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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6437423 |
Method for fabricating semiconductor components with high aspect ratio features |
Aug. 20, 2002 |
| 6437364 |
Internal probe pads for failure analysis |
Aug. 20, 2002 |
| 6433410 |
Semiconductor device tester and method of testing semiconductor device |
Aug. 13, 2002 |
| 6433360 |
Structure and method of testing failed or returned die to determine failure location and type |
Aug. 13, 2002 |
| 6429675 |
Structure and method for probing wiring bond pads |
Aug. 6, 2002 |
| 6429452 |
Test structure and methodology for characterizing ion implantation in an integrated circuit fabrication process |
Aug. 6, 2002 |
| 6429454 |
Semiconductor device with test circuit |
Aug. 6, 2002 |
| 6429453 |
Substrate assembly for burn in test of integrated circuit chip |
Aug. 6, 2002 |
| 6426516 |
Kerf contact to silicon redesign for defect isolation and analysis |
Jul. 30, 2002 |
| 6423981 |
Low-loss elementary standard structure for the calibration of an integrated circuit probe |
Jul. 23, 2002 |
| 6423555 |
System for determining overlay error |
Jul. 23, 2002 |
| 6420702 |
Non-charging critical dimension SEM metrology standard |
Jul. 16, 2002 |
| 6414334 |
Semi-conductor device with test element group for evaluation of interlayer dielectric and process for producing the same |
Jul. 2, 2002 |
| 6414336 |
Semiconductor device capable of improving manufacturing |
Jul. 2, 2002 |
| 6414335 |
Selective state change analysis of a SOI die |
Jul. 2, 2002 |
| 6410354 |
Semiconductor substrate test device and method |
Jun. 25, 2002 |
| 6410937 |
Integrated circuit chip carrier |
Jun. 25, 2002 |
| 6410353 |
Contact chain for testing and its relevantly debugging method |
Jun. 25, 2002 |
| 6410936 |
Semiconductor device |
Jun. 25, 2002 |
| 6403389 |
Method for determining on-chip sheet resistivity |
Jun. 11, 2002 |
| 6403979 |
Test structure for measuring effective channel length of a transistor |
Jun. 11, 2002 |
| 6404217 |
Enhanced security semiconductor device, semiconductor circuit arrangement and method or production thereof |
Jun. 11, 2002 |
| 6403978 |
Test pattern for measuring variations of critical dimensions of wiring patterns formed in the fabrication of semiconductor devices |
Jun. 11, 2002 |
| 6399401 |
Test structures for electrical linewidth measurement and processes for their formation |
Jun. 4, 2002 |
| 6399958 |
Apparatus for visual inspection during device analysis |
Jun. 4, 2002 |
| 6400037 |
Method of marking on metallic layer, metallic layer with marks thereon and semiconductor device having the metallic layer |
Jun. 4, 2002 |
| 6400038 |
Alignment method and semiconductor device |
Jun. 4, 2002 |
| 6400425 |
TFT-LCD array substrate for testing the short/open-circuit of electric line and a method for fabricating the same |
Jun. 4, 2002 |
| 6396075 |
Transient fuse for change-induced damage detection |
May. 28, 2002 |
| 6396076 |
Test structures for substrate etching |
May. 28, 2002 |
| 6392251 |
Test structures for identifying open contacts and methods of making the same |
May. 21, 2002 |
| 6392252 |
Semiconductor device |
May. 21, 2002 |
| 6392307 |
Semiconductor device |
May. 21, 2002 |
| 6392434 |
Method for testing semiconductor wafers |
May. 21, 2002 |
| 6388269 |
Metal interconnection structure for evaluation on electromigration |
May. 14, 2002 |
| 6384426 |
System for testing semiconductor chip leads constrained in dielectric media |
May. 7, 2002 |
| 6384425 |
Nonconductive substrate forming a strip or a panel on which a multiplicity of carrier elements is formed |
May. 7, 2002 |
| 6383827 |
Electrical alignment test structure using local interconnect ladder resistor |
May. 7, 2002 |
| 6380729 |
Testing integrated circuit dice |
Apr. 30, 2002 |
| 6380557 |
Test chip for evaluating fillers of molding material with dams formed on a semiconductor substrate to define slits for capturing the fillers |
Apr. 30, 2002 |
| 6380555 |
Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor components |
Apr. 30, 2002 |
| 6380554 |
Test structure for electrically measuring the degree of misalignment between successive layers of conductors |
Apr. 30, 2002 |
| 6380556 |
Test structure used to measure metal bottom coverage in trenches and vias/contacts and method for creating the test structure |
Apr. 30, 2002 |
| 6376261 |
Method for varying nitride strip makeup process based on field oxide loss and defect count |
Apr. 23, 2002 |
| 6373143 |
Integrated circuit having wirebond pads suitable for probing |
Apr. 16, 2002 |
| 6372525 |
Wafer-level antenna effect detection pattern for VLSI |
Apr. 16, 2002 |
| 6369407 |
Semiconductor device |
Apr. 9, 2002 |
| 6369406 |
Method for localizing point defects causing leakage currents in a non-volatile memory device |
Apr. 9, 2002 |
| 6365914 |
Semiconductor device provided with a built-in minute charge detecting circuit |
Apr. 2, 2002 |
| 6366209 |
Method and apparatus for early detection of reliability degradation of electronic devices |
Apr. 2, 2002 |
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