9, 2008
7423287 System and method for measuring residual stress Sep. 9, 2008
7423286 Laser transfer article and method of making Sep. 9, 2008
7423282 Memory structure and method of manufacture Sep. 9, 2008
7420206 Interposer, semiconductor chip mounted sub-board, and semiconductor package Sep. 2, 2008
7419299 Methods of sensing temperature of an electronic device workpiece Sep. 2, 2008
7418643 Integrated circuit having electrically isolatable test circuitry Aug. 26, 2008
7418283 Adiabatic quantum computation with superconducting qubits Aug. 26, 2008
7416819 Test mask for optical and electron optical systems Aug. 26, 2008

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